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MOSFET Self-Turn-On Phenomenon

Application Note

MOSFET Self-Turn-On Phenomenon

Description
When a rising voltage is applied sharply to a MOSFET between its drain and source, the MOSFET
may turn on due to malfunction. This document describes the cause of this phenomenon and
its countermeasures.

© 2017 - 2018 1 2018-07-26


Toshiba Electronic Devices & Storage Corporation
MOSFET Self-Turn-On Phenomenon
Application Note

Table of Contents
Description .............................................................................................................................................. 1

Table of Contents ................................................................................................................................... 2

1. Self-turn-on ........................................................................................................................................ 3

1.1. What is self-turn-on? ....................................................................................................................... 3

1.2. Self-turn-on mechanism .................................................................................................................. 4

2. Simulation of self-turn-on ................................................................................................................ 5

2.1. Non-isolated DC-DC converter ........................................................................................................ 5

2.1.1. Method of checking for self-turn-on ..................................................................................................5

2.1.2. Adding an external gate-source capacitor to prevent self-turn-on ..............................................6

2.1.3. Changing the slope of the voltage-versus-time curve (dv/dt) to prevent self-turn-on ............8

2.1.4. Effect of the gate resistor on self-turn-on ......................................................................................10

2.2. Inverter circuit configured as a bridge ........................................................................................ 12

2.2.1. Method of checking for self-turn-on ................................................................................................12

2.2.2. Effect of the gate resistor on self-turn-on ......................................................................................13

2.2.3. Effect of the slope of the voltage-versus-time curve (dv/dt) on self-turn-on ..........................15

3. Preventing self-turn-on .................................................................................................................. 17

3.1. Preventing MOSFET self-turn-on in a non-isolated DC-DC converter ..................................... 17

3.2. Preventing MOSFET self-turn-on in an inverter configured as a bridge.................................. 18

RESTRICTIONS ON PRODUCT USE ................................................................................................... 19

© 2017 - 2018 2 2018-07-26


Toshiba Electronic Devices & Storage Corporation
MOSFET Self-Turn-On Phenomenon
Application Note

1. Self-turn-on
1.1. What is self-turn-on?
For example, inverter and non-isolated synchronous rectification converter circuits consist of a
bridge using MOSFETs. When the MOSFETs switch at high speed, a fast rising voltage is applied
across the drain and source terminals of the MOSFET in the off state. Depending on the voltage
change over time dv/dt, a voltage is induced at the gate input of the MOSFET according to the
ratio between its gate-drain capacitance Cgd and gate-source capacitance Cgs. A current flowing
to the gate resistor RG via Cgd causes an excessive gate voltage.
The induced gate voltage exceeding the gate threshold voltage Vth leads to false turn-on of the
MOSFET. This phenomenon is called self-turn-on.
Figure 1.1 shows a non-isolated synchronous rectification converter. When the MOSFET Q1
turns on while the MOSFET Q2 is off, a fast rising voltage (with a high dv/dt rate) is applied to Q2.
Figure 1.2 shows an inverter circuit configured as a bridge. If either one of the upper- or
lower-arm MOSFETs (Q1 or Q2) turns on while the other one is off, a high-dv/dt voltage appears
across the drain and source terminals of the MOSFET in the off state.
A self-turn-on event creates a short circuit between Q1 and Q2. This not only increases power
losses, but also might permanently damage the devices.
Turn-on of the Q1
high-side

Change in current
caused by dv/dt
Q2
+ i=Cgd・(dv/dt)
V Load
C dv/dt
gd
-
Cds
Low-side
RG C MOSFET in the
gs
off state

Figure 1.1 Non-isolated synchronous rectification converter

Q1 Turn-on of the
high-side

Change in current
caused by dv/dt
i=Cgd・(dv/dt)
Cgd

dv/dt
Cds
RG Q2 Low-side MOSFET
Cgs in the off state

Figure 1.2 Inverter circuit configured as a bridge

© 2017 - 2018 3 2018-07-26


Toshiba Electronic Devices & Storage Corporation
MOSFET Self-Turn-On Phenomenon
Application Note

