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SR 332 TOC.i01

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The document discusses different techniques for predicting reliability and failure rates of electronic equipment.

Reliability predictions are used to estimate failure rates and assess reliability for equipment design, manufacturing, and operation.

Factors like quality level, stress levels, temperature, and environmental conditions can affect failure rates of devices and equipment.

SR-332

Issue 1, May 2001 Reliability Prediction Procedure for Electronic Equipment


Contents

Contents Telcordia SR-332-Documentation Information

Special Report Notice Of Disclaimer . . . . . . . . . . . . . . . . . . . . . . . . . . iii


1. Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
1.1 Purpose and Scope . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
1.2 Changes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
1.3 Structure of the Report . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
2. Reliability Predictions for Electronic Equipment . . . . . . . . . . . . . . . . . . 21
2.1 Purposes of Reliability Predictions . . . . . . . . . . . . . . . . . . . . . . . . 21
2.2 Equipment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
2.3 Definition of a Failure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
2.4 Failure Rates . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
2.5 Factors Affecting Failure Rates . . . . . . . . . . . . . . . . . . . . . . . . . . 24
2.6 Choice of Method . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
2.7 Flow of Calculations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
2.8 Items Excluded from Failure Rate Calculations . . . . . . . . . . . . . . . . . 26
2.9 Instructions for Device Types/Technologies Not in Table 7-1 . . . . . . . . . . 26
2.10 Statistical Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
2.11 Automated Reliability Prediction Procedure (ARPP) . . . . . . . . . . . . . . 27
3. Steady-State Failure Rate Prediction for Devices . . . . . . . . . . . . . . . . . 31
3.1 Black Box Technique . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
3.2 Techniques Integrating Laboratory Data . . . . . . . . . . . . . . . . . . . . . 32
3.2.1 When Laboratory Test Devices Had No Previous Burn-in . . . . . . . . . 32
3.2.2 When Laboratory Test Devices Had Previous Burn-in . . . . . . . . . . . 32
3.3 Techniques Integrating Field Data . . . . . . . . . . . . . . . . . . . . . . . . . 33
3.3.1 Total Operating Hours . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
3.3.2 Adjustment Factor (V) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
3.4 Examples . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
3.4.1 Example 1: Black Box Technique . . . . . . . . . . . . . . . . . . . . . . 35
3.4.2 Example 2: Integrating Laboratory Test Data . . . . . . . . . . . . . . . . 36
3.4.2.1 Example 2a: No Burn-In of Laboratory Test Devices . . . . . . . . 36
3.4.2.2 Example 2b: Previous Burn-In of Laboratory Test Devices . . . . . 37
3.4.3 Example 3: Integrating Field Data . . . . . . . . . . . . . . . . . . . . . . 37
3.4.3.1 Example 4a: Subject Device Is in Test Unit and Operated at Same
Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
3.4.3.2 Example 4b: Subject Device Is in Test Unit but Operated at Different
Temperatures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
3.4.3.3 Example 4c: Subject Counterpart Device in Test Unit Is Similar but Not
Identical to Subject Device . . . . . . . . . . . . . . . . . . . . . . . 38
4. First-Year Multiplier Prediction for Devices . . . . . . . . . . . . . . . . . . . . 41
4.1 First-Year Multiplier for Device with Limited or No Burn-In . . . . . . . . . . 41
4.2 First-Year Multiplier for Device with Extensive Burn-In . . . . . . . . . . . . . 41
4.2.1 Equivalent Operating Time for Burn-in . . . . . . . . . . . . . . . . . . . 41
4.2.2 First-Year Multiplier . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
4.3 Examples . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42

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SR-332
Reliability Prediction Procedure for Electronic Equipment Issue 1, May 2001
Contents

