X - Ray
X - Ray
X - Ray
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1
INTRODUCTION
x rays—for example, the dependence of penetration on density and the lack of signifi-
cant refraction—as well as pioneering some of their applications.
Today, x rays are important not only for medical imaging and baggage inspection
but also for astronomical observations, for materials analysis, for structure determina-
tion of viruses and pharmaceuticals, for fluorescence analysis in manufacturing
quality control, and for fraud detection in art. An increasing interest in x-ray astron-
omy was one of the major forces behind the development of x-ray optics in the latter
half of the last century. Mirror systems similar to those developed for astronomy also
proved useful for synchrotron beamlines. Just as x-ray tubes w ere an accidental off-
shoot of cathode ray research, synchrotron x-ray sources were originally parasitic to
particle physics: the synchrotron radiation was an unwanted consequence of acceler-
ating the particles, because it removes energy from the particle beam. The subsequent
development of specialized synchrotron sources with increasing brightness and num-
bers of beamlines led to creation of a w hole new array of x-ray tools and a consequent
demand for an increasing array of optics.
The rapid development of x-ray optics also has been symbiotic with the development
of detectors and compact sources. Detectors developed for particle physics, medicine,
and crystallography have found application across the different fields. Similarly, the
increasing capabilities of x-ray systems have stimulated the development of new sci-
ence, with ever-growing requirements for intensity, coherence, and spatial and energy
resolution. X-ray diffraction and fluorescence w ere early tools during the rapid devel-
opment of materials science a fter World War II. More recently advancements have
been made to meet the demands of shrinking feature sizes and allowed defect concen-
trations in semiconductors. The use of x-ray diffraction, especially the development of
dedicated synchrotron beamlines, has also been stimulated by the growing demands
for rapid protein crystallography in biophysics and pharmaceutical development.
! ! h
p = "κ ⇒ λ = , (1-2)
p
U 2 − (Mc 2 )2 U
U 2 = (Mc 2 )2 + p 2c 2 ⇒ p = = , (1-4)
c c
since, as photons are massless, M = 0. Thus, wavelength and energy are related by
hc
U= , (1-5)
λ
where c is the speed of light. Expressing h in units of eV s, and c in units of Å/s gives
the useful result that
hc ≈ 12.4 keV Å. (1-6)
Thus, the wavelength range from 10 to 0.1 Å corresponds to 1.2 to 124 keV in photon
energy. For comparison, a visible light photon with a wavelength of 0.5 μm corresponds
to a photon energy of 2.5 eV, or 2.5 × 10 −3 keV. Quantum mechanics also gives us the
relationship between photon energy and f requency ν,
U = hν , (1-7)
which gives us the expected relationship between wavelength and frequency,
hc c
λ= = . (1-8)
U ν
EXAMPLE 1-1
a) What are the wavelength and frequency of the 8 keV x rays frequently used for pro-
tein crystallography experiments?
From equation 1-5,
hc 12.4 keV i Å
λ= ≈ ≈1.55 Å.
U 8 keV
From equation 1-8,
c 3 × 1018 Å/s
ν= ≈ ≈1.9 × 1018 Hz ≈1.9 exahertz ≈1.9 EHz.
λ 1.55 Å
b) For comparison, what is the wavelength of an electron with a kinetic energy of 8 keV?
The difference between the photon and electron wavelengths arises in applying
equation 1-4, because the electron is not massless. The kinetic energy is the
difference between the total energy U and the rest mass energy, which for small
(nonrelativistic) momentum is
K e = U − M ec 2 = ( M e c 2 )2 + p 2 c 2 − M e c 2
p 2c 2 ⎛ 1 p 2c 2 ⎞ p2
= M ec 2 1 + − M ec 2 ≈ M ec 2 ⎜ 1 + ⎟ − M ec 2 =
( M ec ) 2 2
⎝ 2 ( M ec 2 ) ⎠
2
2M e
h h (6.6 × 10−34 J i s)
λ= = ≈
p 2M e (K e ) ⎛ 1.6 × 10−19 J ⎞
2(9.1 × 10−31 kg)(8 × 103 eV)⎜ ⎟⎠
⎝ 1eV
m2
kg s
≈1.4 × 10−11 s 2 ≈1.4 × 10−11 m ≈ 0.14 Å.
m2
kg 2 2
s
The electron wavelength is more than a factor of 10 smaller than that of the x ray
with the same kinetic energy.
