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A fast half-subtractor using 8T static random access memory for in-memory computation

The existing system for computation completely incorporates Von-Neumann architecture which has limitations with respect to its memory, parallelism and power constraints. This has affected the efficiency of the computing system. Novel architectural solutions are required to meet the growing demands for improved computational efficiency and power management in very large scale integration (VLSI) systems. To deal with the large-scale data, computation in memory (CIM) has been introduced.

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0% found this document useful (0 votes)
5 views

A fast half-subtractor using 8T static random access memory for in-memory computation

The existing system for computation completely incorporates Von-Neumann architecture which has limitations with respect to its memory, parallelism and power constraints. This has affected the efficiency of the computing system. Novel architectural solutions are required to meet the growing demands for improved computational efficiency and power management in very large scale integration (VLSI) systems. To deal with the large-scale data, computation in memory (CIM) has been introduced.

Uploaded by

IJRES team
Copyright
© © All Rights Reserved
Available Formats
Download as PDF, TXT or read online on Scribd
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International Journal of Reconfigurable and Embedded Systems (IJRES)

Vol. 14, No. 1, March 2025, pp. 273~281


ISSN: 2089-4864, DOI: 10.11591/ijres.v14.i1.pp273-281  273

A fast half-subtractor using 8T static random access memory


for in-memory computation

Deepika Prabhakar1, Nagaraja Shylashree2, Sunitha Yariyur Narasimhaiah3,


Yashaswini Biligere Mariswamappa4, Sheetal Singrihalli Hemaraj2
1
Department of Electronics and Communications, RV College of Engineering (Affiliated to VTU Belagavi), Bangalore, India
2
Department of Electronics and Communications, RV College of Engineering, Bangalore, India
3
Department of Electronics and Communications, SJB Institute of Technology, Bangalore, India
4
Department of Electronics and Communications, JSS Academy of Technical Education, Bangalore, India

Article Info ABSTRACT


Article history: The existing system for computation completely incorporates Von-Neumann
architecture which has limitations with respect to its memory, parallelism
Received Aug 28, 2024 and power constraints. This has affected the efficiency of the computing
Revised Oct 22, 2024 system. Novel architectural solutions are required to meet the growing
Accepted Nov 12, 2024 demands for improved computational efficiency and power management in
very large scale integration (VLSI) systems. To deal with the large-scale
data, computation in memory (CIM) has been introduced. The paper presents
Keywords: the half subtractor circuit and the In-memory computation co-design using
eight transistors static random access memory (SRAM) cell whose read
Computation-in memory circuitry is transmission gate based. The proposed half-subtractor with the
Half subtractor CIM is implementation is carried out in 180 nm complementary metal–
Latch-based sense amplifier oxide–semiconductor (CMOS) technology. The sensing scheme used is the
Static noise margin latch-based sense amplifier along with the 8T SRAM cell. The proposed
Von-neumann SRAM with transmission-gate based read circuitry along with latch-based
sense amplifier reduces the delay and power consumed during the read
operation significantly and a bit reduction during the write operation. The
static noise margin (SNM) for read operation has been increased by 9% in
the transmission gate-based SRAM as compared to conventional 8T SRAM.
The delay of the proposed design has been reduced by 53% during the read
operation and 4.43% during the write operation. The power consumed has
been reduced by 3% and 8.6% during read and write operations,
respectively.
This is an open access article under the CC BY-SA license.

