Changes in i3070 Software Regarding VTEP Hardware 2
Compatibility between nanoVTEP and VTEP Components 3 Upgrading VTEP Tests to Use nanoVTEP 4 Case Study: Convert VTEP Fixture to Use nanoVTEP 8 Changes in i3070 Software Regarding VTEP Hardware From release 09.20p, the i3070 In-Circuit Test Software assumes the use of nanoVTEP probes when generating new test and fixture files. nanoVTEP probes are assigned to nanoVTEP mux card(s), and the mux card configuration is saved in the mux_card_list object file in the fixture folder.
This default setting is found in the .hp3070 file:
mpa.VtepEnabled: no However, if you want to generate fixturing information for VTEP probes instead of the new nanoVTEP probes, you can set the keyword to yes in the .hp3070 file: mpa.VtepEnabled: yes
2 Compatibility between nanoVTEP and VTEP Components nanoVTEP mux cards, amplifiers, and sensor plates are not compatible with VTEP components and they cannot be mixed. However, nanoVTEP and VTEP can coexist in a fixture/test program, provided that the two types of components do not mix as in the following example:
Following the connections shown above, an existing VTEP fixture can be partially upgraded to nanoVTEP by converting selected devices only.
1. With this setting, the software will assign VTEP probes to VTEP mux cards when generating new fixture files. The .hp3070 file is in the user’s home directory. If you want to change the setting only for a specific board, copy the .hp3070 file to the board directory before editing it.
3 Upgrading VTEP Tests to Use nanoVTEP The following procedure describes how to upgrade VTEP-tested devices to nanoVTEP tested devices. This must be done on a system running i3070 Software release 9.20p or later.
STEP 1: Debug test program
Debug the test program and ensure there are no failures. Run IPG Test Consultant on the test program to ensure there no errors and to add/remove wires to the fixture. Fix any errors before proceeding. 1 If testjet is marked permanent in the testorder file, uncomment it and re-save the testorder file. 2 Run IPG Test Consultant. Select Actions > Develop Board Test. 3 In the Dependencies Calculation dialog box, select Actions > Begin Interactive Development. 4 In the IPG Test Consultant Messages window, check that the following messages appear at the end:
STEP 2: Remove existing VTEP tests
To upgrade the test program to use nanoVTEP hardware instead of VTEP, it is necessary to remove the existing VTEP tests for the devices that you intend to test with nanoVTEP. 1 Launch Board Consultant with the target test program. 2 Search for the target devices that were tested with VTEP and are to be upgraded: a Use Search to find the device and click Show Data For Device. b In the Device Entry Form (Figure 1), set the following options: Test Using TestJet/VTEP - No Test Using Cover-Extend - No c Click Replace Device. When the target devices have been updated, close the Device Entry Form.
4 Figure 1 Device Entry Form
3 From the File menu, select Save Board Information.
4 In BT-Basic, edit the wirelist.o and fixture/fixture.o files to remove all information relating to the above devices. The following is a sample workflow:
list object "wirelist.o" to/over "wirelist"
get "wirelist" find "test testjet" Delete the target devices under the above section. find "test cover extend" Delete the target devices under the above section. re-save compile "wirelist" list object "fixture/fixture.o" to/over "fixture/fixture" get "fixture/fixture" find "testjet" Delete all the probes that are found re-save compile "fixture/fixture"
5 5 If necessary, keep a copy of the debugged testjet tests (testorder file) and merge them into the newly generated testjet tests later. 6 Run IPG Test Consultant to generate tests and fixture files. a Select Actions > Develop Board Test. b In the Dependencies Calculation dialog box, select Actions > Begin Interactive Development. c In the Develop Board Test dialog box, select Actions > Execute All Steps To Stop Mark.
STEP 3: Replace/add new VTEP tests that use nanoVTEP
1 Make sure the setting in the .hp3070 file is: mpa.VtepEnabled: no If there is no such setting in the file, add it using a text editor. 2 Launch Board Consultant with the target test program. 3 Update the devices to be tested with nanoVTEP: a Use Search to find the device and click Show Data For Device. b In the Device Entry Form (Figure 1), set the following options: Test Using TestJet/VTEP - Yes Test Using Cover-Extend - Yes (if desired) TestJet/VTEP Probing - Auto Selection c Click Replace Device. When all the devices that require nanoVTEP testing have been updated, close the Device Entry Form. 4 From the File menu, select Save Board Information. 5 Run IPG Test Consultant to generate tests and fixture files. a Select Actions > Develop Board Test. b In the Dependencies Calculation dialog box, select Actions > Begin Interactive Development. c In the Develop Board Test dialog box, select Actions > Execute All Steps To Stop Mark. 6 Check the related fixture files to see if they have been updated properly. For example, in the fixture/vtep_mux file, the nanoMUX card has replaced the VTEP card or been added to the fixture.
============================ REQUIRED VTEP MUX CARDS ============================ Module 2 Top side MUX 1 card Module 2 Top side NanoMUX 2 card
6 7 Fabricate the fixture following the standard nanoVTEP fixture building procedure.
7 Case Study: Convert VTEP Fixture to Use nanoVTEP Here we are replacing VTEP probes with nanoVTEP probes. There are two types of probes, nanoVTEP standard probes and nanoVTEP probes.
Figure 2 Fixture under modification
Figure 3 Types of nanoVTEP probes
nanoVTEP Standard Probe nanoVTEP Probe
8 J31 – Upgrade to Standard nanoVTEP Probe Upgrading from a standard VTEP probe to a standard nanoVTEP probe is straightforward as the two sockets are the same and can be reused. If the height of the probe has to be adjusted, the sockets can be removed and new sockets installed in the same holes. A new requirement for nanoVTEP is the additional blind hole to house the amplifier. This will only be needed if the nanoVTEP amplifier is too tall to fit into the existing VTEP space.
J31 before upgrading.
Original VTEP probe and sockets are removed.
If there is no change in the probe height/travel, the sockets may be retained and reused. In this case the sockets are replaced because of the height adjustment needed.
Blind hole for amplifier and new standard sockets.
Here a receptacle* is added to the blind hole to avoid vacuum leak. The receptacle is not needed if the blind hole is not deep enough to cause any vacuum leak issues.
* part number N4333A-A01
Final assembly with amplifier and sensor plate.
9 J33 – Upgrade to nanoVTEP Probe
J33 before upgrading.
Original VTEP probe and sockets are removed.
A new hole is drilled and the nanoVTEP receptacle inserted.
