Piezoelectric Ty
Piezoelectric Ty
Piezoelectric Ty
Fundamentals of Piezoelectricity
Abstract The objective of this chapter is to help understand the main concepts
and working of piezoelectric sensors and transducers. Accordingly, the chapter
presents a simplified explanation of the piezoelectric phenomenon. The chapter
begins with a brief overview of some historical milestones, such as the discovery
of the piezoelectric effect and the utilization of piezoelectric materials in various
applications. Various mechanisms involved in the polarization of dielectric, ferro-
electric and piezoelectric materials are discussed. The piezoelectric effect has been
explained with basic mathematical formulations based on the intermingling of elec-
tric and elastic phenomena. In essence, the chapter describes the basic concept of
piezoelectric phenomena that one needs to know while using piezoelectric materi-
als as transducers. For detailed theory on piezoelectric phenomenon, one may refer
to standard literature on piezoelectricity (Mason in Electromechanical Transducers
and Wave Filters, 1942; Mason in Physical Acoustics and the Properties of Solids,
1958; Cady in Piezoelectricity, 1946; Nalwa in Ferroelectric Polymers: Chemistry,
Physics, and Applications, 1995; Ikeda in Fundamentals of Piezoelectricity, 1996).
frequency control [3]. With the introduction of quartz control, timekeeping moved
from the sun and stars to small, man-made sources that exceeded astronomy based
references in stability. Since then the advent of the man-made piezoelectric materi-
als widened the field of applications and devices based on piezoelectricity are used
in sonar, hydrophone, microphones, piezo-ignition systems, accelerometers and ul-
trasonic transducers. The discovery of a strong piezoelectric effect in polyvinylidene
fluoride (PVDF) polymer, by Kawai in 1969 [8], further added many applications
where properties such as mechanical flexibility are desired. Today, piezoelectric ap-
plications include smart materials for vibration control, aerospace and astronautical
applications of flexible surfaces and structures, sensors for robotic applications, and
novel applications for vibration reduction in sports equipment (tennis racquets and
snowboards). Recently, the newer and rapidly burgeoning areas of utilization are
the non-volatile memory and the integral incorporation of mechanical actuation and
sensing microstructures (e.g. POSFET devices) into electronic chips.
Fig. A.1 Frequency dependence of various polarization mechanisms. The electronic, ionic, and
orientation polarization mechanisms are indicated
moments. Polarization results from a rotation of the permanent moments into the
direction of the applied field, as represented in top-right of Fig. A.1.
The total electric polarization of a substance is equal to the sum of the electronic,
ionic, and orientation (and space-charge) polarizations. It is possible for one or more
of these contributions, to the total electric polarization, to be either absent or neg-
ligible in magnitude relative to the others. For example, ionic polarization will not
exist in covalently bonded materials in which no ions are present. The average po-
−
→
larization per unit volume, P , produced by N little electric dipoles (of the electric
−
→
dipole moment, p ) which are all aligned, is given by:
−
→ 1 −
→
N
P = pk (A.1)
V olume
k=0
is set up and causes the molecules to align with E. However, the alignment is not
complete due to random thermal motion. The second type of dielectrics is the non-
polar dielectrics, which are dielectrics that do not possess permanent electric dipole
moment. Electric dipole moments can be induced by placing the materials in an ex-
ternally applied electric field. Figure A.1 illustrates the state of non-polar molecules
with and without an external field.
Dielectric materials are electrically insulating, yet susceptible to polarization in
the presence of an electric field. This polarization phenomenon accounts for the
ability of the dielectrics to increase the charge storing capability of capacitors, the
efficiency of which is expressed in terms of a dielectric constant.
Ferroelectrics are the class of dielectric materials which exhibit spontaneous po-
larization (polarization associated with a spontaneously formed dipole moment)—
that is, polarization in the absence of an electric field. The spontaneous polarization
of ferroelectric materials can be switched by applying an electric field; its expres-
sion is a typical P–E hysteresis loop similar to that shown in Fig. A.5(a). They
undergo a structural phase transition from a high temperature paraelectric into a
low-temperature ferroelectric phase at Curie temperature. Ferroelectric materials are
the dielectric analogue of ferromagnetic materials, which may display permanent
magnetic behavior. There must exist permanent electric dipoles in the ferroelectric
materials. Ferroelectrics are a class of the polar piezoelectrics (e.g. polarized PZT,
PVDF, and P(VDF-TrFE)) and hence all ferroelectric materials are piezoelectric.
Piezoelectrics are the class of dielectric materials which can be polarized, in addi-
tion to an electric field, also by application of a mechanical stress (Fig. A.2). This
unusual property exhibited by a few dielectric materials is called piezoelectricity,
or, literally, pressure electricity. Piezoelectric materials can be divided into polar
(which possess a net dipole moment) and non polar piezoelectric materials (whose
dipolar moments summed in different directions give a null total moment). A de-
tailed description of the piezoelectric effect is given in following sections.
Fig. A.2
Piezoelectricity—An
intermingling of electric and
elastic phenomena
the material. Before subjecting the material to an external stress the centers of the
negative and positive charges of each molecule coincide—resulting into an elec-
trically neutral molecule as indicated in Fig. A.3(a). However, in presence of an
external mechanical stress the internal reticular can be deformed, thus causing the
separation of the positive and negative centers of the molecule and generating little
dipoles as indicated in Fig. A.3(b). As a result, the opposite facing poles inside the
material cancel each other and fixed charges appear on the surface. This is illustrated
in Fig. A.3(c). That is to say, the material is polarized and the effect called direct
piezoelectric effect. This polarization generates an electric field that can be used to
transform the mechanical energy, used in the material’s deformation, into electrical
energy.
Figure A.4(a) shows the piezoelectric material with two metal electrodes de-
posited on opposite surfaces. If the electrodes are externally short circuited, with a
Fig. A.3 Piezoelectric effect explained with a simple molecular model: (a) An unperturbed
molecule with no piezoelectric polarization (though prior electric polarization may exist); (b) The
molecule subjected to an external force (Fk ), resulting in to polarization (Pk ) as indicated; (c) The
polarizing effect on the surface when piezoelectric material is subjected to an external force
200 A Fundamentals of Piezoelectricity
Fig. A.4 Piezoelectric phenomenon: (a) The neutralizing current flow when two terminal of piezo-
electric material, subjected to external force, are short circuited; (b) The absence of any current
through the short-circuit when material is in an unperturbed state
galvanometer connected to the short circuiting wire, and force is applied the surface
of piezoelectric material, a fixed charge density appears on the surfaces of the crystal
in contact with the electrodes. This polarization generates an electric field which in
turn causes the flow of the free charges existing in the conductor. Depending on their
sign, the free charges will move toward the ends where the fixed charges generated
by polarization are of opposite sign. This flow of free charge continues until the free
charge neutralizes the polarization effect, as indicated in Fig. A.4(a). This implies
that no charge flows in the steady state or in the unperturbed state—irrespective
of the presence of external force. When the force on the material is removed, the
polarization too disappears, the flow of free charges reverses and finally the mate-
rial comes back to its original standstill state indicated in Fig. A.4(b). This process
would be displayed in the galvanometer, which would have marked two opposite
sign current peaks. If short-circuiting wire is replaced with a resistance/load, the
current would flow through it and hence mechanical energy would be transformed
into electrical energy. This scheme is fundamental to various energy harvesting tech-
niques that tap ambient mechanical energy such as vibrations [9] and convert it into
usable electrical form.
Some materials also exhibit the reverse piezoelectric effect i.e. a mechanical de-
formation or strain is produced in the material when a voltage is applied across
the electrodes. The strain generated in this way could be used, for example, to dis-
place a coupled mechanical load. This way of transforming the electrical electric
energy into usable mechanical energy is fundamental to the applications such as
nano-positioning devices.