Corresponding Author:
Nagaraja Shylashree
Department of Electronics and Communications, RV College of Engineering
Bangalore 560059, Karnataka, India
Email: shylashreen@rvce.edu.in

1. INTRODUCTION
The Von-Neumann architecture based computing systems which are being used at present [1] has
the arithmetic and logic unit (ALU) unit and the memory unit placed far from each other leading to high
power consumption during the transfer of data from memory unit to the ALU unit and this can be shown in
the Figure 1. To overcome the Von-Neumann bottleneck, computation in memory (CIM) has been
introduced. This system has ALU and memory unit nearby and the power consumed will be reduced [2]-[4].
The computation in-memory architecture is shown in the Figure 2. This structure will conserve energy used
during the transfer of data. Numerous paperscould be observed in the literature, that centers its observation on
complementary metal–oxide–semiconductor (CMOS) based static random access memory (SRAM) for CIM

Journal homepage: http://ijres.iaescore.com


274  ISSN: 2089-4864

technology. 6T SRAMs have been used to implement the CIM methodology [5]. But the 6T SRAM has the
disadvantage of read distribution failure [6]. To overcome the read disturbance failure, 8T SRAM cells have
been used effectively [7]. Boolean functions such as NOR and NAND are implemented and shown [8], [9].
Similarly, using these approaches, a fast adder has been implemented where the number of logic gates has
been reducedto reduce the delay of the circuit [10].

Figure 1. Von-Neumann architecture

Figure 2. CIM architecture

The different sensing schemes have been proposed but the latch-based sense amplifier has proven to
be the best one for the detection of small changes in the bit line of 8T SRAM [11]. 8T SRAMs were also
used in computation of dot product [12]. Some of the works also discussed on the spin-transfer torque
magnetic RAM and its computation architecture [13]. Prospects of this new emerging technology has been
discussed in few papers [14]. Even though the noise margin of 6T SRAM cells were better, 8T SRAMs were
considered because of the presence of separate paths for read and write [15].
The contributions made by this proposed work primarily are a fast subtractor has been implemented
with the SRAM array for in memory computation which results in reduction in the delay as well as power
consumed after the usage of transmission based read circuitry in the 8T SRAM cell. The paper is organized
as: section 2 consists of 8T SRAM which are conventional and transistor based. The section 3 contains the
mapping of half subtractor NOR circuit into the SRAM array and its implementation. The section 4 discusses
the results and analysis while the section 5 contains conclusion and future scope.

2. METHOD
The complete method is divided into two sections. Section 2.1 details the implementation of 8T
SRAM and shows the read and write path along with the sense amplifier design. Section 2.2 explains the
implementation 2×5 SRAM memory array equipped with a half subtractor. NOR netlist used for the half-
subtractor, which consists of five NOR gates and subtracts two 1-bit binary numbers (A, B) and provides
output as two 1-bit binary numbers (difference and borrow). The conventional design used pass transistors for
the read circuitry [8]. The read circuitry has been replaced with transmission gate in the proposed work. The
half subtractor is realized using NOR gates and those gates were mapped into the SRAM array to get the
arithmetic circuit and CIM cell co-design. Then the simulation was carried out to compare the obtained results
with the conventional design. The circuit implementation for functionality, delay and power analysis is done
using the CADENCE virtuoso tool in 180 nm CMOS technology.

Int J Reconfigurable & Embedded Syst, Vol. 14, No. 1, March 2025: 273-281
Int J Reconfigurable & Embedded Syst ISSN: 2089-4864  275

2.1. 8T static random access memory


The complete storing of data as well as processing of data will be done in the memory array itself.
There are two-word lines and two-bit lines for 8T SRAM cell and this is the reason for choosing 8T SRAM
over 6T SRAM cell. The conventional 8T SRAM cell is shown in the Figure 3. Choosing 8T SRAM will
eliminate the read disturbance failure. 6T SRAM will be present in the 8T SRAM cell and two additional
transistors are present for the read operation. The write operation performed in the 8T SRAM cell is similar
to that of the 6T SRAM cell.