1.2. Self-turn-on mechanism


When a voltage with a dv/dt ramp is applied to a MOSFET, a current flows through its gate-drain
capacitance Cgd.
𝒅𝒅𝒅𝒅
𝒊𝒊 = 𝑪𝑪𝒈𝒈𝒈𝒈
𝒅𝒅𝒅𝒅
This current i induces a voltage across the gate and source terminals of the MOSFET, which is
expressed as:
𝒅𝒅𝒅𝒅 −𝒕𝒕
𝒗𝒗𝐆𝐆𝐆𝐆 = 𝑹𝑹𝑮𝑮 𝑪𝑪𝒈𝒈𝒈𝒈 �𝟏𝟏 − 𝐞𝐞𝐞𝐞𝐞𝐞 � �� ⋯ ⋯ ⋯ (𝟏𝟏)
𝒅𝒅𝒅𝒅 �𝑪𝑪𝒈𝒈𝒈𝒈 + 𝑪𝑪𝒈𝒈𝒈𝒈 �𝑹𝑹𝑮𝑮
(Here, the assumption is that the MOSFET capacitances, Cgs and Cgd, do not change with the
voltage.)
The cause of self-turn-on depends on the length of the period during which a high-dv/dt voltage
is applied across the drain and source terminals:

Phenomenon a: When the dv/dt period is shorter than (Cgs+ Cgd )・RG (i.e., when t≪(Cgs+
Cgd )・RG)
Approximating the term exp{–t/ [(Cgs+ Cgd )・RG]} in Equation (1) to 1-t/[(Cgs+ Cgd )・RG] gives
the following:
(Maclaurin expansion at exp x using primary approximation exp x=1+x)
𝑪𝑪𝒈𝒈𝒈𝒈
𝒗𝒗𝐆𝐆𝐆𝐆 ≈ 𝒗𝒗(𝒕𝒕) ⋯ ⋯ ⋯ (𝟐𝟐)
�𝑪𝑪𝒈𝒈𝒈𝒈 + 𝑪𝑪𝒈𝒈𝒈𝒈 �
When a MOSFET switches at very high speed in switching applications such as non-isolated
synchronous rectification converters, the resulting rise in its gate voltage can be calculated
using Equation (2).
Phenomenon b: When the dv/dt period is longer than (Cgs+ Cgd )・RG (i.e., t≫(Cgs+ Cgd )・
RG)
Since exp{–t/ [(Cgs+ Cgd )・RG]} ≪1, vGS is approximated as follows:
𝒅𝒅𝒅𝒅
𝒗𝒗𝐆𝐆𝐆𝐆 ≈ 𝑹𝑹𝑮𝑮 𝑪𝑪𝒈𝒈𝒈𝒈 ⋯ ⋯ ⋯ (𝟑𝟑)
𝒅𝒅𝒅𝒅
Self-turn-on occurs: 1) when vGS calculated using Equation (2) or (3) exceeds the gate
threshold voltage Vth of the MOSFET, or 2) when the sum of vGS and the residual gate-source
voltage that has been driving the gate exceeds Vth.
v(t)

i=Cgd・(dv/dt) dv/dt
Cgd

RG Cds
vGS
Cgs

Figure 1.3 Circuit with a MOSFET

© 2017 - 2018 4 2018-07-26


Toshiba Electronic Devices & Storage Corporation
MOSFET Self-Turn-On Phenomenon
Application Note

2. Simulation of self-turn-on
2.1. Non-isolated DC-DC converter
2.1.1. Method of checking for self-turn-on
Suppose that the MOSFET Q2 in Figure 2.1 turns off after synchronous rectification mode (in the
on state shown by #2) and that the following dead-time period overlaps the turn-on of the
MOSFET Q1. Then, a high-dv/dt voltage is applied to Q2, causing self-turn-on. This is the
mechanism of the MOSFET self-turn-on in a DC/DC converter.
The MOSFET self-turn-on occurs in a DC/DC converter as follows:
1. The MOSFET Q1 turns on, causing a current to flow to L.
2. When the MOSFET Q1 turns off, the energy accumulated on L flows back through the
source and drain of the MOSFET Q2. During this period, the low-side MOSFET Q2 turns on, acting
as a synchronous rectifier.
3. Next, the MOSFET Q2 turns off. After a dead-time period, the MOSFET Q1 turns on.
This causes a high dv/dt voltage to be applied to the MOSFET Q2.
At this point in time, the gate and drain-source voltages and currents of the MOSFET Q2 are
measured.
(The gate current caused by the dv/dt ramp is calculated as iG≈Cgd・(dv/dt).)
(During the dead-time period from the turn-off of the MOSFET Q2 to the turn-on of Q1, a current
flows through the body diode of the MOSFET Q2. Synchronous rectification MOSFETs in motor
applications operate in the same manner while a current flows back through the body diode.)
#1 Assuming the use of surface-mount
MOSFETs, their lead inductances
are not concedered here.
Turn-on of
#3 the high-side MOSFET Q1