Fig. A.5 Piezoelectric material in sensing and actuating applications. (a) Typical P–E hysteresis
plot (top) and the strain versus electric field plot (bottom) of a piezoelectric material. (b) The
piezoelectric material before (dotted) and after poling, albeit change in dimension is exaggerated.
The polarity of poling voltage is clearly indicated. (c) Material’s dimension when applied voltage
has polarity similar to that of poling voltage. (d) Material’s dimension when applied voltage has
polarity opposite to that of poling voltage. (e) The generated voltage with polarity similar to poling
voltage when compressive force is applied in poling direction. (f) The generated voltage with
polarity opposite to poling voltage when tensile force is applied in poling direction
citations along different directions. Using them in various sensing or actuating ap-
plications requires a systematic tabulation of their properties—for which, a stan-
dardized means for identifying directions is very important. That is to stay, once the
piezoelectric material is chosen for a particular application, it is important to set the
mechanical and electrical axes of operation. Wherever crystals are concerned, the
orthogonal axes originally assigned by crystallographers are used for this purpose.
A general practice to identify the axes is to assign them the numerals e.g. 1 corre-
sponds to x axis; 2 corresponds to y axis, and 3 corresponds to z axis. These axes are
set during “poling”; the process that induces piezoelectric properties in the piezo-
electric material. The orientation of the DC poling field determines the orientation
of the mechanical and electrical axes. The direction of the poling field is generally
identified as one of the axes. The poling field can be applied in such as way that the
material exhibits piezoelectric responses in various directions or combination of di-
rections. The poling process permanently changes the dimensions of a piezoelectric
material, as illustrated in Fig. A.5(b). The dimension between the poling electrodes
increases and the dimensions parallel to the electrodes decrease. In some materi-
als, the poling step is also needed for the introduction of piezoelectric effect. For
example, in virgin state the piezoelectric materials such as PVDF, P(VDF-TrFE),
and ceramics are isotropic and are not piezoelectric before poling. Once they are
polarized, however, they become anisotropic.
After the poling process is complete, a voltage lower than the poling voltage
changes the dimensions of the piezoelectric material for as long as the voltage is
202 A Fundamentals of Piezoelectricity
applied. A voltage with the same polarity as the poling voltage causes additional
expansion along the poling axis and contraction perpendicular to the poling axis,
as illustrated in Fig. A.5(c). One can also notice this from the P–E and S–E plots
shown in Fig. A.5(a). When a poling field, E, is applied across a piezoelectric
material, the polarization as well as the mechanical strain curves follow the path
(i)–(ii) on the P–E and S–E plots respectively. When the poling field is removed,
the path (ii)–(iii) is followed and piezoelectric material retains certain level of po-
larization, called remanent polarization, Pr , and experiences permanent strain or
permanent change in the dimensions. From operational point of view, the poling
procedure shifts the working point from (i) to (iii). After this, whenever a volt-
age with the same polarity as the poling field is applied, the P–E and S–E plots
will follow the curve (iii)–(ii) and hence positive strain will be developed, as in-
dicated in Fig. A.5(a). In other words, there is expansion along the poling axis, as
shown in Fig. A.5(c). Similarly, when a voltage with the polarity opposite to the
poling voltage is applied the P–E and S–E plots will follow the curve (iii)–(iv),
resulting in negative strain. As a result, there is contraction along the poling axis
and expansion perpendicular to the poling axis, as indicated in Fig. A.5(d). In both
cases, however, the piezoelectric material returns to its poled dimensions on the
plots (i.e. working point (iii) on Fig. A.5(a)) when the voltage is removed from the
electrodes.
If after completion of the poling process, a compressive and tensile force is ap-
plied to the piezoelectric material, a voltage is generated as shown in Fig. A.5(d), (e).
With an argument similar to that presented in previous paragraph it can be shown
that the generated voltage will have the same polarity as the poling field when a
compressive force is applied along the poling axis or a tensile force applied perpen-
dicular to the poling axis. This is illustrated in Fig. A.5(e). Similarly, as indicated
in Fig. A.5(f), a voltage with the opposite polarity will result when a tensile force is
applied along the poling axis, or when a compressive force is applied perpendicular
to the poling axis.
The knowledge of the voltage polarities is very helpful before a piezoelectric ma-
terial is actually put to use. Generally two or more of the above mentioned actions
are present simultaneously. In some cases one type of expansion is accompanied by
another type of contraction which compensate each other resulting in no change of
volume. For example, the expansion of length of a plate may be compensated by an
equal contraction of width or thickness. In some materials, however, the compen-
sating effects are not of equal magnitude and net volume change does occur. In all
cases, the deformations are, however, very small when amplification by mechanical
resonance is not involved. The maximum displacements are on the order of a few
micro-inches.
Ppe = d × T (A.2)
where Ppe is the piezoelectric polarization vector, whose magnitude is equal to the
fixed charge density produced as a result of piezoelectric effect, d is the piezoelectric
strain coefficient and T is the stress to which piezoelectric material is subjected.
For simplicity, the polarization, stress, and the strain generated by the piezoelectric
effect have been specified with the ‘pe’ subscript, while those externally applied do
not have any subscript. In a similar manner, the indirect/reverse piezoelectric effect
can be formulated as:
Spe = d × E (A.3)
where Spe is the mechanical strain produced by reverse piezoelectric effect and E is
the magnitude of the applied electric field. Considering the elastic properties of the
material, the direct and reverse piezoelectric effects can alternatively be formulated
as:
Ppe = d × T = d × c × S = e × S (A.4)
Tpe = c × Spe = c × d × E = e × E (A.5)
where c is the elastic constant relating the generated stress and the applied strain
(T = c × S), s is the compliance coefficient which relates the deformation produced
by the application of a stress (S = s × T ), and e is the piezoelectric stress constant.
1 At high electric field or high mechanical stress, they may show considerable nonlinearity.
204 A Fundamentals of Piezoelectricity
strain S. This strain will have two effects: One, it will generate an elastic stress
Te , proportional to the mechanical strain (Te = c × S); and two, it will generate a
piezoelectric polarization Ppe = e × S according to Eq. (A.4). This polarization will
create an internal electric field in the material Epe given by:
Ppe e×S
Epe = = (A.6)
ε ε
where ε is the dielectric constant of the material. Assuming a compressive stress,
applied on the piezoelectric material along the poling direction, it is known from
Fig. A.5(d) that the resulting electric field of piezoelectric origin will have a di-
rection same as that of poling field. Further, it is also known from Fig. A.5(c) and
related discussion in previous section that the presence of an electric field with po-
larity same as that of poling field results in positive strain and hence the expansion
of piezoelectric material in the poling direction. That is say, the electric field (Epe
from Eq. (A.6)), of piezoelectric origin, produces a stress which opposes the applied
external stress. This is also true if the external applied stress is tensile in nature. The
stress Tpe (= e × Epe ), produced by the electric field Epe , as well as that of elastic
origin, is against the material’s deformation. Consequently, the stress generated by
the strain S is:
e2 e2
T = Te + Tpe = c × S + ×S = c+ ×S =c×S (A.7)
ε ε
When an external electric field E is applied between two electrodes where a mate-
rial of dielectric constant ε exists, an electric displacement is created toward those
electrodes, generating a surface charge density σ = σo + σd , as shown in Fig. A.6.
The magnitude of this electric displacement is D = ε × E.2 If the material is piezo-
electric, the electric field E also produces a strain, expressed as Spe = d × E. This
strain, of reverse piezoelectric origin, can be positive or negative depending on the
direction of the external electric field with respect to the poling field. As discussed
2 Thefree charge density which appears on the electrodes, will be the sum of the charge density
which appears in vacuum plus the one that appears induced by the dielectric effect, i.e.:
σ = σo + σd = εo × E + χ × E = (εo + χ ) × E = ε × E (A.8)
where εo is the vacuum dielectric permittivity and χ is the dielectric susceptibility of the material.