Figure 3. Conventional 8T SRAM cell

The write word line is made high and the VDD must be given to word bit line and word bit line bar
must be provided with ground. This will store 1 at Q and 0 at Qbar of the SRAM memory unit. Bit 0 can be
written in the same way by reversing the terminals. Bit line will be recharged before the commencement of
read operation. The transistors which are present in the read circuitry will be used during the read
operation [3], [16]-[24].
The read word line must be ON to be able to get the value at the read bit line output. Now if the read
circuitry is replaced by a transmission gate, then it reduces the total area occupancy along with the significant
delay reduction during the read operation. When the word line of the read circuitry is ON, only then
the transmission gate is activated resulting in the reduction of power and delay produced by the circuit. The
Figure 4 shows the design of the 8T SRAM cell whose read circuitry is replaced by transmission gate. To
detect even the smallest difference in the bit line voltage read from the SRAM, sense amplifiers are used. On
comparing the results and speed of the sense amplifiers, latch-based sense amplifier is best suited for the
proposed design [25]. There is a positive feedback present in the sense amplifier which is latch based. Due to
the presence of positive feedback in latch-based sense amplifiers, they are very fast. The latch-based sense
amplifier design isshown in the Figure 5.

Figure 4. 8T SRAM with transmission gate-based read circuitry


A fast half-subtractor using 8T static random access memory for in-memory … (Deepika Prabhakar)
276  ISSN: 2089-4864

Figure 5. Latch-based sense amplifier

The INN input in the sense amplifier must be connected to the reference voltage (Vref) which must be
at its maximum that is VDD when the input given is (11), Vref should be half of VDD if the input combination
given as (01) or (10). If the input is (00), the Vref should be minimum. The INP terminal mentioned in the
Latch-based sense amplifier is connected to the bit line (RQ) of the SRAM shown in the Figure 2. The output
is taken out from the terminal SO and SON terminal gives the compliment of the SO output. Five such sense
amplifiers are used.

2.2. Circuit implementation


In this case, a 2×5 SRAM memory array is equipped with a half subtractor. Figure 6 display the NOR
netlist for the half-subtractor, which consists of five NOR gates and subtracts two 1-bit binary numbers (A, B)
and provides output as two 1-bit binary numbers (difference and borrow). Utilizing the following equation,
the output was created from the input. Difference=ABˆ and borrow=A´. B.

Figure 6. Half-subtractor realization using NOR gates

The half-subtractor can be realized using NOR gates only as shown in the Figure 6. The half-
subtractor netlist will be mapped into the SRAM array to perform the arithmetic circuit and memory cell co-
design. In an 8T SRAM cell, there is 6T SRAM cell and an extra read port consisting of transistors P3 and
N5 as in Figure 4. The write operation is similar to the 6T SRAM cell but the read operation is different. When
the read operation has to occur, RL must be kept high while keeping the WWL low. Cells A and B from the
Figure 7 represents 6T SRAM cell part and the extra transmission gate-based read circuitry is connected to
have read operation and the output of the bits read from it will be reflected on the RBL line. When both the
inputs were given as logic ‘0’. Cells A and B stored ‘0’ in their memory unit. During the operation, RBL is
precharged to VDD. Since both the inputs are ‘0’, the RBL will have no change and retains the VDD voltage
which is sense by the sense amplifier and the output was observed to be 1. If any one of the Cells contents
were changed from ‘0’ to ‘1’, the RBL starts discharging and the output observed at the sense amplifier was
‘0’. Hence, it can be inferred that as a result, NOR can be implemented in the 8T bit-cell with minimal
overhead if both of the read word lines are activated simultaneously.

Int J Reconfigurable & Embedded Syst, Vol. 14, No. 1, March 2025: 273-281
Int J Reconfigurable & Embedded Syst ISSN: 2089-4864  277

Figure 7. Single-ended sensing of NOR

Using the designs and approach shown in Figures 6 and 7, complete circuit was implemented as
shown in the Figure 8. The two bits A and B gets stored in the cells. RBL lines are precharged to V DD through
the precharge transistors. Each of the NOR gates are mapped into the two row, 5 Column SRAM array.
Since serial mapping of each NOR gate into a separate column has been done and each NOR gate has a
different delay, the precharge circuit was controlled to produce the desired half subtractor result. Since each
NOR gate has a different delay, the RBL of the subsequent column precharges when the input from the
previous column becomes available. Then, to obtain the half-subtractor result for all input combinations,
simulation of the NOR netlist mapped SRAM array was carried out in Cadence virtuoso tool using 180 nm
CMOS technology.