+ RG1 L
Cgd
Driver i=Cgd・(dv/dt) #2
IC Turn-on Load
- of the
Cds low-side
RG2 MOSFET
Cgs Q2
Cgd/(Cgs+Cgd)・v(t)
#3
Gate signal of MOSFET Q1
#1 #2
Gate signal of MOSFET Q2

Current and voltage of MOSFET Q2

Current
Voltage

dv/dt
Figure 2.1 Simulation circuit model and simplified waveforms

© 2017 - 2018 5 2018-07-26


Toshiba Electronic Devices & Storage Corporation
MOSFET Self-Turn-On Phenomenon
Application Note
2.1.2. Adding an external gate-source capacitor to prevent self-turn-on
When a MOSFET switches at high speed, a voltage is induced according to the ratio between its
gate-drain and gate-source capacitances. The induced voltage is superimposed on its gate
voltage and might cause undesired self-turn-on. In our first simulation, the MOSFET used did
not experience self-turn-on under typical conditions. So, we added a large gate resistor
(RG2=20 Ω) only to Q2 to force a self-turn-on phenomenon to occur and then simulated the
effect of an external gate-source capacitor. Because the MOSFETs in a DC/DC converter are
driven at a very high frequency (300 to 500 kHz), the dead-time period from the turn-off of the
MOSFET Q2 to the turn-on of the MOSFET Q1 is very short.
A simulation showed that the external gate-source capacitor is effective in reducing a rise in the
gate voltage, Cgd/(Cgs+Cgd)・v(t), which is a function of the ratio between gate-source and
gate-drain capacitances. However, because the MOSFET Q2 had a large gate resistor RG2, the
effect of the external gate-source capacitor was affected by a rise in the gate voltage due to
RG2・Cgd・(dv/dt). The addition of a capacitor also increased the time required to discharge the
gate charge after the MOSFET Q2 turned off. As a result, the gate discharge current remained
when the MOSFET Q1 turned on, making Q2 more susceptible to self-turn-on, contrary to our
expectation. As demonstrated by this simulation, you should examine both the gate discharge
time and the dead time when adding a capacitor between the gate and source terminals of a
MOSFET for the purpose of self-turn-on prevention.
For accurate simulation, it is important to select appropriate devices and conditions.

Q1 Turn-on of the
high-side MOSFET
RG1 : 5 Ω
L: 0.33 μH
12 V i=Cgd・(dv/dt)
+
Cgd ≈1.5 V

- RG2 : 20 Ω
Load
Driver Low-side
Cds
IC MOSFET
Cgs
C Q2

C: 0, 650 or 1300 pF
Assuming the use of surface-mount
MOSFET used MOSFETs, their lead inductances are
30 V/16 A not concedered here.
Ciss:1350 pF
Crss:63 pF

Figure 2.2a Simulation circuit model

© 2017 - 2018 6 2018-07-26


Toshiba Electronic Devices & Storage Corporation
MOSFET Self-Turn-On Phenomenon
Application Note

Gate discharge
current 650pF

C : 0pF
1300pF
iG (mA)

iG≈Cgd・(dv/dt)

t (ns)

Low-side
High-side

Gate voltage exceeding Vth


vGS (V)

1300pF
Vth

C : 0pF
650pF
t (ns)

C : 0pF
(V)

650pF
vDS

1300pF

t (ns)

C : 0pF
650pF
1300pF
iD (A)

Self-turn-on phenomenon

A rise in voltage caused by the insertion of a capacitor


was reduced. However, the capacitor increased the
time required to discharge the gate charge. When a
large capacitor was used, the gate charge could not be t (ns)
discharged within the dead-time period;
consequently, the capacitor increased the short-circuit
current due to self-turn-on.

