American National Standard For Switchgear - Metal-Enclosed Low Voltage AC Power Circuit Breaker Switchgear Assemblies - Conformance Test Procedures
American National Standard For Switchgear - Metal-Enclosed Low Voltage AC Power Circuit Breaker Switchgear Assemblies - Conformance Test Procedures
American National Standard For Switchgear - Metal-Enclosed Low Voltage AC Power Circuit Breaker Switchgear Assemblies - Conformance Test Procedures
51-2018
Secretariat:
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CONTENTS
1 Scope .................................................................................................................................................. 1
1.1 Purpose ........................................................................................................................................... 1
2 References ......................................................................................................................................... 1
3 Definitions ........................................................................................................................................... 1
3.1 Conformance Tests ......................................................................................................................... 1
3.2 Design Tests (Type Tests) .............................................................................................................. 2
3.3 Production Tests (Routine Tests) ................................................................................................... 2
4 Test Conditions ................................................................................................................................... 2
4.1 Ambient Conditions ......................................................................................................................... 2
5 Conformance Test Requirements....................................................................................................... 2
5.1 General ........................................................................................................................................... 2
5.2 Test Requirements .......................................................................................................................... 2
5.3 Test Arrangements ......................................................................................................................... 3
5.4 Dielectric Tests................................................................................................................................ 4
5.5 Continuous Current Test ................................................................................................................. 4
5.6 Short-Time Withstand Current Tests .............................................................................................. 4
5.7 Short-Circuit Withstand Current Tests ............................................................................................ 4
5.8 Mechanical Performance Tests—Removable Circuit Breakers ...................................................... 5
6 Treatment of Nonconforming Results ................................................................................................. 5
7 Production Tests (Routine Tests) ....................................................................................................... 5
7.1 General ........................................................................................................................................... 5
7.2 Dielectric Withstand Voltage Tests ................................................................................................. 5
7.3 Mechanical Operation Tests ........................................................................................................... 5
7.4 Grounding of Instrument Transformer Cases Test ......................................................................... 6
7.5 Electrical Operation and Wiring Tests ............................................................................................ 6
8 Retesting............................................................................................................................................. 6
This Standard has been developed to describe selected tests and procedures to demonstrate
conformance in accordance with Tests clause from IEEE Std C37.20.1 Metal-Enclosed Low-Voltage AC
Power Circuit Breaker Switchgear. It is published separately from IEEE Std C37.20.1 to facilitate its use
and to permit timely revisions based on experience.
Revisions have been made to this edition to coordinate with revisions made to IEEE Std C37.20.1.
This Standard is one of several in a series of test procedures for conformance testing of switchgear
products. While this Standard is written for general guidance, performance criteria are established so that
this Standard can be adopted as the basis for certification of metal-enclosed low-voltage alternating
current power circuit breaker switchgear for use in non-utility installations subject to regulation by public
authorities and similar agencies concerned with laws, ordinances, regulations, administrative orders, and
similar instruments.
This Standard has been prepared by a Working Group sponsored by the Power Switchgear Assemblies
Technical Committee of the Switchgear Section of the National Electrical Manufacturers Association
(NEMA 8-SG-V). During the course of its preparation, coordination has been maintained with the
Switchgear Committee of the Power and Energy Society of the Institute of Electrical and Electronics
Engineers.
Through this joint effort over many years, the switchgear assemblies Standards have been of extreme
value to the industry and further suggestions for improvement gained in the use of this Standard will be
welcomed.
Suggestions for improvement of this Standard will be welcome. They should be sent to the National
Electrical Manufacturers Association, 1300 North 17th Street, Suite 900, Rosslyn, VA 22209.
This Standard was processed and approved for submittal to ANSI by Accredited Standards Committee on
Power Switchgear C37. Committee approval of the Standard does not necessarily imply that all
committee members voted for its approval. At the time of its approval, the ASC C37 Committee had the
following members:
The following members composed the NEMA Power Switchgear Section Technical Committee at the time
of publication of this Standard:
Eldridge Byron
Phil Fahey
Keith Flowers
Lou Grahor
Mark Gromlovits
Victor Hermosillo
Chad Kennedy
Peter Kowalik
Darryl Moser
T. W. Olsen
Tony Ricciuti
Ron Ridgeway
Karla Trost
John Webb
Michael Whitney
Eddie Wilkie
Terrance Woodyard
Charles Worthington
1 Scope
This Standard is a conformance testing Standard optionally applicable to all metal-enclosed low-voltage ac
power circuit breaker switchgear assemblies designed, tested, and manufactured in accordance with IEEE
Std C37.20.1, Metal-Enclosed Low-Voltage AC Power Circuit Breaker Switchgear. This Standard covers
selected tests to demonstrate conformance of the basic switchgear section (which includes the structure,
circuit breaker compartments, instrument compartments, buses, and internal connections) with the “Tests”
clause of IEEE Std C37.20.1. See IEEE Std C37.20.1 for assigned ratings and usual service conditions.
