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    Rajat Tomar
    1. Diffraction methods like X-ray diffraction (XRD) are fundamental tools for structural characterization that have been applied to samples in this project. XRD allows determining crystallographic structure and deviations from perfect ordering. 2. XRD works by exploiting the Bragg condition - when X-ray wavelength matches interatomic distances in a solid, diffraction occurs. Powder XRD measurements were performed on samples using a Rigaku diffractometer. 3. Fourier transform infrared (FTIR) analysis is also used to obtain infrared spectra and understand molecular bonding in samples by identifying stretching peaks in the spectra. FTIR data was acquired at the college's research center.

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    PROJECT

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    1. Diffraction methods like X-ray diffraction (XRD) are fundamental tools for structural characterization that have been applied to samples in this project. XRD allows determining crystallographic structure and deviations from perfect ordering. 2. XRD works by exploiting the Bragg condition - when X-ray wavelength matches interatomic distances in a solid, diffraction occurs. Powder XRD measurements were performed on samples using a Rigaku diffractometer. 3. Fourier transform infrared (FTIR) analysis is also used to obtain infrared spectra and understand molecular bonding in samples by identifying stretching peaks in the spectra. FTIR data was acquired at the college's research center.

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    1. Diffraction methods like X-ray diffraction (XRD) are fundamental tools for structural characterization that have been applied to samples in this project. XRD allows determining crystallographic structure and deviations from perfect ordering. 2. XRD works by exploiting the Bragg condition - when X-ray wavelength matches interatomic distances in a solid, diffraction occurs. Powder XRD measurements were performed on samples using a Rigaku diffractometer. 3. Fourier transform infrared (FTIR) analysis is also used to obtain infrared spectra and understand molecular bonding in samples by identifying stretching peaks in the spectra. FTIR data was acquired at the college's research center.

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    © All Rights Reserved
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    Download as docx, pdf, or txt
    25 views2 pages

    PROJECT

    Uploaded by

    Rajat Tomar
    1. Diffraction methods like X-ray diffraction (XRD) are fundamental tools for structural characterization that have been applied to samples in this project. XRD allows determining crystallographic structure and deviations from perfect ordering. 2. XRD works by exploiting the Bragg condition - when X-ray wavelength matches interatomic distances in a solid, diffraction occurs. Powder XRD measurements were performed on samples using a Rigaku diffractometer. 3. Fourier transform infrared (FTIR) analysis is also used to obtain infrared spectra and understand molecular bonding in samples by identifying stretching peaks in the spectra. FTIR data was acquired at the college's research center.

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    CHAPTER 3 CHARCTERISATION TECHNIQUS

    3.1 DIFFRACION METHODS

    Diffraction methods have become a fundamental tool for the structural characterization
    and they have also been applied to the samples studied in this project. The X-ray
    diffraction (XRD) allows studying the long range ordering and determination of the
    crystallographic structure on the one hand and deviation from a perfect ordering on the
    other hand. The usefulness of the short x-rays arises from the possibility to tune their
    wavelength so that it closely matches the interatomic distances in the solid(i.e bcomes
    of order~ 1A.

    3.1.1 X-RAY DIFFRACTION


    X-ray diffraction is a widely used technique to determine the crystalline phase in the
    bulk material. The wavelength of X-ray is comparable to the separation (d) between the
    crystal planes. Diffraction occurs when the Bragg condition which states that the X-rays
    reflected from two neighboring planes of atoms must coherently interfere, is satisfied.
    This condition is fulfilled when the extra distance traveled by the x-rays to the farther
    plane of atoms is equal to the multiple of the X-ray wavelength, i.e. 2dSinϴ = nλ, where
    n is an integer ( as illustrated in Fig. 3.1 below) giving rise to diffraction in solids[1,2].
    An x-ray diffraction can be carried out on the polycrystalline (powder) sample or single
    crystals. The XRD pattern is a plot of the intensity of diffracted rays versus Bragg angle

    Fig: 3.1. The Bragg condition, 2dSinϴ = nλ, where n is an integer, the extra distance
    traveled by the X-rays to the farther plane of atoms is equal to the multiple of the X-ray
    wavelength.
    and contains information about the structure and composition of the basis. This
    information needs to be extracted from the pattern by employing a proper analysis
    procedure such as Full Prof suite.

    In the present study, the powder method is made use off wherein the samples were
    crushed into fine powder in an agate pestle and mortar and placed in a beam of
    monochromatic X-rays. The powder X-ray diffraction measurements are performed on
    powder samples using Rigaku X-ray diffractometer system at the Department of
    Physics, St. Xaviers College of Arts and Science. The intensity of the Copper K α (λ =
    1.5418A°) radiation diffracted from the powdered specimen was detected by a
    scintillation counter and recorded as a function of 2ϴ, where ϴ is the angle of
    incidence. The patterns were recorded in continuous mode in the 2ϴ range of 20° ≤ 2ϴ

    25
    ≤ 80° with a step size of 0.02 at a speed of 2°/min. The diffraction peaks were indexed
    using a commercially available Power diffraction package.

    3.2 FTIR(FOURIER TRANSFORM INFRARED ANALYSIS)

    The FTIR technique is used for knowing the infrared spectra in terms of absorbance,
    reflection and photoconductivity [3].FTIR collects spectral data in wide spectral range.
    This technique is utilized for knowing the molecular bonding between atoms present in
    the sample, resulting in confirmation about its structure. In this technique, the sample
    cannot be directly characterized, but a few samples like thin films may be done by
    direct measurement. For the ceramic sample, there is a base of potassium bromide
    (KBr). The light source falls on the sample surface that is placed in front of the base
    KBr. The IR spectrum forms in the form of stretching peaks. Each peak forms at a
    different wave number. These peaks give the bonding range between the atoms present
    in the material. The FTIR principle is based on the Michelson’s Interferrometer as seen
    in Fig. 3.2 below. Data acquisition for FTIR was carried out at the Research centre of
    the college.

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