Figure 2.2b Waveforms of the circuit of Figure 2.2a

© 2017 - 2018 7 2018-07-26


Toshiba Electronic Devices & Storage Corporation
MOSFET Self-Turn-On Phenomenon
Application Note
2.1.3. Changing the slope of the voltage-versus-time curve (dv/dt) to prevent
self-turn-on
Next, we simulated the impact of the fast changing drain-source voltage (with a high dv/dt rate)
on the MOSFET self-turn-on. (We intentionally selected simulation conditions that would cause
self-turn-on.)
We experimented with different gate resistors RG1 for the high-side MOSFET Q1 in order to
change the dv/dt rate of the drain-source voltage of the MOSFET Q2 and determined whether
self-turn-on occurs as a result.
The voltage superimposed on the gate is expressed as Cgd/(Cgs+Cgd)・v(t). A simulation showed
that reducing the dv/dt rate of the drain-source voltage helped prevent self-turn-on. This is
probably because when the dv/dt rate is small, t is outside the range of v(t) in which the
equation is satisfied and v(t) became smaller as a result.

Q1 Turn-on of
the
R : 5 or 20 Ω high-side
G1
MOSFET
L: 0.33 μH

+ i=Cgd・(dv/dt)
Cgd ≈1.5 V
12 V
- Driver RG2 : 15 Ω
Load
IC
Cds Q2
Cgs

Assuming the use of


MOSFET used surface-mount MOSFETs, their
30 V/16 A lead inductances are not
Ciss:1350 pF considered here.
Crss:63 pF

Figure 2.3a Simulation circuit model

© 2017 - 2018 8 2018-07-26


Toshiba Electronic Devices & Storage Corporation
MOSFET Self-Turn-On Phenomenon
Application Note

Gate discharge 5Ω
current
RG1 : 20Ω
iG (mA)

iG≈Cgd・(dv/dt) @RG2=15Ω

t (ns)

RG1: 5 Ω
Gate voltage exceeding Vth
High-side Q1 20Ω
vGS (V)

Vth @RG2=15Ω
RG1: 20 Ω
5Ω Low-side Q2

t (ns)


vDS(V)

RG1 : 20Ω
@RG2=15Ω

t (ns)

Self-turn-on current
(A)


iD

RG1 : 20Ω

@RG2=15Ω

t (ns)

Figure 2.3b Waveforms of the circuit of Figure 2.3a

© 2017 - 2018 9 2018-07-26


Toshiba Electronic Devices & Storage Corporation
MOSFET Self-Turn-On Phenomenon
Application Note
2.1.4. Effect of the gate resistor on self-turn-on
We simulated the occurrence of self-turn-on in the circuit shown in Figure 2.4a using different
gate resistors RG2 for the low-side MOSFET Q2. (We intentionally selected simulation conditions
that would cause self-turn-on.)
Our simulation showed that the circuit with a larger gate resistor is more susceptible to
self-turn-on. This is probably because the increase in the gate resistance caused the current and
voltage resulting from the discharging of the gate charge persisted longer, offsetting the positive
effect of the reduced dv/dt rate on the gate voltage. In reality, increasing the gate resistance did
not significantly affect the gate current for the MOSFET Q2 during the dv/dt period.
Because the MOSFETs in a real-world DC/DC converter switch at a very high frequency (300 to
500 kHz), a small gate resistor and a short dead-time period are typically used. Although we
used a large gate resistor for this simulation in order to force self-turn-on to occur, such a large
resistor is unlikely to be used in an actual DC/DC converter. In the event of self-turn-on, it will
be difficult to work around the self-turn-on problem by adding an external gate resistor.
Q1
Turn-on of
RG1: 5 Ω the high-side
MOSFET
L: 0.33 μH
+ i=Cgd・(dv/dt)
Driver Cgd ≈1.5 V
12 V
IC
- Load

R Cds
G2
Cgs Q2

R : 5, 10,15 or 20 Ω Assuming the use of surface-mount


G2
MOSFETs, their lead inductances are
MOSFET used not considered here.
30 V/16 A, Ciss:1350 pF, Crss:63 pF
Figure 2.4a Simulation circuit model

Gate
discharge
current iG≈Cgd・(dv/dt)
(mA)

RG2: 20 Ω
iG


t (ns)

RG2: 20 Ω Self-turn-on
gate voltage
(V)

Vth
vGS


t (ns)

Figure 2.4b Gate current and voltage of the low-side MOSFET Q2

© 2017 - 2018 10 2018-07-26


Toshiba Electronic Devices & Storage Corporation
MOSFET Self-Turn-On Phenomenon
Application Note
vGS waveforms of high-side MOSFET