A.5 Piezoelectric Effect—Basic Mathematical Formulation 205
in previous section, if the direction of external field is same as that of poling field,
the strain is positive and material undergoes expansion along the direction of poling
field. This is illustrated in Fig. A.5(c). It is also evident from Fig. A.5(f) that the
expansion of material along poling field (or compression perpendicular to poling
field) generates a voltage having polarity opposite to that of poling field or opposite
to the external applied field. The situation is similar to the one shown in Fig. A.6.
In essence, this means the polarization, and hence the surface charge density, in-
creases when the direction of applied external field is same as that of poling field.
In fact, using Fig. A.5(d) and Fig. A.5(e), it can easily be shown that the surface
charge density increases even if the direction of applied external field is opposite
to that of the poling field. Thus, the strain, of reverse piezoelectric origin, results
in polarization and therefore the surface charge density is increased by an amount
Ppe = e × Spe = e × d × E (Fig. A.6). If the electric field is maintained constant,
the additional polarization due to piezoelectric effect increases the electric displace-
ment of free charges toward the electrodes by the same magnitude i.e. σpe = Ppe .
Therefore, the total electrical displacement is:
D = ε × E + Ppe = ε × E + e × d × E = ε × E (A.9)
So far, the individual effect of piezoelectricity on the elastic and dielectric has been
discussed. In actual practice, piezoelectricity is a cross coupling between the elastic
variables, stress T and strain S, and the dielectric variables, electric charge den-
sity D and electric field E. This coupling in piezoelectric materials is discussed
in this sub-section with help of commonly used linear electro-elastic constitutive
equations.
According to the linear theory of piezoelectricity [10], the tensor relation to iden-
tify the coupling between mechanical stress, mechanical strain, electric field and
electric displacement is given as:
206 A Fundamentals of Piezoelectricity
Sp = spq
E
Tq + dpk Ek (A.10)
Di = diq Tq + εik
T
Ek (A.11)
⎡ ⎤
⎡ ⎤ E
s11 E
s12 E
s13 E
s14 E
s15 E
s16 ⎡ ⎤
S1 ⎢ ⎥ T1
⎥ ⎢ ⎥⎢
E E E E E E
⎢ s21 s22 s23 s24 s25 s26 ⎥
⎢ S2 ⎥ ⎢ ⎥⎢ T2 ⎥
⎢ ⎥ ⎢ E E E E E E ⎥⎢ ⎥
⎥=⎢ ⎥⎢
S3 s31 s32 s33 s34 s35 s36 T3
⎢ ⎥
⎢ ⎥ ⎢ ⎥⎢ ⎥
⎥ ⎢ ⎥⎢
S4 E E E E E E T4
⎢ s41 s42 s43 s44 s45 s46 ⎥
⎣ S5 ⎦ ⎢
⎢ E E E E E E
⎥⎣
⎥ T5 ⎦
S6 ⎣ s51 s52 s53 s54 s55 s56 ⎦ T6
E
s61 E
s62 E
s63 E
s64 E
s65 E
s66
⎡ ⎤
d11 d12 d13
⎢ d21 d22 d23 ⎥⎡ ⎤
⎢ ⎥ E1
⎢ d31 d32 d33 ⎥
+⎢
⎢
⎥ ⎣ E2 ⎦
⎥ (A.12)
⎢ d41 d42 d43 ⎥ E3
⎣ d51 d52 d53 ⎦
d61 d62 d63
A.5 Piezoelectric Effect—Basic Mathematical Formulation 207
⎡ ⎤
T1
⎡ ⎤ ⎡ ⎤⎢ T2 ⎥
D1 d11 d12 d13 d14 d15 d16 ⎢ ⎢
⎥
⎥
T3
⎣ D2 ⎦ = ⎣ d21 d22 d23 d24 d25 d26 ⎦ ⎢
⎢
⎥
⎥
T4
D3 d31 d32 d33 d34 d35 d36 ⎢ ⎣
⎥
⎦
T5
T6
⎡ T T T
⎤⎡ ⎤
ε11 ε12 ε13 E1
⎢ T ⎥⎣ ⎦
+ ⎣ ε21 T
ε22 T
ε23 ⎦ E2 (A.13)
T
ε31 T
ε32 T
ε33 E3
In many cases, processing conditions such as extrusion and the particular crys-
tal symmetry of piezoelectric material determine which components of the dielec-
tric constant, piezoelectric, and elastic compliance tensors are non-zero and unique.
For example, for an unstretched and poled piezoelectric P(VDF-TrFE) copolymer,
having 2 mm macroscopic symmetry, the matrix form of Eqs. (A.3) and (A.4) can
written as:
⎡ ⎤
⎡ ⎤ E
s11 E
s12 E
s13 0 0 0 ⎡ ⎤
S1 ⎢ ⎥ T1
⎥ ⎢ ⎥⎢
E E E
⎢ s21 s22 s23 0 0 0 ⎥
⎢ S2 ⎥ ⎢ ⎥⎢ T2 ⎥
⎢ ⎥ ⎢ E E E ⎥⎢ ⎥
⎥=⎢ ⎥⎢
S3 s31 s32 s33 0 0 0 T3
⎢ ⎥
⎢ ⎥ ⎢ ⎥⎢ ⎥
⎥ ⎢ ⎥⎢
S4 E T4
⎢ 0 0 0 s44 0 0 ⎥
⎣ S5 ⎦ ⎢
⎢ E
⎥⎣
⎥ T5 ⎦
S6 ⎣ 0 0 0 0 s55 0 ⎦ T6
0 0 0 0 0 E
s66
⎡ ⎤
0 0 d31
⎢ 0 0 d32 ⎥⎡ ⎤
⎢ ⎥ E1
⎢ 0 0 d33 ⎥
+⎢
⎢
⎥ ⎣ E2 ⎦
⎥ (A.16)
⎢ 0 d24 0 ⎥ E3
⎣ d15 0 0 ⎦
0 0 0
208 A Fundamentals of Piezoelectricity
Table A.1 Piezoelectric, dielectric, and elastic properties of PVDF [13–15] and P(VDF-TrFE)
copolymer with 75/25 mol% [12]
Coefficient/Parameter PVDF P(VDF-TrFE) 75/25a
Real Imaginary
⎡ ⎤
T1
⎡ ⎤ ⎡ ⎤⎢ T2 ⎥
D1 0 0 0 0 d15 0 ⎢⎢
⎥
⎥
T3
⎣ D2 ⎦ = ⎣ 0 0 0 d24 0 0 ⎦⎢
⎢
⎥
⎥
T4
D3 d31 d32 d33 0 0 0 ⎢⎣
⎥
⎦
T5
T6
⎡ T
⎤⎡
⎤
ε11 0 0 E1
⎢ ⎥
+⎣ 0 T
ε22 0 ⎦ ⎣ E2 ⎦ (A.17)
0 0 T
ε33 E3
The above tensor relations of Eqs. (A.5) and (A.6) are used to obtain the elec-
tromechanical response of a piezoelectric material along the same or other direction
as that of stimulus. An as example, the electromechanical response of P(VDF-TrFE)
copolymer, when it is used in the thickness mode i.e. both stress and electric field
are along the 3-direction, as in Fig. A.7, can be expressed as [11]:
S3 = s33
E
T3 + d33 E3 (A.18)
D3 = d33 T3 + ε33
T
E3 (A.19)
The expression for longitudinal electromechanical coupling factor k33 , under similar
conditions is:
2
d33
2
k33 = T sE
(A.20)
ε33 33
T , and s E are frequently found in the manufacturer’s data.
