Location via proxy:   [ UP ]  
[Report a bug]   [Manage cookies]                
Scribd Logo
Upload

Welcome to Scribd!

  • 22 views

    EEE2044S 2022 Lecture 12 - Transformer Tests I

    Uploaded by

    Junaid Pieters
    Two tests are performed on transformers: open circuit and short circuit tests. The open circuit test measures no-load characteristics by applying a voltage to the low voltage side with the high voltage side open. The short circuit test applies a voltage to the high voltage side to achieve rated current with the low voltage side shorted. Test measurements and equivalent circuits are analyzed to determine transformer parameters such as impedances and resistances.

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd

    EEE2044S 2022 Lecture 12 - Transformer Tests I

    Uploaded by

    Junaid Pieters
    22 views17 pages
    Two tests are performed on transformers: open circuit and short circuit tests. The open circuit test measures no-load characteristics by applying a voltage to the low voltage side with the high voltage side open. The short circuit test applies a voltage to the high voltage side to achieve rated current with the low voltage side shorted. Test measurements and equivalent circuits are analyzed to determine transformer parameters such as impedances and resistances.

    Original Description:

    Lecture Notes - Transformers

    Copyright

    © © All Rights Reserved

    Available Formats

    PDF, TXT or read online from Scribd

    Did you find this document useful?

    Is this content inappropriate?

    Two tests are performed on transformers: open circuit and short circuit tests. The open circuit test measures no-load characteristics by applying a voltage to the low voltage side with the high voltage side open. The short circuit test applies a voltage to the high voltage side to achieve rated current with the low voltage side shorted. Test measurements and equivalent circuits are analyzed to determine transformer parameters such as impedances and resistances.

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    22 views17 pages

    EEE2044S 2022 Lecture 12 - Transformer Tests I

    Uploaded by

    Junaid Pieters
    Two tests are performed on transformers: open circuit and short circuit tests. The open circuit test measures no-load characteristics by applying a voltage to the low voltage side with the high voltage side open. The short circuit test applies a voltage to the high voltage side to achieve rated current with the low voltage side shorted. Test measurements and equivalent circuits are analyzed to determine transformer parameters such as impedances and resistances.

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    of 17

    4

    Two Tests are performed


    ➢Open circuit test
    ➢Short circuit test

    I1 R1 Xl1 I2 Xl2 R2

    Iᶲ1 N1 N2
    Ic1 Im V2 Z2
    V1 E1 E2
    Rc1 Xm
    5

     Primary = input winding = 1


    N1 N2
     Secondary = output winding = 2
     Step-down Transformer: V1 V2

    Primary = HV, Secondary = LV


    𝑉1 > 𝑉2 ⇒ a > 1 ⇒ 𝐼1 < 𝐼2 ;
    𝑉𝐻𝑉 > 𝑉𝐿𝑉 ⇒ 𝐼𝐻𝑉 < 𝐼𝐿𝑉
     Step-up Transformer:
    V1 E N1
    Primary = LV, Secondary = HV
    = 1 = =a
    V2 E2 N2
    I1 1
    =
    𝑉1 < 𝑉2 ⇒ 𝑎 < 1 ⇒ 𝐼1 > 𝐼2 ; I2 a
    Z1
    𝑉𝐿𝑉 < 𝑉𝐻𝑉 ⇒ 𝐼𝐿𝑉 > 𝐼𝐻𝑉 Z2
    = a2
    6

     One winding left open circuited.


     LV source readily available
     Safer to measure rated voltage on LV-side of
    transformer: 𝑽𝑳𝑽 < 𝑽𝑯𝑽
     Only no-load current flows on LV-side, so current
    measurement on LV-side safe, even though: 𝑰𝑳𝑽 >
    𝑰𝑯𝑽
     Thus, open circuit test measurements performed
    on LV-side
     HV-side left open circuited
    7

     Source at rated voltage & frequency applied to LV-


    side with HV-side left open circuited
     Measure voltage, current, power on LV-side
    8

     Consider approximate equiv cct ref Primary


     Open cct test => Step-up mode, 𝑎 < 1:
    Primary = LV, Secondary = HV:
    (𝑉1 = 𝑉𝐿𝑉 ) < (𝑉2 = 𝑉𝐻𝑉 )