RG2: 20Ω

(V)
15Ω
vGS 5, 10Ω

t (ns)
vGS waveforms of low-side MOSFET

Gate voltage exceeding Vth


(V)

RG2: 20Ω
vGS

15Ω

10Ω Vth

t (ns)
iD waveforms of high-side MOSFET

Short-circuit current
RG2: due to self-turn-on
20Ω
15Ω
iD (A)

5, 10Ω

t (ns)
iD waveforms of low-side MOSFET

RG2:
20Ω
(A)

15Ω
iD

Freewheel current 5, 10Ω


Self-turn-on current

t (ns)

Figure 2.4c vGS and iD waveforms of the high-side and low-side MOSFETs

© 2017 - 2018 11 2018-07-26


Toshiba Electronic Devices & Storage Corporation
MOSFET Self-Turn-On Phenomenon
Application Note

2.2. Inverter circuit configured as a bridge


2.2.1. Method of checking for self-turn-on
Figure 2.5 shows an inverter circuit configured as a bridge. When the MOSFET Q1 in this circuit
turns on, a high dv/dt voltage is applied across the drain and source terminals of the MOSFET Q2.
Consequently, a current flows to the gate resistor via the gate-drain capacitance Cgd of Q2,
lifting its gate voltage. As a result, the MOSFET Q2 might falsely turn on.
The basic operation of the inverter circuit is shown in Figure 2.5. In a simulation, we applied a
train of two pulses to the gate of the MOSFET Q1 in order to examine the self-turn-on of the
MOSFET Q2 as follows:
1. The first gate pulse applied to the MOSFET Q1 causes a current to flow to the inductor L.
2. When the MOSFET Q1 turns off, this current flows back through the body diode of the
MOSFET Q2.
3. Upon application of the second gate pulse to Q1, the body diode of Q2 enters reverse
recovery trr mode. Thereafter, a high-dv/dt drain-source voltage is applied Q2. As a result, a
current flows to the gate resistor RG2 for the MOSFET Q2, lifting its gate voltage.

The assumption is that


through-hole
Q1#3 #1 MOSFETs are used.
RG1 L is the inductance of
the package lead.

+
V
- Q2 #2
RG2
Load (L)

#3
Gate signal of MOSFET Q1
#1 #2
0

Current and voltage of MOSFET Q1


Drain-source current
A self-turn-on 0
phenomenon
occurs here. Drain-source voltage
0
Current and voltage of MOSFET Q2
0
High-dv/dt Body diode current
drain-source
voltage Drain-source voltage

0
Figure 2.5 Simulation circuit model and simplified waveforms

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Toshiba Electronic Devices & Storage Corporation
MOSFET Self-Turn-On Phenomenon
Application Note
2.2.2. Effect of the gate resistor on self-turn-on
In order to examine the effect of the gate resistor, we performed simulations, changing the
value of the gate resistor RG2 for the MOSFET Q2 (in the off state) in the range from 50 Ω to 200
Ω. The larger the gate resistance RG2, the more susceptible the MOSFET becomes to
self-turn-on. (vGS=RG・Cgd・(dv/dt))
The current flowing to the gate of a MOSFET is limited by the associated gate resistor. The
greater the gate resistance, the smaller the gate current. However, because voltage is the
product of current and resistance, the greater the gate resistance, the greater the gate voltage
becomes. Self-turn-on occurs when the gate voltage exceeds Vth. (We intentionally selected
simulation conditions that would cause self-turn-on.)

Q1
RG1: 50 Ω MOSFET used
600 V/30.8 A
Ciss:3000 pF
Crss:9.5 pF
+

Cds
- V: 400 V Cgd
R Load (L)
G2

Cgs
Q2

50-, 100-, 150- and 200-Ω


resistors were used for RG2.

The assumptions are that through-hole


MOSFETs are used and that the package lead
has an inductance of 2 nH.