The constants d33 , ε33 33
In Eqs. (A.7) and (A.8), T3 and E3 are used as independent variables. If, however,
D3 and S3 are the independent variables the above relations can also be written as:
T3 = c33
D
S3 − h33 D3 (A.21)
D3
E3 = −h33 S3 + β33
S
D3 = −h33 S3 + S
(A.22)
ε33
D , h , and ε S are related to d , ε T , and s E by following
The new constants c33 33 33 33 33 33
mathematical relations:
2
d33
S
ε33 = ε33
T
− E
(A.23)
s33
d33
h33 = E T
(A.24)
s33 ε33
1
D
c33 = h233 ε33
T
+ E
(A.25)
s33
E
D
s33 = 1 − k33
2
s33 (A.26)
References
1. W.P. Mason, Electromechanical Transducers and Wave Filters (Van Nostrand, New York,
1942)
210 A Fundamentals of Piezoelectricity
2. W.P. Mason, Physical Acoustics and the Properties of Solids (Van Nostrand, Princeton, 1958)
3. W.G. Cady, Piezoelectricity (McGraw-Hill, New York, 1946)
4. H.S. Nalwa, Ferroelectric Polymers: Chemistry, Physics, and Applications (Marcel Dekker,
Inc., New York, 1995)
5. T. Ikeda, Fundamentals of Piezoelectricity (Oxford University Press, New York, 1996)
6. P. Curie, J. Curie, Dévelopment, par pression, de l’électricité polaire dans les cristaux hémiè-
dres à faces inclinées. C. R. Acad. Sci. 91, 294–295 (1880)
7. G. Lippmann, Principe de conservation de l’électricité. Ann. Chim. Phys. 24(5a), 145–178
(1881)
8. H. Kawai, The piezoelectricity of PVDF. Jpn. J. Appl. Phys. 8, 975–976 (1969)
9. L. Pinna, R.S. Dahiya, M. Valle, G.M. Bo, Analysis of self-powered vibration-based energy
scavenging system, in ISIE 2010: The IEEE International Symposium on Industrial Electron-
ics, Bari, Italy (2010), pp. 1–6
10. ANSI/IEEE, IEEE standard on piezoelectricity. IEEE Standard 176-1987 (1987)
11. R.S. Dahiya, M. Valle, L. Lorenzelli, SPICE model of lossy piezoelectric polymers. IEEE
Trans. Ultrason. Ferroelectr. Freq. Control 56, 387–396 (2009)
12. H. Wang, Q.M. Zhang, L.E. Cross, A.O. Sykes, Piezoelectric, dielectric, and elastic properties
of poly(vinylidene fluoride/trifluoroethylene). J. Appl. Phys. 74, 3394–3398 (1993)
13. E.L. Nix, I.M. Ward, The measurement of the shear piezoelectric coefficients of polyvinyli-
dene fluoride. Ferroelectrics 67, 137–141 (1986)
14. V.V. Varadan, Y.R. Roh, V.K. Varadan, R.H. Tancrell, Measurement of all the elastic and di-
electric constants of poled PVDF films, in Proceedings of 1989 Ultrasonics Symposium, vol. 2
(1989), pp. 727–730
15. H. Schewe, Piezoelectricity of uniaxially oriented polyvinylidene fluoride, in Proceedings of
1982 Ultrasonics Symposium (1982), pp. 519–524
Appendix B
Modeling of Piezoelectric Polymers
B.1 Introduction
Much work has been published on transducers using piezoelectric ceramics, but a
great deal of this work does not apply to the piezoelectric polymers because of their
unique electrical and mechanical properties [1]. A number of attempts to model
the behavior of piezoelectric materials fail to predict the behavior of piezoelectric
polymers because of their lossy and dispersive dielectric properties and higher vis-
coelastic losses. Starting from the Redwood’s transmission line version of Mason’s
equivalent circuit [2], a SPICE implementation of piezoelectric transducer was re-
ported by Morris et al. [3]. Usage of negative capacitance, −C0 (an unphysical elec-
trical circuit element), by Morris et al. was avoided by Leach with the controlled
source technique in an alternative SPICE implementation [4]. The models presented
in both these works were verified for piezoceramics operating in the actuating mode
i.e. with electrical input and mechanical output. The transducer was assumed to
be lossless, and hence, both these implementations are insufficient for evaluating
the performance of transducers with significant losses. Püttmer et al. [5] improved
these piezoceramics models by involving a resistor—with value equal to that at fun-
damental resonance—to represent the acoustic losses in the transmission line, un-
der the assumption that transmission line has low losses. Further, the dielectric and
electromechanical losses in the transducer were assumed negligible. These assump-
tions worked well for piezoceramics, but modeling of lossy polymers like PVDF
requires inclusion of all these losses. Keeping these facts in view, the equivalent
model of piezoelectric polymers—that includes the mechanical, electromechanical
and dielectric losses—was developed [6] and SPICE implementation of the same is
presented in this chapter.
Following sections present the theory of the lossy model of piezoelectric poly-
mers; its SPICE implementation and its evaluation vis-a-vis experimental results.
Using the model presented in this chapter, many design issues associated with the
piezoelectric polymers are also discussed.
B.2 Theory
According to the linear theory of piezoelectricity [7], the tensor relation between
mechanical stress, mechanical strain, electric field and electric displacement is:
Sp = spq
E
Tq + dkp Ek (B.1)
Di = diq Tq + εik
T
Ek (B.2)
S3 = s33
E
T3 + d33 E3 (B.3)
D3 = d33 T3 + ε33
T
E3 (B.4)
T , and s E are frequently found in the manufacturer’s data
The constants d33 , ε33 33
for polarized polymers. The analysis is simpler if the variables S3 , T3 , D3 and E3
are arranged in the alternate way of writing the piezoelectric relation using D3 and
S3 as independent variables. Thus the equations representing plane compression
wave propagation in the x direction (3-direction or the direction of polarization) in
a piezoelectric medium are:
B.2 Theory 213
T3 = c33
D
S3 − h33 D3 (B.5)
D3
E3 = −h33 S3 + β33
S
D3 = −h33 S3 + S
(B.6)
ε33
2
d33
S
ε33 = ε33
T
− E
(B.7)
s33
d33
h33 = E εT
(B.8)
s33 33
1
D
c33 = h233 ε33
T
+ E
(B.9)
s33
Based on the choice of independent variables, there can be two other variants of
the (B.5) and (B.6) which are not given here. Inside polymer, the mechanical strain,
mechanical stress and the electrical displacement can be written as:
∂ξ
S3 = (B.10)
∂x
∂T3 ∂ 2ξ
=ρ 2 (B.11)
∂x ∂t
Div(D) = 0 (B.12)
where ξ is the displacement of the particles inside polymer, ρ is the density of the
polymer. Equation (B.11) is basically Newton’s law and (B.12) is Gauss’s law. Using
(B.5) and (B.10)–(B.12), the mechanical behavior of the particles inside polymer
can be described as a wave motion which is given by:
∂ 2ξ ∂ 2ξ
2
= ν2 2 (B.13)
∂t ∂x
214 B Modeling of Piezoelectric Polymers
where, ν = c33 D /ρ is the sound velocity in the polymer and should not be confused
B.2.2 Losses
where, the subscripts r and i stand for real and imaginary terms and tan δm , tan δe ,
tan δk are the elastic, dielectric and electromechanical coupling factor loss tangent,
∗ ∗
respectively. The complex piezoelectric constants viz: d33 and h33 , can be obtained
∗
from electromechanical coupling constant kt [7].
The dispersive dielectric properties and the internal viscoelastic losses in piezoelec-
tric polymers preclude the convenient use of the classical IEEE standard techniques
[7] for determining dielectric and piezoelectric properties. This is due to the fact
that the figure of merit, M for piezoelectric polymers is approximately 2–2.5 [1].
As mentioned in the IEEE standard, the parallel frequency, fp , cannot be measured
accurately when M < 5. Therefore, one should not apply the IEEE Standard’s equa-
tions for k33 or kt assuming that fp and fs are the frequencies of maximum and
minimum impedance magnitude, respectively.