Photon
Object Shadow
his photographic plate. Absorption increases with the electron density of the mate-
rial but is lower for higher-energy photons.
By way of analogy, consider an object with thick and thin regions like that of
Figure 1-3. If the object was made with alternating painted plywood and tissue paper,
you could map out the areas of tissue paper by throwing balls at the object and letting
them mark the wall behind the object when they passed through. If the object was
constructed of thick wood and bricks, you would need higher-momentum projec-
tiles, perhaps bullets, to make a shadow. However, bullets would do a poor job of
making a shadow image of the tissue paper area, because they would pass through
the plywood as well. Thus, high-energy (“hard”) x rays are used for inspecting ve-
hicles and steel cargo containers, as shown in Figure 1-4. Since almost all the hard
x rays would pass through a thinner object or one with a lower atomic number, creat-
ing very little shadow, lower-energy (“softer”) x rays must be used to diagnose a bro-
ken hand.
Because x rays barely interact with materials, their index of refraction in any mate-
rial is only slightly different from unity. This results in sharp shadows for radiography,
because the rays are hardly refracted, but means it is very difficult to make refractive
optics such as the lenses normally used for visible light. The penetrating nature of
x rays also makes it difficult to construct optics such as Fresnel zone plates, or even
pinholes for pinhole cameras, since the masking material must be thick compared with
the dimensions of the apertures.
The energy of an x-ray photon, in the kiloelectronvolt range, is very much larger
than the sub-electronvolt range typical for valence electron transitions in materials.
Hence, x-ray properties are relatively insensitive to chemical state, unlike the changes
in color or opacity that can easily be induced for visible light. However, x-ray energies
are similar to ionization energies for core electrons and thus can be used to probe for
characteristic atomic transitions. X-ray absorption spectroscopy and x-ray fluorescence
are extremely important for elemental analysis. The 1924 Nobel Prize in Physics was
awarded to Siegbahn for developing the field of x-ray spectroscopy.
Problems
SECTION 1.2
1. Planck’s constant, h, is 6.6 × 10−34 J s. 1 eV is the energy associated with an
electron charge, qe ≈ 1.6 × 10−19 Coul, in a potential of 1 V. The speed of light is
approximately 3 × 108 m/s. Verify equation 1-6.
2. What is the wavelength of 30 keV x rays?
Further reading
General references for x-ray topics
Jens Als-Nielsen and Des McMorrow, Elements of Modern X-ray Physics, John Wiley &
Sons, 2001.
Eric Lifshin, X-ray Characterization of Materials, John Wiley & Sons, 1999.
A. G. Michette and C. J. Buckley, X-ray Science and Technology, Institute of Physics
Publishing, 1993.
Alan Michette and Sławka Pfauntsch, X-Rays: The First Hundred Years, John Wiley & Sons,
1996.
E. Spiller, Soft X-ray Optics, SPIE Press, 1994.
David Attwood and A. Sakdinawat, X-Rays and Extreme Ultraviolet Radiation: Principles
and Applications, Cambridge University Press, 2016.
Relativity
D. Halliday, R. Resnick, and J. Walker, Fundamentals of Physics, 10th ed., John Wiley &
Sons, 2013, chapter 37.
Historical references
Arthur Stanton, Wilhelm Conrad Röntgen on a new kind of rays: Translation of a paper read
before the Würtzburg Physical and Medical Society, Nature 53 (1895): 274–76.
New York Times, February 16, 1896, Nature of the X Rays.