Figure 2.6a Simulation circuit model

© 2017 - 2018 13 2018-07-26


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MOSFET Self-Turn-On Phenomenon
Application Note

Drain current and voltage waveforms of upper


arm MOSFET at self-turning on Drain current and voltage waveforms of upper
arm MOSFET at self-turning on

(A)
(V)

Self-turn-on
vDS

iD
current
vDS

150Ω
t (μs)
Gate current of lower arm MOSFET RG2: 200Ω
100Ω iD

(V)
50Ω

(A)
vDS
(mA)

iD
iG

Large gate resistance


⇒ Small gate current
RG2: 200Ω
150Ω
t (μs) 100Ω
Gate voltage of lower arm MOSFET 50Ω

Vth: 3 to 4.5 V t (μs)


(V)

The self-turn-on of the Q2 causes a


vGS

short-circuit current to flow to both Q1 and Q2


Large gate resistance upon turn-on of Q1.
⇒Large gate voltage

t (μs)

Figure 2.6b Turn-on curves

© 2017 - 2018 14 2018-07-26


Toshiba Electronic Devices & Storage Corporation
MOSFET Self-Turn-On Phenomenon
Application Note
2.2.3. Effect of the slope of the voltage-versus-time curve (dv/dt) on self-turn-on
This section discusses the effect of the dv/dt rate of the drain-source voltage on self-turn-on.
Since vGS=RG・Cgd・(dv/dt), a rise in the gate voltage can be reduced by reducing dv/dt.
In order to adjust the dv/dt rate while the MOSFET Q2 is in reverse recovery trr mode, the value
of the gate resistor RG1 for the MOSFET Q1 in the gate driver was changed under the conditions
in which self-turn-on occurs (with a 200-Ω gate resistor connected to the MOSFET Q2). The
MOSFET Q2 can be made less susceptible to self-turn-on by increasing the RG1 value to reduce
the dv/dt rate. (We intentionally selected simulation conditions that would cause self-turn-on.)

MOSFET
Q1 used
600 V/30.8 A
Ciss:3000 pF
R : 50 or 200 Ω Crss:9.5 pF
G1

Q2
- V: 400 V
Cgd Cds
Load (L)
RG2: 200 Ω

Cgs

Simulations were performed with 50-


and 200-Ω RG1.

The assumptions are that through-hole


MOSFETs are used and that the package lead
has an inductance of 2 nH.

Figure 2.7a Simulation circuit model

© 2017 - 2018 15 2018-07-26


Toshiba Electronic Devices & Storage Corporation
MOSFET Self-Turn-On Phenomenon
Application Note

The self-turn-on of
the Q2 causes a
short-circuit current
to flow through Q1
and Q2 upon turn-on Drain current and voltage waveforms of upper
of Q1. arm MOSFET at self-turning on

vDS
(V)

(A)
vDS

iD

iD
200Ω
RG1: 50 Ω RG1: 50Ω (Small dv/dt)
(Self-turn-on) 200Ω (Large dv/dt)

t (μs)

Gate current of lower arm MOSFET

RG1: 50 Ω
(mA)

200Ω
iG

t (μs)

Gate voltage of lower arm MOSFET

RG1: 200 Ω

Vth: 3 to 4.5 V
vGS (V)

50Ω

t (μs)

Figure 2.7b Turn-on curves

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Toshiba Electronic Devices & Storage Corporation
MOSFET Self-Turn-On Phenomenon
Application Note

3. Preventing self-turn-on
3.1. Preventing MOSFET self-turn-on in a non-isolated DC-DC converter
When a voltage is applied to a MOSFET, a current generally flows via its gate-drain capacitance
𝒅𝒅𝒅𝒅
Cgd. This current is expressed as 𝒊𝒊 = 𝑪𝑪𝒈𝒈𝒈𝒈 .
𝒅𝒅𝒅𝒅
As a result, a voltage is induced across the gate and source terminals:
𝒅𝒅𝒅𝒅 −𝒕𝒕
𝒗𝒗𝐆𝐆𝐒𝐒 = 𝑹𝑹𝑮𝑮 𝑪𝑪𝒈𝒈𝒈𝒈 �𝟏𝟏 − 𝐞𝐞𝐞𝐞𝐞𝐞 � ��
𝒅𝒅𝒅𝒅 �𝑪𝑪𝒈𝒈𝒈𝒈 + 𝑪𝑪𝒈𝒈𝒈𝒈 �𝑹𝑹𝑮𝑮
(Here, the assumption is that MOSFET capacitances, Cgs and Cgd, do not change with the
voltage.)
In an ultra-high-frequency (300- to 500-kHz) non-isolated DC/DC converter, the MOSFETs in it
also switch at a very high frequency. In this case, a self-turn-on phenomenon occurs when the
gate-source voltage vGS of the MOSFET exceeds its Vth. vGS is expressed as follows:
When the dv/dt transient is shorter than (Cgs+ Cgd )・RG
(i.e., when t≪(Cgs+Cgd)・RG)
𝑪𝑪𝒈𝒈𝒈𝒈
𝒗𝒗𝐆𝐆𝐆𝐆 ≈ 𝒗𝒗(𝒕𝒕)
�𝑪𝑪𝒈𝒈𝒈𝒈 + 𝑪𝑪𝒈𝒈𝒈𝒈 �
(where, v(t) can be considered to be equal to the supply voltage V when t is short.)
Preventing self-turn-on
Selecting MOSFETs with a high Vth and a low Cgd/Cgs ratio is of primary importance. In
addition, a DC/DC converter circuit can be designed with:
∙ a capacitor between the gate and source terminals of the MOSFET in order to
further reduce the Cgd/Cgs ratio. (Figure 3.1)
Care should be exercised, however, because adding a capacitor between the gate and source
terminals of a MOSFET affects its switching speed.
It might be possible to reduce the dv/dt rate by slowing the turn-on of only the high-side
device. However, this does not often serve as an effective solution because switching losses
increase, considering many DC/DC converters are designed to operate at a high frequency.