A technique for characterizing and modeling PVDF was first proposed by Ohi-
gashi [8]. His approach is based on curve fitting the equation for input admittance
B.3 Measurement of Complex Constants 217
Table B.1 Dimensions, densities of the different samples and the electrodes used
Quantity Symbol PVDF-TrFE PVDF-TrFE* PVDF* Lead Metaniobate*
* From [9]
* From [9]
Fig. B.3 Schematic of the equivalent model of piezoelectric polymer implemented with PSpice.
The model has been divided into various blocks showing the mechanical/acoustic/viscoelastic,
electromechanical/piezoelectric and electric/dielectric losses
Following the discussion above, the piezoelectric polymer model has been im-
plemented in PSPICE circuit simulator, which is commercially available from
ORCAD. Figure B.3 shows the SPICE schematic of the equivalent circuit of
Fig. B.2. The mechanical, electromechanical and electrical loss blocks are clearly
marked in Fig. B.3. The SPICE implementation of various blocks is explained be-
low. The netlist for SPICE implementation is given at the end of this Appendix.
B.4 SPICE Implementation 219
* From [9]
B Modeling of Piezoelectric Polymers
B.5 Experiment Versus Simulation 221
This block consists of the lossy capacitance of polymer connected to the external
∗
voltage source or load. The use of complex permittivity i.e. ε , ensures the inclusion
∗
of dielectric losses. The lossy capacitor obtained by using ε , is equivalent to a
lossless capacitor, C0 = εAx / lx connected in parallel with the frequency dependent
resistor R0 = 1/(ωC0 tan δe ) as shown in Fig. B.4, where, C0 is the static lossless
capacitance of polymer. The voltage across the equivalent lossy capacitor is given
as:
Ic
Vc = (B.28)
sC0 + ωC0 tan δe
The SPICE circuit simulators allow only constant values of resistors and ca-
pacitors. To implement the lossy capacitor—which has the frequency dependent
resistor—the behavior modeling of controlled voltage source is used here. The con-
trolled source E3(lossy capacitor) is implemented with the ‘ELAPLACE’ function
of PSPICE. As per (B.28), the voltage across E3(lossy capacitor), is proportional to
the current flowing through itself and measured by the zero value DC source V3, as
shown in Fig. B.3.
The expressions of the gain terms used in the controlled source E3(lossy ca-
pacitor), are given in Table B.3. Again, ω is implemented with the expression
SQRT (−s × s). The netlist for the SPICE implementation shown in Fig. B.3—
generated with PSPICE—is given at the end of Appendix B.
The SPICE model presented in earlier section has been evaluated by comparing the
simulated impedance and phase plots with the corresponding plots obtained from
the measured data of PVDF, P(VDF-TrFE) and lead metaniobate. As mentioned
earlier, the approximate lossy models developed for piezoceramic transducers are
insufficient for evaluating the behavior of piezoelectric polymers. Keeping this in
view, a comparison has also been made with the impedance and phase plots obtained
by Püttmer’s approach for lossy piezoceramics [5]. Using the PSPICE schematic of
Fig. B.3, the simulated impedance, Zin , for all the samples is obtained by dividing
B.5 Experiment Versus Simulation 223
Fig. B.6 (top-left) Force generated by piezoelectric material (actuating component) in the
pulse-echo arrangement, reproduced from [15]; (top-right) Voltage output of piezoelectric material
(sensing component) in the pulse-echo arrangement, reproduced from [15]; (bottom-left) Simulated
force obtained from SPICE model of piezoelectric material (actuating component) (bottom-right)
Simulated voltage obtained from SPICE model of piezoelectric material (sensing component)
the voltage at node E (Fig. B.3) with the current passing through this node. For
these simulations, the transmission line was terminated into the acoustic impedance
of air on both sides and the effect of electrodes present on both sides of polymer
was assumed to be negligible due to their negligible small thickness in comparison
to that of test samples.
In the case of 50 µm thick P(VDF-TrFE) polymer film, the impedance and phase
measurements were obtained with HP4285 LCR meter. The measured impedance
and phase plots for other samples, viz: PVDF, P(VDF-TrFE) (0.408 mm thick) and
lead metaniobate, used here, are same as those used in [9]. The physical dimensions,
calculated complex constants and various parameters of SPICE model for all these
samples are given in Tables B.1–B.2.
The impedance and phase plots of lead metaniobate sample, obtained by the
SPICE model presented in this work has been compared in Fig. B.7 with those
obtained by Püttmer’s approach [5] and measured data. The lead metaniobate sam-
224 B Modeling of Piezoelectric Polymers
Fig. B.7 Comparison of Impedance (left) and Phase (right) plots of lead metaniobate sample, with
the corresponding plots obtained by the Püttmer’s approach and from the measured impedance data
of [9]
ple is chosen here because the model in [5], was evaluated for lead metaniobate.
The netlist of the SPICE model using Püttmer’s approach is given in Appendix B.
Püttmer’s approach considers the losses in the transmission line only and dielec-
tric and piezoelectric losses are assumed to be negligible. Other difference between
Püttmer’s approach and the work presented here is the use of Rt and Gt respectively,
to represent the losses in the transmission line. In Püttmer’s approach, Lt is given by
ρ × Ax ; Ct is given by 1/(cr × Ax ) and a simplified expression of Rt was obtained
by assuming the transmission line to be having low loss. The value of Rt was given
by (Lt /Q) × SQRT (−s × s), where Q is the mechanical quality factor obtained
by dividing real part of elastic constant with its imaginary part. It can be observed
from Fig. B.7, that the impedance and phase plots of piezoceramics—obtained with
the SPICE model presented in this work—are in good agreement with the measured
plots and the plots obtained Püttmer’s approach presented in [5]. The agreement be-
tween these plots is in line with the observations on the equivalence of using Rt or
Gt to represent losses in the acoustic transmission [10].
The impedance and phase plots of two different P(VDF-TrFE) samples, obtained
by the SPICE model presented in this work has been compared in Fig. B.8 and
Fig. B.9 with those obtained by Püttmer’s approach [5] and from the measured data.
The plots in Fig. B.8 correspond to the thin 50 µm film and those in Fig. B.9 corre-
spond to that of 0.408 mm thick film.
An additional plot obtained by considering the transmission losses only, in the
SPICE model presented in this work, is also shown in Fig. B.8. It can be observed
that the plots obtained with the approach presented here are in good agreement with
the measured data. The difference between the approach presented here and that of
Püttmer’s approach is more evident in case of thinner polymer film (Fig. B.8) and
more so in case of phase plots of both samples. Thus, in case of polymers, Püttmer’s
approach leads to a significant deviation from the measured plots.
The comparison of the impedance and phase plots for PVDF is given in Fig. B.10.
In case of PVDF, it can be observed that—although an improvement over past
B.5 Experiment Versus Simulation 225
Fig. B.8 Comparison of Impedance (left) and Phase (right) plots of 50 µm thick PVDF-TrFE
polymer film with the corresponding plots obtained by the Püttmer’s approach and from the mea-
sured impedance data. The plots obtained by taking the transmission loss only in the SPICE model
presented here, has also been shown. In principle, taking only transmission loss only in the model
presented here is same as that of Püttmer’s work
Fig. B.9 Comparison of Impedance (left) and Phase (right) plots of 0.408 mm thick PVDF-TrFE
film with the corresponding plots obtained by the Püttmer’s approach and from the measured
impedance data of [9]
approach—the plots obtained with the approach presented in this work still have
some discrepancies with the plots obtained from the measured data. The discrep-
ancies are especially higher in the region outside resonance. This can be attributed
to the frequency dependence of material parameters [9], which were assumed to be
independent of frequency for these simulations. For a piezoelectric transducer the
226 B Modeling of Piezoelectric Polymers
Fig. B.10 Comparison of Impedance (left) and Phase (right) plots PVDF film with the corre-
sponding plots obtained by the Püttmer’s approach and from the measured impedance data of [9].