Figure 8. Mapping half-subtractor circuit into SRAM array


A fast half-subtractor using 8T static random access memory for in-memory … (Deepika Prabhakar)
278  ISSN: 2089-4864

To obtain the half-subtractor result for all input combinations, simulation of the NOR netlist mapped
SRAM array was carried out in Cadence virtuoso tool using 180 nm CMOS technology. The output of the
sense amplifiers 2 and 5 gives out the required outputs of half subtractor, borrow, and difference,
respectively. The integration of half subtractor and SRAM array optimizes the overall performance, making
the CIM subtractor well-suited for high-speed, low-power computational tasks.

3. RESULTS AND DISCUSSION


The CIM design is implemented in CADENCE by using all the above designs. The schematic
diagram in cadence 180 nm technology is as shown in the Figure 9. The circuit is simulated to obtain the
transient response giving the simulation time as 2 us. The response obtained is the waveform of a half
subtractor circuit. Whenever the enable signal is high, outputs borrow and difference are inspected. EN=1,
input A=1, B=1, output difference=0; borrow=0; input A=1, B=0, output difference=1; input A=0, B=0,
output difference=0; borrow=0; input A=0, B=1, output difference=1; borrow=0; and the functionality is
verified. The waveform after simulation is as shown in the Figure 10.

Figure 9. CIM cell implemented in 180 nm CMOS technology

Figure 10. Simulated response of the proposed work

From the response, it can be observed that the half subtractor output waveform was achieved. A and
B represents the inputs stored in SRAM cells A and B. The corresponding difference and borrow outputs
were shown. There exists some delay during both the read and write operation. The conventional 8T SRAM
CIM design as proposed in the paper [7] shows that the read delay, power and energy consumed by it are
found to be 9.756 ps, 417.4 nW, and 4.069 zj, respectively. The same as computed with the proposed

Int J Reconfigurable & Embedded Syst, Vol. 14, No. 1, March 2025: 273-281
Int J Reconfigurable & Embedded Syst ISSN: 2089-4864  279

methodology gives out the results as 4.605 ps, 406.5 nW, and 1.871 zj. The readings are tabulated in the
Tables 1 and 2. Similarly, if we consider the write operation, the write delay, power and energy consumed by
it are found to be 62.85 ps, 1.579 nW, and 0.099 zj when it comes to existing design [7]. The proposed design
gives out the write delay, power and energy consumed as 60.07 ps, 1.459 nW, and 0.088 zj. On comparison,
the proposed design had a noticeable reduction in the read operation rather than write operation. This is
mainly due to the usage oftransmission gate based read circuitry in the 8T SRAM design.

Table 1. Power, delay, and energy details of read operation


Design Read delay (ps) Read power (nW) Read energy (zj)
Existing design with conventional 8T SRAM [7] 9.756 417.4 4.069
Proposed design with SRAM using transmission gate based 4.605 406.5 1.871
read circuitry

Table 2. Power, delay, and energy details of write operation


Design Write delay (ps) Write power (nW) Write energy (zj)
Existing design with conventional 8T SRAM [7] 62.85 1.579 0.099
Proposed design with SRAM using transmission gate 60.7 1.459 0.088
based read circuitry

Additionally, static noise margin (SNM) of the transmission gate-based SRAM cell has 209.585 mv
whereas the conventional SRAM has the SNM as 192.79 mv. That means 9% increase in the noise margin.
Greater the noise margin, better will be the design. Hence the half subtractor was implemented and it can be
used in the computing system as ALU and memory array both, so it has wider application in the computing
system. The transmission gate based read circuitry incorporated with the CIM will significantly reduce the
delay. Optimizing the power and delay improves overall efficiency, allowing the system to perform more
effectively while consuming less energy. These factors together enhance the design’s performance, making it
faster and more efficient.