In this Standard, the use of the term "LV switchgear" shall be considered to mean "metal-enclosed low-
voltage alternating current power circuit breaker switchgear assemblies." The use of the term "circuit
breaker" shall be considered to mean "low-voltage alternating current power circuit breaker," unless
qualified by other descriptive terms.
1.1 Purpose
This Standard specifies the tests that shall be performed to demonstrate that the LV switchgear being tested
conforms with the ratings assigned to it and meets the mechanical and electrical performance requirements
specified in IEEE Std C37.20.1.
2 References
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments or corrigenda) applies.
ANSI C37.50, Low-Voltage AC Power Circuit Breakers Used in Enclosures –Test Procedures
IEEE Std C37.26, Standard Guide for Methods of Power Factor Measurement for Low-Voltage Inductive
Test Circuits
3 Definitions
The definitions of terms contained in this Standard, or in other Standards referred to in this Standard, are
not intended to embrace all legitimate meanings of the terms. They are applicable only to the subject treated
in this Standard.
For definitions of terms not defined within this Standard, it is recommended that The IEEE Standards
Dictionary: Glossary of Terms & Definitions should be referenced. A dagger (†) indicates that the definition
differs from that in the IEEE Standards Dictionary.
Certain tests to demonstrate compliance with the applicable Standards. The test specimen is normally
subjected to all planned production tests prior to initiation of the conformance test program. †
Conformance tests may, or may not, be similar to certain design tests. Demonstration of margin
(capabilities) beyond the ratings is not required.
Tests made by the manufacturer to determine the adequacy of the design of a particular type, style, or
model of equipment or its component parts to meet its assigned ratings and to operate satisfactorily under
normal service conditions or under special conditions if specified, and may be used to demonstrate
compliance with applicable Standards of the industry. †
Design tests are made on representative apparatus or prototypes to verify the validity of design analysis and
calculation methods and to substantiate the ratings assigned to all other apparatus of basically the same
design. These tests are not intended to be made on every design or to be used as part of normal
production. The applicable portion of these design tests may also be used to evaluate modifications of a
previous design and to ensure that performance has not been adversely affected. Test data from previous
similar designs may also be used for current designs, where appropriate. Once made, the tests need not be
repeated unless the design is changed so as to modify performance.
Tests made for quality control by the manufacturer on every device or representative samples, or on parts or
materials as required to verify during production that the product meets the design specifications and
applicable Standards. †
Certain quality assurance tests on identified critical parts of repetitive high-production devices may be tested
on a planned statistical sampling basis.
4 Test Conditions
4.1 Ambient Conditions
Tests shall be conducted under conditions prevailing at the test site which shall conform to “Usual Service
Conditions” in accordance with the clause on “Normal (usual) service conditions” from IEEE Std C37.20.1,
except that the temperature of the air surrounding the assembly (ambient) for the continuous current tests
shall be within the ambient temperature range of 10°C (50°F) to 40°C (104°F).
Tests are made on representative test arrangements of LV switchgear as described in 5.3 to demonstrate
the capability of the LV switchgear design to meet its assigned ratings and to operate under normal service
conditions as outlined in the clause on “Normal (usual) service conditions” from IEEE Std C37.20.1. The
circuit breaker designs utilized shall have been previously qualified in accordance with ANSI C37.50 or shall
be tested to those requirements simultaneously with the requirements of this Standard.
The test specimen shall have been subjected to production tests in accordance with clause 7 prior to
initiation of conformance tests.
Representative test arrangements shall be subjected to the following tests as described in the sub-clauses
indicated in parentheses:
For the tests specified in 5.4 through 5.7, the test arrangement construction shall consist of an
indoor vertical section of circuit breaker compartments plus an additional representative structure (to
simulate actual installation of two adjacent sections), so that the main bus extends through both sections
and includes a main bus splice.
Other than as modified in 5.3.3, the tests specified in 5.4 through 5.7 shall be conducted on each of the
following test arrangements:
Test arrangement 1: one 600 A frame circuit breaker with 1600 A main bus
Test arrangement 2: one 800 A frame circuit breaker with 1600 A main bus
For frame and bus ratings not covered above, the test arrangement will include a circuit breaker of the frame
size to be tested. The main bus shall be of equal continuous current rating of the frame size to be tested.
The Mechanical Performance Tests specified in 5.8 shall be conducted in any representative housing
intended to receive the circuit breaker frame size under test. This is permitted to be, but not required to be,
one of the compartments in the above test arrangements.
For the tests specified in 5.5 through 5.7, the test circuit shall be configured with the test power source
connected to the main bus in such a manner that the test current passes through a main bus splice.
For the tests specified in 5.4, the section (riser) bus shall be the configuration with the least clearances
(typically, the largest size conductors) intended for use with the circuit breaker used in the test arrangement.
For the tests specified in 5.5 through 5.7, the section (riser) bus shall be the minimum size furnished by the
manufacturer for the frame size of the circuit breaker used in the test arrangement. The intent is to perform
the continuous current and short-circuit current tests with the smallest bus configuration.
For the tests specified in 5.4 and 5.8, the circuit breaker may be in any compartment.