S
The plots obtained by using first order frequency dependence of ε33 and tan δe are also shown
where, f is the frequency. It can be noticed from (B.29) that outside resonance the
impedance depends on ε33 S ∗ and hence on the ε S and tan δ and hence as a first ap-
33 e
proximation, taking into account the frequency dependence of ε33 S and tan δ should
e
improve the simulation results. Following Kwok’s approach, presented in [9], we
S and tan δ at various frequencies of the measured impedance
obtained values of ε33 e
data. It was observed that these constants vary with frequency. Considering the data
S and tan δ at frequencies outside resonance, a first order frequency de-
values of ε33 e
pendence of ε33S and tan δ was obtained by linear fit of the ε S and tan δ versus
e 33 e
frequency plots. Using these frequency dependent constants in the SPICE model,
the impedance and phase plots were obtained. As shown in Fig. B.10, this improves
the match between the simulated plots and plots from the measured data. The match-
ing can be further improved—albeit, at the cost of computation power—by using a
higher order frequency dependence of ε33 S and tan δ and also the frequency depen-
e
∗
dence of other material constants viz: c33 and kt∗ .
D
Fig. B.11 Impedance (left) and Phase (right) plots comparing the relative contribution of various
losses. Simulations were performed under assumption of different combinations of losses
and phase plots so obtained are shown in Fig. B.11. It can be noticed that inclusion
of only acoustic/transmission losses gives a first approximation of the impedance
and phase, which is further improved by the dielectric and piezoelectric losses.
VF_F1 1 2 0V
.ends SCHEMATIC1_F1
B.9 Summary
The SPICE model for piezoelectric polymers presented in this chapter, for the first
time, incorporates all losses namely: viscoelastic, piezoelectric and dielectric. It has
been shown that, the model provides a good match between simulated and measured
data and that the past approaches, developed mainly for piezoceramics, are not suit-
able for piezoelectric polymers. By comparing the contribution of various losses
in the model, the viscoelastic losses have been found to have a major role. Per-
haps, this is one reason why past approaches tried to model the viscoelastic losses
only. The discussion on design issues associated with piezoelectric polymers, when
they are used as transducer, provide good insight into their behavior under various
conditions. Around low frequencies (∼1 kHz), such a model can be approximated
with a capacitor in series with a voltage source, as discussed in following chapters.
Thus, the model presented in this chapter can be used to evaluate the performance
of POSFET based tactile sensing devices, discussed in Chaps. 7 and 8, over a wide
range of frequencies and can be used to explore the utility of such devices to ap-
plications other than tactile sensing as well. The successful implementation of the
transducer model in SPICE, has made it convenient to evaluate the performance of
transducer, both, in time and frequency domains. This implementation will greatly
help in designing and evaluating the sensor system i.e., transducer and conditioning
electronics, all together.
References
1. L.F. Brown, Design consideration for piezoelectric polymer ultrasound transducers. IEEE
Trans. Ultrason. Ferroelectr. Freq. Control 47, 1377–1396 (2000)
2. M. Redwood, Transient performance of piezoelectric transducers. J. Acoust. Soc. Am. 33,
527–536 (1961)
3. S.A. Morris, C.G. Hutchens, Implementation of Mason’s model on circuit analysis programs.
IEEE Trans. Ultrason. Ferroelectr. Freq. Control 33, 295–298 (1986)
4. W.M. Leach, Controlled-source analogous circuits and SPICE models for piezoelectric trans-
ducers. IEEE Trans. Ultrason. Ferroelectr. Freq. Control 41, 60–66 (1994)
5. A. Püttmer, P. Hauptmann, R. Lucklum, O. Krause, B. Henning, SPICE models for lossy
piezoceramics transducers. IEEE Trans. Ultrason. Ferroelectr. Freq. Control 44, 60–66 (1997)
6. R.S. Dahiya, M. Valle, L. Lorenzelli, SPICE model of lossy piezoelectric polymers. IEEE
Trans. Ultrason. Ferroelectr. Freq. Control 56(2), 387–396 (2009)
7. ANSI/IEEE, IEEE standard on piezoelectricity. IEEE Standard 176-1987 (1987)
8. H. Ohigashi, Electromechanical properties of polarized polyvinylidene fluoride films as stud-
ied by the piezoelectric resonance method. J. Appl. Phys. 47, 949–955 (1976)
9. K.W. Kwok, H.L.W. Chan, C.L. Choy, Evaluation of the material parameters of piezoelectric
materials by various methods. IEEE Trans. Ultrason. Ferroelectr. Freq. Control 44, 733–742
(1997)
References 231
10. J. Wu, G. Du, Analogy between the one-dimensional acoustic waveguide and the electrical
transmission line for cases with loss. J. Acoust. Soc. Am. 100, 3973–3975 (1996)
11. A.M. Vinogradov, V.H. Schmidt, G.F. Tuthill, G.W. Bohannan, Damping and electromechani-
cal energy losses in the piezoelectric polymer PVDF. Mech. Mater. 36, 1007–1016 (2004)
12. J.G. Smits, Iterative method for accurate determination of the real and imaginary parts of the
materials coefficients of piezoelectric ceramics. IEEE Trans. Sonics Ultrason. SU-23, 393–402
(1976)
13. S. Sherrit, H.D. Wiederick, B.K. Mukherjee, Non-iterative evaluation of the real and imaginary
material constants of piezoelectric resonators. Ferroelectrics 134, 111–119 (1992)
14. TASI Technical Software Inc. Ontario, Canada (2007). Available at: http://www.
tasitechnical.com/
15. G. Hayward, M.N. Jackson, Discrete-time modeling of the thickness mode piezoelectric trans-
ducer. IEEE Trans. Sonics Ultrason. SU-31(3), 137–166 (1984)
16. R.S. Dahiya, M. Valle, G. Metta, L. Lorenzelli, S. Pedrotti, Deposition processing and charac-
terization of PVDF-TrFE thin films for sensing applications, in IEEE Sensors: The 7th Inter-
national Conference on Sensors, Lecce, Italy (2008), pp. 490–493
Appendix C
Design of Charge/Voltage Amplifiers
Abstract The designs of three stage charge and voltage amplifiers, to read the
taxels on piezoelectric polymer—MEA based tactile sensing chip, are presented
here. Piezoelectric polymers is approximately represented as a voltage source in
series with the static capacitance of the polymer. Due to the presence of capaci-
tance, piezoelectric polymers have very high output impedance. Thus, to measure
the charge/voltage generated due to applied forces, an amplifier with very high input
impedance (e.g. CMOS input based) is required.
shown in Fig. C.2. It also comprises of three stages. Except first stage, remaining
two stages are same as that of the charge amplifier. Since the source capacitance in
the present case is ∼1 pF, the low frequency response can be brought down to ∼5 Hz
by keeping the circuit loading effect as minimum as possible. This was obtained by
providing a resistive load of 1 G in the first stage. This value appears 3–5 times
higher to the polymer, due to the bootstrapping technique adopted by using positive
feedback. Use of resistors with resistances more than 1 G is not recommended
as higher values are prone to noise due to humidity, dust, temperature variation etc.
With the adoption of this technique the voltage amplifier has a gain of 46 dB in the
frequency range of 8 Hz–200 kHz.