    I1 R1 Xl1 X'l2=a2Xl2 R'2=a2R2

    Iᶲ1 = Rated
    Ic1 I'2 = I2 / a = 0
    Im
    V'2=E'2
    V1 = Rated Rc1 Xm

    Primary = LV-side = 1 Secondary = HV-side = 2


    9

     Simplified equivalent circuit


     Only shunt branch to be considered

    Ioc I'2=0 ReqLV XeqLV

    Iᶲ1
    Ic1 Im
    Voc
    RcLV XmLV

    Primary = LV-side
    10

    𝐼𝑛𝑝𝑢𝑡 𝑝𝑜𝑤𝑒𝑟 ≡ 𝑃𝑜𝑤𝑒𝑟 𝑑𝑖𝑠𝑠𝑖𝑝𝑖𝑡𝑎𝑒𝑑 𝑖𝑛 𝑅𝑐𝐿𝑉


    𝑃𝑜𝑐 ≡ 𝑃𝐶𝑜𝑟𝑒 ≡ 𝑃𝐻𝑦𝑠𝑡 + 𝑃𝐸𝑑𝑑𝑦
    Ioc
    𝑉2𝑜𝑐
    𝑃𝑜𝑐 = Iᶲ1
    𝑅𝑐𝐿𝑉 Ic1 Im
    Voc
    𝑉2𝑜𝑐 RcLV XmLV
    ∴ 𝑅𝑐𝐿𝑉 =
    𝑃𝑜𝑐
    𝑉𝑂𝐶 Primary = LV-side
    Also, 𝑅𝑐𝐿𝑉 =
    𝐼𝑐1
    But, 𝐼𝑐1 not known (at this stage)
    11

    Also, 𝑃𝑜𝑐 = 𝑉𝑜𝑐 𝐼𝑐1 = 𝑉𝑜𝑐 𝐼𝑜𝑐 cos(𝜃𝑜𝑐 )


    𝑃𝑜𝑐 𝑃𝑜𝑐 Ioc
    ∴ cos 𝜃𝑜𝑐 = =
    𝑉𝑜𝑐 𝐼𝑜𝑐 𝑆𝑜𝑐 Iᶲ1
    Ic1 Im
    𝐼𝑜𝑐 = 𝐼𝑐1 + 𝐼𝑚 Voc
    RcLV XmLV
    𝐼𝑐1 in phase with 𝑉𝑜𝑐
    𝐼𝑚 lags 𝑉𝑜𝑐 by 90° Primary = LV-side

    𝐼𝑐1 = 𝐼𝑜𝑐 cos(𝜃𝑜𝑐 )


    𝐼𝑚 = 𝐼𝑜𝑐 sin(𝜃𝑜𝑐 )
    𝑉𝑜𝑐 𝑉2𝑂𝐶 𝑉𝑂𝐶
    𝑋𝑚𝐿𝑉 = 𝑅𝑐𝐿𝑉 = =
    𝐼𝑚 𝑃𝑂𝐶 𝐼𝑐1
    12

     During short circuit test, rated current flows


    through windings
     So, high current on LV-side: 𝐼𝐿𝑉 > 𝐼𝐻𝑉
     Thus, safer to measure current on HV-side
     Only fraction of rated HV voltage applied to get
    rated LV-side current, even though: 𝑉𝐻𝑉 > 𝑉𝐿𝑉
     Thus, short circuit test measurements performed
    on HV-side
     So, LV-side short circuited
    13

     With LV-side short circuited, source at fraction of


    rated HV-side voltage & rated frequency applied
    to HV-side until rated HV-side current flows
     Measure voltage, current, power on HV-side
    14

     Consider approximate equiv cct ref Primary


     Short cct test => Step-down mode, 𝑎 > 1:
    Primary = HV, Secondary = LV:
    (𝐼1 = 𝐼𝐻𝑉 ) < (𝐼2 = 𝐼𝐿𝑉 )

    I1 R1 Xl1 X'l2=a2Xl2 R'2=a2R2

    Iᶲ1 < Rated


    Ic1 I'2 = I2 / a = Rated
    Im
    V'2=0
    V1 < Rated Rc1 Xm

    Primary = HV-side = 1 Secondary = LV-side = 2


    15

     Simplified equivalent circuit


     Impedance of shunt branch greater than Req_HV+jXeq_HV
    ◦ Hence, under short cct, currents flows does not flow through this branch (path of high
    resistance)