4. CONCLUSION
In the field of very large scale integration (VLSI) design, power, and delay optimization are
fundamental challenges that drive both innovation and practical implementations, especially in the
development of energy-efficient and compact devices. The choice of state of art transmission gate based read
circuitry for 8T SRAM cell has enhanced the performance in of computation in-memory in terms of both area
and delay. It was discovered that the latch-based sense amplifies worked well for detecting and amplifying
the little variations in the bit line signal. The finest sense amplifiers in terms of speed turned out to be latch-
based. It makes the amplifier faster since it has significant positive feedback. The complete half-subtractor
functionality has been realized using NOR gates completely and those are mapped using the SRAM array to
get its functionality for in-memory computation. This design has been implemented using Cadence Virtuoso
in 180 nm technology. It has been observed that the delay produced by the proposed work is reduced by 53%
when compared to conventional design during read operation. Similarly, the delay has been reduced by 4.4%
during write operation. The power consumed by the circuit has also been reduced by 3% and 8.6% during
read and write operation. Further the design can be extended to other higher circuits such as multipliers,
dividers, and other combinational circuits which can be realized using CIM and ultimately, the complete
Von-Neumann architecture can be replaced by the in-memory computation architecture.

REFERENCES
[1] S. Jeloka, N. B. Akesh, D. Sylvester, and D. Blaauw, “A 28 nm configurable memory (TCAM/BCAM/SRAM) using push-rule 6T
Bit Cell enabling logic-in-memory,” IEEE Journal of Solid-State Circuits, vol. 51, no. 4, pp. 1009–1021, Apr. 2016, doi:
10.1109/JSSC.2016.2515510.
[2] N. Shylashree, Y. D. Vahvale, N. Praveena, and A. S. Mamatha, “Design and implementation of 64-bit SRAM and CAM on
Cadence and open-source environment,” International Journal of Circuits, Systems and Signal Processing, vol. 15, pp. 586–594,
Jul. 2021, doi: 10.46300/9106.2021.15.65.
[3] P. P. Ravichandiran and P. D. Franzon, “A review of 3D-dynamic random-access memory based near-memory computation,” in
2021 IEEE International 3D Systems Integration Conference (3DIC), IEEE, Oct. 2021, pp. 1–6. doi:
10.1109/3DIC52383.2021.9687615.
[4] A. Bhaskar, “Design and analysis of low power SRAM cells,” in 2017 Innovations in Power and Advanced Computing
Technologies (i-PACT), IEEE, Apr. 2017, pp. 1–5. doi: 10.1109/IPACT.2017.8244888.
[5] J. Zhang, Z. Wang, and N. Verma, “In-memory computation of a machine-learning classifier in a standard 6T SRAM array,”
IEEE Journal of Solid-State Circuits, vol. 52, no. 4, pp. 915–924, Apr. 2017, doi: 10.1109/JSSC.2016.2642198.
A fast half-subtractor using 8T static random access memory for in-memory … (Deepika Prabhakar)
280  ISSN: 2089-4864