4.3.1 Example 1: Limited or No Burn-In . . . . . . . . . . . . . . . . . . . . . . 43


4.3.2 Example 2: Extensive Burn-In . . . . . . . . . . . . . . . . . . . . . . . . 43
5. Failure Rate Prediction for Units . . . . . . . . . . . . . . . . . . . . . . . . . . 51
5.1 Unit Steady-State Failure Rate Using the Parts Count Method . . . . . . . . . 51
5.2 Integrating Laboratory Test Data on Units . . . . . . . . . . . . . . . . . . . . 51
5.2.1 When Laboratory Test Units Have No Previous Unit/Device Burn-In . . 51
5.2.2 When Laboratory Test Units Had Previous Burn-in . . . . . . . . . . . . 52
5.3 Integrating Field Data on Units . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
5.3.1 Total Operating Hours . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
5.3.2 Adjustment Factor (V) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
5.4 Unit First-Year Multiplier . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
5.5 Sampling Method - Using Default Temperature and Stress Factors on a Sample of
Units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
5.6 Examples . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56
5.6.1 Example 1: Parts Count Prediction . . . . . . . . . . . . . . . . . . . . . 56
5.6.2 Example 2: First-Year Multiplier . . . . . . . . . . . . . . . . . . . . . . . 57
5.6.3 Example 3: Integrating Laboratory Test Data . . . . . . . . . . . . . . . . 57
5.6.3.1 Example 3a: No Burn-In of Laboratory Test Units . . . . . . . . . . 58
5.6.3.2 Example 3b: Previous Burn-In of Laboratory Test Units . . . . . . 58
5.6.4 Example 4: Integrating Field Test Data . . . . . . . . . . . . . . . . . . . 59
5.6.4.1 Example 4a: Subject Unit and Test Unit are Identical and Operated at
Same Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . 59
5.6.4.2 Example 4b: Subject Unit and Test Unit are Identical but Operated at
Different Temperatures . . . . . . . . . . . . . . . . . . . . . . . . 59
5.6.4.3 Example 4c: Test Unit Is Similar but Not Identical to Subject Unit 510
6. System Reliability (Service Affecting Reliability Data) . . . . . . . . . . . . . . . 61
6.1 Serial System Reliability . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
6.1.1 Steady-State Failure Rate . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
6.1.2 First-Year Multiplier . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
6.2 Non-Serial Systems . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 62
7. Tables . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71
Appendix A: References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . A1
Appendix B: Glossary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . B1

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SR-332
Issue 1, May 2001 Reliability Prediction Procedure for Electronic Equipment
List of Figures

List of Figures

Figure 2-1 Bathtub Curve . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23

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SR-332
Reliability Prediction Procedure for Electronic Equipment Issue 1, May 2001
List of Figures

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SR-332
Issue 1, May 2001 Reliability Prediction Procedure for Electronic Equipment
List of Tables

List of Tables

Table 7-1 Device Failure Rates (Sheet 1 of 16) . . . . . . . . . . . . . . . . . 72


Table 7-2 Hybrid Microcircuit Failure Rate Determination (Sheet 1 of 2) . . 718
Table 7-3 Device Quality Level Description (Sheet 1 of 2) . . . . . . . . . . . 720
Table 7-4 Device Quality Factors (Q) . . . . . . . . . . . . . . . . . . . . . . 722
Table 7-5 Guidelines for Determination of Stress Levels . . . . . . . . . . . . 723
Table 7-6 Stress Factors (pS) . . . . . . . . . . . . . . . . . . . . . . . . . . . 724
Table 7-7 Temperature Factors T (Sheet 1 of 2) . . . . . . . . . . . . . . . . 725
Table 7-8 Environmental Conditions and Multiplying Factors (pE) . . . . . . 727
Table 7-9 First Year Multiplier (pFY) . . . . . . . . . . . . . . . . . . . . . . . 728
Table 7-10 Typical Failure Rates of Computer Related Systems or Subsystems
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 730
Table 7-11 Reliability Conversion Factors . . . . . . . . . . . . . . . . . . . . . 731
Table 7-12 Upper 95% Confidence Limit (U) for the Mean of a Poisson Distribution
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 732

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