     Since Req_HV+jXeq_HV is low, only small V is required


    to give max I.
    Isc ReqHV XeqHV

    Iᶲ1 ≈ 0
    Ic1 Im
    Vsc Rc1 Xm

    Primary = HV-side
    16

    𝑅𝑒𝑞𝐻𝑉 = 𝑅1 + 𝑎2 𝑅2

    𝑆𝑜, 𝐼𝑛𝑝𝑢𝑡 𝑝𝑜𝑤𝑒𝑟 ≡ 𝑅𝑎𝑡𝑒𝑑, 𝐹𝑢𝑙𝑙 𝑙𝑜𝑎𝑑 𝑐𝑜𝑝𝑝𝑒𝑟 𝑙𝑜𝑠𝑠

    𝑃𝑠𝑐 = 𝐼2𝑠𝑐 𝑅𝑒𝑞𝐻𝑉 Isc ReqHV XeqHV

    𝑃𝑠𝑐
    ∴ 𝑅𝑒𝑞𝐻𝑉 = 2 Vsc
    𝐼 𝑠𝑐

    Primary = HV-side
    17

    𝑉𝑠𝑐
    𝑍𝑒𝑞𝐻𝑉 =
    𝐼𝑠𝑐

    But 𝑍𝑒𝑞𝐻𝑉 = 𝑅2𝑒𝑞𝐻𝑉 + 𝑋2𝑒𝑞𝐻𝑉

    2 Isc ReqHV XeqHV


    ∴ 𝑋𝑒𝑞𝐻𝑉 = 𝑍𝑒𝑞𝐻𝑉 −𝑅2𝑒𝑞𝐻𝑉

    Vsc
    Alternatively: 𝑋𝑒𝑞𝐻𝑉 = 𝑍𝑒𝑞𝐻𝑉 sin(𝜃𝑠𝑐 )
    But, 𝑃𝑠𝑐 = 𝑉𝑠𝑐 𝐼𝑠𝑐 𝑐𝑜𝑠 𝜃𝑠𝑐
    Primary = HV-side
    𝑃𝑠𝑐
    ∴ 𝜃𝑠𝑐 = 𝑐𝑜𝑠 −1
    𝑉𝑠𝑐 𝐼𝑠𝑐
    18

    IHV ReqHV XeqHV

    I'LV = ILV / a
    VHV RcHV XmHV V'LV = aVLV

    2 𝐹𝑟𝑜𝑚 𝑜𝑝𝑒𝑛 𝑐𝑖𝑟𝑐𝑢𝑖𝑡 𝑡𝑒𝑠𝑡


    𝑅𝑐𝐻𝑉 = 𝑅𝑐1 = 𝑎 𝑅𝑐𝐿𝑉
    2 ቋ 𝑤ℎ𝑒𝑟𝑒 𝑣𝑎𝑙𝑢𝑒𝑠 𝑎𝑟𝑒
    𝑋𝑚𝐻𝑉 = 𝑋𝑚 = 𝑎 𝑋𝑚𝐿𝑉 𝑟𝑒𝑓𝑒𝑟𝑟𝑒𝑑 𝑡𝑜 𝐿𝑉
    V1 E N1
    = 1 = =a
    V2 E2 N2
    𝑅𝑒𝑞𝐻𝑉 = 𝑅𝑒𝑞1 𝐹𝑟𝑜𝑚 𝑆ℎ𝑜𝑟𝑡
    ቋ I1
    =
    1
    𝑋𝑒𝑞𝐻𝑉 = 𝑋𝑒𝑞1 𝐶𝑖𝑟𝑐𝑢𝑖𝑡 𝑡𝑒𝑠𝑡 I2 a
    Z1
    = a2
    Z2
    19

    I'HV = aIHV ReqLV XeqLV

    ILV
    V'HV = VHV / a RcLV XmLV VLV

    𝐹𝑟𝑜𝑚 𝑜𝑝𝑒𝑛 𝑐𝑖𝑟𝑐𝑢𝑖𝑡 𝑡𝑒𝑠𝑡


    𝑅𝑐1 = 𝑅𝑐𝐿𝑉
    ൠ 𝑤ℎ𝑒𝑟𝑒 𝑣𝑎𝑙𝑢𝑒𝑠 𝑎𝑟𝑒
    𝑋𝑚 = 𝑋𝑚𝐿𝑉
    𝑟𝑒𝑓𝑒𝑟𝑟𝑒𝑑 𝑡𝑜 𝐿𝑉
    𝑅𝑒𝑞𝐻𝑉 V1 E N1
    𝑅𝑒𝑞𝐿𝑉 = 𝑅𝑒𝑞2 = = 1 = =a
    𝑎2 𝐹𝑟𝑜𝑚 𝑆ℎ𝑜𝑟𝑡 V2 E2 N2
    𝑋𝑒𝑞𝐻𝑉 𝐶𝑖𝑟𝑐𝑢𝑖𝑡 𝑡𝑒𝑠𝑡 I1
    =
    1
    𝑋𝑒𝑞𝐿𝑉 = 𝑋𝑒𝑞2 = I2 a
    𝑎2 Z1
    = a2
    Z2

    You might also like