Index
A Anisotropic, 200
Absolute capacitance, 86 Annealing, 163, 164, 228
Acceleration, 126 Anthropomorphic, 83, 98
Accelerometer, 196 Anti-aliasing, 63
Access time, 58–60, 62 Anticipatory control, 30, 31
Accuracy, 24 Application specific integrated circuit (ASIC),
Acoustic impedance, 96, 156, 219, 223, 227, 71
228 Artificial brain map, 69
Acoustic loss, 212 Artificial intelligence (AI), 70
Acoustic transmission, 219 Artificial limbs, 3, 10
Acoustic wave propagation, 219 Aspect ratio, 159, 188, 190
Acquisition time, 64, 190 Assistive robots, 80
Action for perception, 6, 15 Attention, 26
Action potential, 22, 26, 64 Audio, 25, 31, 71
Active device, 62 Autonomous learning, 80
Active perception, 19 Autonomous robot, 61
Active pixel, 59, 60
Active pixel sensor (APS), 59
B
Active taxel, 59, 60, 66
Band gap, 110
Active touch, 14, 29
Active transducer, 62 Band pass filter, 63
Actuator, 72, 96 Bandwidth, 52, 58–60, 64, 67, 68, 97, 117, 155
Acuity, 20, 24 Barrier width, 111
Adaptation rate, 22 Bayes tree, 69
Addressing, 58, 63, 64 Behavioral modeling, 219
Addressing scheme, 54 Bendable, 47
Algorithm, 49, 65, 67–70, 73 Bendable POSFET, 191
Algorithms, 11 Bendable tactile sensing chip, 191
Amorphous silicon, 118 Biasing, 61, 62, 190
Amplification, 65, 113 Bio-robots, 80
Amplifier, 35, 60, 63, 117, 171, 233 Biomedical, 9
Amplitude modulation, 86 Biomedical robotics, 9
Analog filter, 54 Biometric, 50
Analog resistive sensing technology, 82 Bit rate (BR), 64
Analog resistive touch sensing, 81–83 Body schema, 30, 31
Analog sensors frontend, 118 Bootstrapping, 234
Analog to digital (A/D), 26, 60–64, 66, 71, 124 Bottom–up method, 192
C Computing power, 74
Calibration, 65 Conductance, 215
CAN, 67, 68, 71, 105 Conductive elastomer, 83
Cantilever, 112 Conductive epoxy, 114
Capacitance, 86, 104, 147, 211, 215 Conductive fiber, 83, 103, 108
Capacitance to digital converter, 89 Conductive filler, 102
Capacitance-to-digital converter, 125 Conductive fluid, 109
Capacitive, 16, 54, 57, 58, 60, 62, 63, 81, Conductive gel, 83, 101
85–87, 89, 99, 112 Conductive graphite, 105
Capacitor, 85, 198 Conductive polymer, 83, 84
Carbon black, 102, 106, 129 Conductive polymer composite (CPC), 107
Carbon black nanoparticle filler, 103 Conductive polymer composites (CPC), 102,
Carbon fiber, 102 103
Carbon microcoil filler, 103 Conductive polymer nanoparticle filler, 103
Carbon microcoils (CMCs), 104 Conductive rubber, 83
Carbon nano tube (CNT), 51, 129 Conductive yarn, 83, 103
Carbon nanotube (CNT), 103 Conformability, 79, 101
Carbon nanotubes (CNT), 106, 107 Conformable, 25, 29, 35, 36, 47, 48, 53, 92,
Carrier frequency, 64 123
CCD, 91, 111 Contact force, 57, 81
Cellular rubber, 105 Contact location, 82
Central nervous system (CNS), 13, 15, 26, 27, Contact point estimation, 46
36 Contact pressure, 81
Cerebral cortex, 26 Control, 36, 44, 46
Channel current, 120, 122 Control bandwidth, 58, 60
Channel length, 160, 162, 190 Control loop, 34, 60
Channel width, 160, 162, 190 Controlled source, 211, 219, 221
Charge amplifier, 146, 147, 233, 234 Controller, 65, 67, 74
Charge carrier mobility, 122, 162 Corona poling, 166
Charge coupled device (CCD), 54, 73 Cortical neurons, 27
Charge neutrality, 154 Coupling factor, 214
Charge sensitivity, 233 Creep, 90, 105, 107, 124, 125
Chip-on-flex, 191 Cross talk, 107
Chirping, 93 Cross-talk, 24, 60, 143, 148, 182–184
Classification, 15, 151 Curie temperature, 166, 198
CMOS, 8, 91, 161, 188, 190, 191 Current mirror, 190
Coercive field, 157 Current sink, 188
Cognition, 25, 63, 69 Curve fitting, 216
Common-source, 158, 171, 173, 189, 193 Cut-off frequency, 149
Communication, 66, 187 Cutaneous, 5, 13–16, 19–21, 23, 24, 27,
Communication bandwidth, 64 29–31, 53
Communication bus, 66–68, 71, 124 Cutaneous perception, 14
Communication interface, 73, 126 Cutaneous system, 13
Communication port, 125
Compass method, 24 D
Compensation, 65 Data acquisition, 59, 61, 63, 64
Complementary metal oxide semiconductor Data processing, 11, 64
(CMOS), 59, 60, 66, 233 Data rejection, 68
Compliance, 5, 6, 8, 16, 29, 35, 49 Data representation, 69
Compliance coefficient, 203 Data selection, 68
Composite, 104–106 Data transfer, 34, 58
Computational intelligence, 69, 151 Data transmission, 53, 66, 68
Computer aided design (CAD), 48, 74 Data wire, 54
Computer aided engineering (CAE), 74 Decimation filter, 64
Index 237
Micro-/nano-structures, 35 Nociceptors, 20
Micro-/nanowires, 35 Nocioceptor, 43
Micro-lever action, 29, 32 Non invasive, 84
Microbending, 93 Non linear regression, 217
Microcontroller, 64, 67, 68, 71, 73, 105, 124, Non-polar dielectrics, 198
126 Non-volatile memory, 196
Microelectrode array (MEA), 233 Nonferromagnetic, 99
Microelectrode (MEA), 139, 141, 143–148, Nonlinear regression, 215
151 Normal force, 86
Microelectromechanical system (MEMS), 66, Normal strain, 112
85, 88, 89, 112–116 Normal stress, 112, 113
Microelectronics, 54, 114 Nyquist rate, 59, 60, 64
Microfluidics, 51
Micromachining, 97, 112, 114–116 O
Microphone, 196 Object identification, 151
Microprocessor, 55, 65 Object recognition, 15, 19, 29, 49, 69, 79, 182
Microstructure, 196 Off-the-shelf, 123
Microstructures, 24 On-chip electronics, 158, 188, 189, 193
Miniaturization, 33, 47, 72, 139, 140, 188 On-chip read-out, 190
Minimal invasive surgery, 6, 9 On-chip signal conditioning, 188
Minimally invasive surgery, 97 Operation amplifier, 233
Mobile robots, 45 Optical, 16, 81, 90, 99, 110, 123
Model, 219, 221, 227, 230 Optical arrays, 191
Modeling, 15, 169, 211 Optical fiber, 90, 91, 93
Modular, 36, 72, 73 Optical imager, 66
Modularity, 72 Optical tactile sensor, 93
Modulating frequency, 64 Optical waveguide, 91
Module, 48, 49, 53, 65, 72, 73 Optimization, 52
Molecular model, 198 Organic field effect transistor (OFET), 58, 59,
MOS, 117, 119 120
MOSFET, 117, 140, 141, 153, 155 Organic semiconductor, 140
Motion planning, 69, 126 Organic transistor, 116
Motion strategies, 4 Orientation grating method, 24
Motor control, 14, 19, 30 Orientation polarization, 196
Moving average, 64 Oscillator, 64, 195
Multi-walled carbon nanotube (MWNT), 106 Output buffer, 188, 190
Multifunctional, 33 Oversampling, 59, 60, 64
Multimodal, 57, 70, 115, 126
Multiplexer, 63, 105 P
