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    HTOL

    Uploaded by

    Jorge Prieto
    The document discusses considerations for effective high temperature operating life (HTOL) testing of integrated circuits. HTOL testing stresses ICs at elevated temperatures and voltages over time to identify potential failure modes and assess lifetime. Key parameters that impact HTOL testing include digital toggling factors, activating all modules, operating all I/Os, precise temperature control, voltage stress levels, acceleration factors, test duration, and sample size. The document also outlines sample selection, preparation, testing procedures, and statistical analysis methods for HTOL qualification.

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    © All Rights Reserved
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    HTOL

    Uploaded by

    Jorge Prieto
    159 views11 pages
    The document discusses considerations for effective high temperature operating life (HTOL) testing of integrated circuits. HTOL testing stresses ICs at elevated temperatures and voltages over time to identify potential failure modes and assess lifetime. Key parameters that impact HTOL testing include digital toggling factors, activating all modules, operating all I/Os, precise temperature control, voltage stress levels, acceleration factors, test duration, and sample size. The document also outlines sample selection, preparation, testing procedures, and statistical analysis methods for HTOL qualification.

    Original Description:

    High Temperature Operative Live

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    The document discusses considerations for effective high temperature operating life (HTOL) testing of integrated circuits. HTOL testing stresses ICs at elevated temperatures and voltages over time to identify potential failure modes and assess lifetime. Key parameters that impact HTOL testing include digital toggling factors, activating all modules, operating all I/Os, precise temperature control, voltage stress levels, acceleration factors, test duration, and sample size. The document also outlines sample selection, preparation, testing procedures, and statistical analysis methods for HTOL qualification.

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    159 views11 pages

    HTOL

    Uploaded by

    Jorge Prieto
    The document discusses considerations for effective high temperature operating life (HTOL) testing of integrated circuits. HTOL testing stresses ICs at elevated temperatures and voltages over time to identify potential failure modes and assess lifetime. Key parameters that impact HTOL testing include digital toggling factors, activating all modules, operating all I/Os, precise temperature control, voltage stress levels, acceleration factors, test duration, and sample size. The document also outlines sample selection, preparation, testing procedures, and statistical analysis methods for HTOL qualification.

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    of 11

    Considerations for effective

    high temperature operation life


    (HTOL) implementation
    Track G:
    Verification, Simulation, and Testing

    Ducat - Deny Hanan


    May 2015

    May 6, 2015
    1 1
    My name is Deny Hanan, and I am co-founder of
    Ducat.
    I have ~25 years experience in semiconductor
    Q&R engineering and management..

    May 6, 2015
    2 2
    What is HTOL?
    High Temperature Operating
    Life (HTOL) is a reliability test
    applied to Integrated Circuits
    (IC) to determine their intrinsic
    reliability. It stresses the IC at
    an elevated temperature, high
    voltage and dynamic operation
    for a predefined period of time
    for triggering potential failure
    modes and assess IC lifetime.

    May 6, 2015 3
    3
    HTOL evolution

    I.C I.C
    D.C Static D.C
    Dynamic
    (Mid 80’s) (Early 70’s)

    I.C I.C
    tested D.C I.C
    Monitored D.C
    (Current) (Early 00’s)

    May6,6,2015
    May 2015
    4
    For effective HTOL stress test,
    the following parameters shall be considered
    1. Digital Toggling Factor, toggle as many as fast possible
    2. Analog Modules Operation, activate all modules
    3. I/O Ring Activity, operate all I/Os
    4. Monitor Design, activity vs pattern matching
    5. Ambient Temperature (Ta), ‘precise’ aging
    6. Junction Temperature (Tj), consider self heating
    7. Voltage Stress (Vstrs), max rating vs over stress
    8. Acceleration Factor (AF), count all aging models
    9. Test Duration (t), equivalent to life time
    10. Sample Size (SS) the higher the better
    May 6, 2015
    5
    HTOL Policy
    Sample Selection
    – Use (three) nonconsecutive production lots in order to
    represent manufacturing variability
    – Samples shall be fabricated, handled, screened and
    assembled in the same manner that will be done in
    production
    Sample preparation
    – Test prior to stress and at predefined check points
    – Test at max/min rating temp. & at room temp.
    – Log all functional events and parametric results

    May 6, 2015 6
    6
    HTOL Policy
    Test duration
    – Assuming 1000h trial, check points (usually) are after
    48, 168, 500 and 1000 hours
    – Different check points for different AF can be
    calculated
    – Electrical testing shall be completed as soon as
    possible after removing the stress
    – if samples cannot be tested soon after removal
    additional stress time shall be applied (24 hours for
    each 168 hours)

    May 6, 2015 7
    7
    HTOL Policy
    Merit numbers
    – Qualification is an outcome of statistical sampling
    plan. An AUDIT TOOL to ensure that the output of a
    process meets the requirements. It simply ACCEPTs
    or REJECTs the tested lots.
    – Consider AQL, LTPD, manufacturer`s risk and
    customer`s risk for fitting qualification strategy.
    – The commonly used sampling plan of 0 rejects out of
    230 is equal to 3 rejects out of 668 samples assuming
    LTPD=1 but with higher ‘pass’ probability

    May 6, 2015 8
    8
    Standard use in various
    industries
    • Commercial Use

    • Automotive Use

    May 6, 2015 9
    9
    Standard use in various
    industries
    • Telecommunication Use
    (European Telecom)

    (US Telecom)

    • Military Use

    May 6, 2015 10
    10
    The ducat, a coin of value, was once the gold
    standard of trade in Europe.
    True to its name, ducat is adding value, and
    introducing a new standard of Q&R services.
    Thank You

    Deny.Hanan@Gmail.com 054-9222399

    May 6, 2015
    11

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