This document shows the relationship between defects per million parts (DPM), process yield, capability index (Cpk), and sigma level. As the number of defects increase, the yield and Cpk decrease, along with the sigma level, ranging from 6 sigma down to 1.5 sigma. The table provides data on these metrics across a range of defect levels.
This document shows the relationship between defects per million parts (DPM), process yield, capability index (Cpk), and sigma level. As the number of defects increase, the yield and Cpk decrease, along with the sigma level, ranging from 6 sigma down to 1.5 sigma. The table provides data on these metrics across a range of defect levels.
This document shows the relationship between defects per million parts (DPM), process yield, capability index (Cpk), and sigma level. As the number of defects increase, the yield and Cpk decrease, along with the sigma level, ranging from 6 sigma down to 1.5 sigma. The table provides data on these metrics across a range of defect levels.
This document shows the relationship between defects per million parts (DPM), process yield, capability index (Cpk), and sigma level. As the number of defects increase, the yield and Cpk decrease, along with the sigma level, ranging from 6 sigma down to 1.5 sigma. The table provides data on these metrics across a range of defect levels.