Multiplexing, 55, 65 Pacinian corpuscles, 20–22, 29, 32
Multiplexor, 190 Packaging, 113, 129, 148, 193
Mutual capacitance, 86–88 Pain, 5, 20
Palpation, 9
N Papillary ridge, 29, 32, 35
Nanocomposite, 106, 107 Paraelectric, 198
Nanoparticle, 92, 111 Parallel processing, 15
Nanoparticles, 110 Parasitic capacitance, 86
Nervous system, 65 Particle filter technique, 68
Network, 67 Passivation, 143
Networking, 74 Passive device, 62
Neural network, 69, 70 Passive perception, 19
Neural pathways, 26 Passive pixel, 59
Neuromorphic, 66 Passive touch, 14, 29
Newtonian fluid, 98 Passive transducer, 62
Index 241
PDMS, 49, 51, 88, 89, 107, 116, 121, 171, Polarization, 98, 101, 122, 154, 155, 168, 179,
172, 174, 182 180, 193, 195–200, 202–206, 208
PECVD, 143, 163 Polarization effect, 200
Peg-in-hole, 8 Polarization level, 167
Pentacene, 120 Polarization phenomenon, 198
Perception, 14, 15, 20, 24, 25, 27–29, 31, 32, Polarization vector, 203
70 Poling, 101, 153, 161, 163, 165, 166, 201, 204,
Perception for action, 6, 15 228
Percolation theory, 102 Poly(allylamine hydrochloride) (PAH), 110
Percolation threshold, 102, 103, 106, 107 Polyaniline (PANI), 103
Percolation transition, 105 Polyelectrolyte gels, 109
Peripheral nervous system, 14 Poly(ethylene naphthalate) (PEN), 120
Permeability, 94 Polymer gels, 108
Permittivity, 86, 161 Polymer matrix, 102, 105
Personal digital assistants (PDA), 82 Poly(methyl methacrylate) (PMMA), 105
pH, 109, 116 Polypyrrole (PPy), 103
Phase, 58 Polysilicon, 84, 112, 116
Phase plot, 148, 149, 172 Polystyrene (PS), 105
Photo-semiconductor device, 140 Poly(styrene sulfonate) (PSS), 110
Photodetector, 90 Poly[styrene-b-(ethylene-cobutylene)-b-
styrene] (SEBS),
Photodiode, 91, 109
106
Photolithography, 165
Polythiophene (PTh), 103
Photoluminescence, 110
Polyurethane (PU), 107
Photoreceptor, 66
Portability, 72
Photoreflector, 92
Portable, 36
Piecewise linear mapping, 70
Pose, 52
Piezo-ignition, 196 POSFET, 64, 66, 98, 116, 119, 151, 153–174,
Piezoceramic, 211, 212, 222, 224, 230 177–185, 187–193, 196, 230
Piezoelectric, 16, 54, 57, 58, 64, 96, 101, 109, POSFET array, 189, 190
120, 155, 157, 195, 196, 198–205, POSFET tactile sensing chip, 177
207–209 POSPET, 155
Piezoelectric constant, 97, 101, 120, 142, 149, Potentiometer, 81
154, 157, 161, 165, 206, 212, 215, 217, Power consumption, 60, 62, 71, 74, 97
219, 228 Power management, 71
Piezoelectric effect, 101, 165, 195, 196, 198, Power supply, 71, 72
201–204 Pre-processing, 15, 26, 65
Piezoelectric loss, 219, 224, 227, 230 Precise manipulation, 44, 177
Piezoelectric phenomenon, 195, 203 Precision, 9
Piezoelectric polarization, 204 Precision grip, 31
Piezoelectric polymer, 60, 116, 118, 119, 139, Prehensile, 30
141–143, 147, 151, 153–155, 159–161, Pressure, 20, 44
163, 164, 167, 179, 193, 211, 212, 214, Pressure conductive rubber, 58–60, 84, 120,
216, 221, 222, 227, 228, 230, 233 121
Piezoelectric resonator, 217 Pressure sensitive elastomer, 106
Piezoelectric strain coefficient, 203 Pressure sensitive ink, 83, 101
Piezoelectric stress constant, 203 Pressure sensitive rubber, 122
Piezoelectricity, 195, 196, 198, 203, 205, 209 Pressure sensor, 125, 140, 172
Piezoresistance, 81, 83 Pressure sensor array, 106
Piezoresistive, 54, 83, 89, 102, 105, 108, 112, Pressure threshold, 25, 51, 178
113, 120, 124, 155 Primary afferent fibers, 27
Piezoresistive effect, 120, 172 Printed circuit board (PCB), 48, 94, 105, 112,
Pixel, 66 123, 126, 146
Polar dielectrics, 197 Printing electronics, 191
242 Index
Sensitivity, 20, 24, 25, 28, 29, 32, 34, 51, 60, Software, 73
86, 88, 92, 94, 97, 100, 102, 104–107, Solid state optical sensor, 91
110, 116, 119, 120, 122, 124, 145, 178, Somatosensory cortex, 15
187, 189, 193 Somatosensory system, 27, 43, 69
Sensor, 72 Somatotopic alphabet, 69
Sensor distribution, 51 Somatotopic map, 26, 27, 35, 69, 70
Sensor fusion, 19, 67–70, 129 Sonar, 196
Sensor hardware, 47 Source, 108
Sensor integration, 139, 140 Source-follower, 160, 171, 173, 180, 189, 193
Sensor placement, 47, 51, 52 Spatial acuity, 21, 24, 177, 178
Serial access, 60 Spatial filtering, 49
Serial bus, 68 Spatial resolution, 16, 24, 32–34, 50, 51, 60,
Service robot, 70 92, 105, 111, 112, 116–118, 124, 125,
Shannon’s theorem, 58 129, 143, 148, 155, 159, 177, 178, 182,
Shape, 5, 6, 27–31, 34, 44, 69 184, 190, 193
Shear, 97 Spatio-temporal, 28, 51, 73, 151, 178
Shear force, 46, 91 SPICE, 211, 212, 218, 219, 221–224, 226,
Shear strain, 112 228–230
Shear stress, 112, 113 Spike, 26
Sigma–Delta modulation, 86 Spin-coating, 164
Signal conditioning, 55, 58, 61–66, 115, 126, Spinal cord, 26
188 Spinothalamic pathway, 26
Signal processing, 115, 116, 139, 159 Spontaneous polarization, 165, 198
Signal-to-noise ratio (SNR), 59, 97 Stability, 117
Signal-to-noise (S/N) ratio, 116 Step function, 227, 228
Silicon micromachining, 112, 113 Stiffness, 6, 9, 16, 32, 46, 95, 100, 112, 155,
Silicon on insulator (SOI), 191 203
Silicon technology, 88 Strain, 57, 203
Silicone matrix, 103, 104 Strain gauge, 98, 115, 116
Simulation, 169, 221 Strain sensor, 104
Simultaneous localization and mapping Stress, 57, 119, 203
(SLAM), 70 Stress rate, 57
Size, 69 Stress/strain, 107
Size perception, 31 Stretchability, 50, 129
Skin, 20, 25, 27–30, 32, 34, 35, 54, 55, 65, 68, Stretchable, 36, 47, 84
89, 101, 109, 115, 116, 120, 123, 124 Stretchable skin, 51
Skin area, 55 Substrate capacitance, 158
Skin elasticity, 34 Super resolution algorithm, 51
Skin mechanics, 29, 32, 35 Surface charge density, 205
Skin stiffness, 32 Surface parametrization, 70
Skin surface area, 32, 35 Synapse, 36
Skin thickness, 32, 35, 55, 192 Synthetic polymer, 156
Skin weight, 32, 35, 47, 55, 192 System architecture, 63
Slip, 29, 30, 46, 65, 95 System in package (SIP), 66, 193
Slow adapting (SA), 22, 25, 28, 29 System on chip (SOC), 66, 177, 188, 191, 193
Small signal equivalent, 158
Smart fabrics, 66 T
Smart material, 96, 139, 141, 155, 173 Tactile, 33, 70
Smart textile, 108 Tactile actuator, 99
Smart vision, 66 Tactile acuity, 24, 159
Social robots, 80 Tactile classification, 14
Soft touch, 126 Tactile fabric, 47
Soft-touch, 45, 46 Tactile image, 7, 51
Softness, 6, 29, 70, 96, 109, 110 Tactile imaging, 85
244 Index