Tests specified in 5.5 shall be conducted with a single circuit breaker in the uppermost circuit breaker
compartment of any arrangement used by the manufacturer for the rating being tested, with all other
compartments in that vertical section bused to receive circuit breakers, but with circuit breakers, if installed
in these compartments, disconnected for the test.
Tests specified in 5.6 and 5.7 shall be made with a circuit breaker in the uppermost compartment unless it is
determined that circuit breakers need not be included in the short-time and short-circuit withstand current
tests.
Voltage transformers, control power transformers, and associated disconnecting means and fuses are not
required for the tests specified in 5.5 through 5.7. If they are present in the sample, they should not have
any effect on the test and need not be removed. Transformers are permitted to be disconnected, but the
associated disconnecting means and fuses shall be connected during the dielectric tests (see 5.4). If the
fuse holder is integral to the transformer, the transformer may be disconnected by the removal of the fuse.
5.3.3 Representation
If the switchgear is manufactured in both stationary and drawout designs and the bus design is
identical for both, the stationary design may be qualified by testing only the drawout design. The tests
specified in 5.8 apply only to the drawout design.
If any of the test arrangements shown in 5.3.1 has the same construction as another, tests on one
arrangement are permitted to represent the other arrangement under the following conditions:
a. Continuous current tests (5.5) are to be conducted on the arrangement(s) having the higher ampere
rating and the greatest current density.
b. Short-time withstand current tests (5.6) and short-circuit withstand current tests (5.7) are to be
conducted on the arrangement having the smallest bus configuration for the current level involved.
Incoming bus structure used in LV switchgear and other busing required for customization shall be
considered as meeting the short-circuit current requirements if its construction is physically equivalent to
that of the main bus structure that was tested and found to meet the short-circuit current and short-time
current requirements. If the construction is not physically equivalent, this busing shall be tested in a manner
that will subject it to the requirements of those tests.
Tests shall be performed per IEEE Std C37.20.1-2015, clause 6.2.4, except that for circuit breaker frame
sizes of 3000 A or greater, if connection to outgoing terminals using bus bars is not possible, cables may be
used for this connection. Cable ampacities shall be no larger than the minimum cable ampacity based on
the circuit breaker current rating in accordance with NPFA 70, the National Electrical Code, based on 90C
cable insulation.
5.6.1 General
5.7.1 General
Tests shall be performed per IEEE Std C37.20.1-2015, clause 6.2.6, except as noted in 5.7.1.1, 5.7.1.2, and
5.7.1.3.
5.7.1.1 Short-time withstand current test may cover short-circuit withstand current test
When the current and voltage level of the short-time and short-circuit tests are the same, and the test circuit
characteristics meet the requirements for each test, satisfactory completion of the short-time withstand
current test also covers the need for a short-circuit withstand current test.
Some circuit breakers have higher short-circuit current ratings at their lower voltage ratings (for example,
many 240 V or 480 V short-circuit ratings are higher than they are at the 600 or 1000 V level). In that case,
in addition to the test at maximum rated voltage, additional tests shall be made at any lower voltage for
which the short-circuit current rating is higher.
Determination of need for including circuit breakers and circuit breaker compartments in the short-circuit
withstand current tests, along with criteria for required tests, shall be in accordance with IEEE Std C37.20.1-
2015 clause 6.2.5 a), b), or c).
© 2018 National Electrical Manufacturers Association
ANSI C37.51-2018
Page 5
For fused circuit breakers, if it can be demonstrated that the maximum peak let-through current of the fuse
for a given frame size is less than the peak let-through current for which the LV switchgear has been tested,
then testing with fused circuit breakers of that frame size is not required. When it is necessary to test fused
circuit breaker compartments, the short-circuit current connections shall be made on the outgoing side of the
fused circuit breaker. The fuses shall be the maximum current rating supplied by the manufacturer for the
circuit breaker frame size.
Tests shall be performed per IEEE Std C37.20.1-2015, clause 6.2.7.1 and 6.2.7.2.
5.8.2 Performance
When analysis indicates that a particular corrective action would not have affected results obtained in
previous tests, it shall be permitted to take the corrective action without repeating the previously completed
tests.
When analysis indicates that a particular corrective action may have caused a nonconformance in tests
previously completed, only those potentially affected tests shall be repeated on the LV switchgear to which
the corrective action has been applied. In deciding whether or not to repeat a previous test, it is important
that the decision is based on the corrective action taken and not on the nonconformance that occurred.
Unless otherwise specified, all production tests shall be made by the manufacturer at the factory on the
complete LV switchgear or its component parts for the purpose of checking the correctness of
manufacturing operations and materials (See IEEE Std C37.20.1). Drawout circuit breakers need not be
tested in the assembly if they are tested separately.
Tests shall be performed per IEEE Std C37.20.1-2015, clause 6.3.5. Except during the control wiring
insulation test, voltage sensitive components such as coil windings and electronic devices may be shorted
or disconnected during the test
8 Retesting
Retesting is not required if the design has not changed. A design change made to the LV switchgear shall
be evaluated for its effect on rated performance. If it is determined that performance may be affected by the
change, the relevant conformance tests shall be repeated.