RG
Gate

Source

Figure 3.1 Adding a capacitor across the gate and source terminals

© 2017 - 2018 17 2018-07-26


Toshiba Electronic Devices & Storage Corporation
MOSFET Self-Turn-On Phenomenon
Application Note

3.2. Preventing MOSFET self-turn-on in an inverter configured as a bridge


When a voltage is applied to a MOSFET, a current generally flows via its gate-drain capacitance
𝒅𝒅𝒅𝒅
(Cgd). This current is expressed as 𝒊𝒊 = 𝑪𝑪𝒈𝒈𝒈𝒈 .
𝒅𝒅𝒅𝒅
As a result, a voltage is induced across the gate and source terminals:
𝒅𝒅𝒅𝒅 −𝒕𝒕
𝒗𝒗𝐆𝐆𝐆𝐆 = 𝑹𝑹𝑮𝑮 𝑪𝑪𝒈𝒈𝒈𝒈 �𝟏𝟏 − 𝐞𝐞𝐞𝐞𝐞𝐞 � ��
𝒅𝒅𝒅𝒅 �𝑪𝑪𝒈𝒈𝒈𝒈 + 𝑪𝑪𝒈𝒈𝒈𝒈 �𝑹𝑹𝑮𝑮
(Here, the assumption is that MOSFET capacitances, Cgs and Cgd, do not change with the
voltage.)
Inverter circuits are typically used at a switching frequency of around 20 kHz. So, the MOSFETs
in an inverter circuit are not required to switch as fast as those in a non-isolated DC/DC
converter. vGS fluctuates early during the dv/dt period according to the ratio between the
gate-drain and gate-source capacitances, but a self-turn-on phenomenon is affected most
significantly by the result of the following equation. When vGS, which is calculated as follows,
exceeds the Vth of a MOSFET, it experiences self-turn-on.
When the dv/dt transient is longer than (Cgs+ Cgd )・RG (i.e., t≫(Cgs+ Cgd )・RG)
𝒅𝒅𝒅𝒅
𝒗𝒗𝐆𝐆𝐆𝐆 ≈ 𝑹𝑹𝑮𝑮 𝑪𝑪𝒈𝒈𝒈𝒈
𝒅𝒅𝒅𝒅
Preventing self-turn-on
Selecting MOSFETs with a high Vth and a low Cgd is of primary importance. In addition, an
inverter circuit can be designed as follows to prevent self-turn-on:
• Reduce the dv/dt rate during turn-on. (Increase the turn-on resistance.) (Figure 3.2)
• Reduce RG during turn-off. (Reduce the turn-off resistance.) (Figure 3.2)
• Use a negative gate voltage. (Figure 3.3)
• Use a shunt circuit at the gate. (Figure 3.4)

RG2 SBD
RG1
RG1
RG2

RG1>RG2
Figure 3.2 Using separate gate resistors for turn-on and turn-off

RG RG

Negative
+
power supply

Figure 3.3 Using a negative Figure 3.4 Adding a shunt
gate power supply circuit
© 2017 - 2018 18 2018-07-26
Toshiba Electronic Devices & Storage Corporation
MOSFET Self-Turn-On Phenomenon
Application Note

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Toshiba Electronic Devices & Storage Corporation

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