[6] V. Aswini, S. Musala, and A. Srinivasulu, “Transmission gate-based 8T SRAM cell for biomedical applications,” in 2021 12th
International Symposium on Advanced Topics in Electrical Engineering (ATEE), IEEE, Mar. 2021, pp. 1–7. doi:
10.1109/ATEE52255.2021.9425314.
[7] A. K. Rajput and M. Pattanaik, “Implementation of boolean and arithmetic functions with 8T SRAM cell for In-memory
computation,” in 2020 International Conference for Emerging Technology (INCET), IEEE, Jun. 2020, pp. 1–5. doi:
10.1109/INCET49848.2020.9154137.
[8] J. Han and Y. Kim, “A fast half adder using 8T SRAM for computation-in-memory,” in 2021 IEEE International Conference on
Consumer Electronics-Asia, ICCE-Asia 2021, 2021, doi: 10.1109/ICCE-Asia53811.2021.9641964.
[9] N. Verma et al., “In-memory computing: advances and prospects,” IEEE Solid-State Circuits Magazine, vol. 11, no. 3, pp. 43–55,
2019, doi: 10.1109/MSSC.2019.2922889.
[10] B. Wicht, T. Nirschl, and D. Schmitt-Landsiedel, “Yield and speed optimization of a latch-type voltage sense amplifier,” IEEE
Journal of Solid-State Circuits, vol. 39, no. 7, pp. 1148–1158, Jul. 2004, doi: 10.1109/JSSC.2004.829399.
[11] A. Jaiswal, I. Chakraborty, A. Agrawal and K. Roy, “8T SRAM Cell as a multibit dot-product engine for beyond Von Neumann
computing,” IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 27, no. 11, pp. 2556-2567, Nov. 2019, doi:
10.1109/TVLSI.2019.2929245.
[12] S. Jain, A. Ranjan, K. Roy, and A. Raghunathan, “Computing in memory with spin-transfer torque magnetic RAM,” IEEE
Transactions on Very Large Scale Integration (VLSI) Systems, vol. 26, no. 3, pp. 470–483, Mar. 2018, doi:
10.1109/TVLSI.2017.2776954.
[13] A. Agrawal, A. Jaiswal, C. Lee, and K. Roy, “X-SRAM: enabling in-memory boolean computations in CMOS static random
access memories,” IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 65, no. 12, pp. 4219–4232, Dec. 2018, doi:
10.1109/TCSI.2018.2848999.
[14] J. Mu and B. Kim, “A 65nm logic-compatible embedded and flash memory for in-memory computation of artificial neural
networks,” in 2020 IEEE International Symposium on Circuits and Systems (ISCAS), IEEE, Oct. 2020, pp. 1–4. doi:
10.1109/ISCAS45731.2020.9181104.
[15] A. Manna and V. S. K. Bhaaskaran, “Improved read noise margin characteristics for single bit line SRAM cell using adiabatically
operated word line,” in 2017 International Conference on Nextgen Electronic Technologies: Silicon to Software (ICNETS2),
IEEE, Mar. 2017, pp. 385–393. doi: 10.1109/ICNETS2.2017.8067965.
[16] L. Ammoura, M. L. Flottes, P. Girard, and A. Virazel, “Preliminary defect analysis of 8T SRAM cells for in-memory computing
architectures,” in 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS),
IEEE, Jun. 2021, pp. 1–4. doi: 10.1109/DTIS53253.2021.9505101.
[17] M. Kutila, A. Paasio, and T. Lehtonen, “Comparison of 130 nm technology 6T and 8T SRAM cell designs for Near-Threshold
operation,” in 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS), IEEE, Aug. 2014, pp.
925–928. doi: 10.1109/MWSCAS.2014.6908567.
[18] W. Choi, J. Park, and G. Kang, “Dynamic stability estimation for latch-type voltage sense amplifier,” in 2014 International SoC
Design Conference (ISOCC), IEEE, Nov. 2014, pp. 218–219. doi: 10.1109/ISOCC.2014.7087614.
[19] P. Athe and S. Dasgupta, “A comparative study of 6T, 8T and 9T decanano SRAM cell,” in 2009 IEEE Symposium on Industrial
Electronics & Applications, IEEE, Oct. 2009, pp. 889–894. doi: 10.1109/ISIEA.2009.5356318.
[20] T. Nguyen, K. Ngo, N. Trinh, B. Bui, L. Tran, and H. Trang, “Efficient TCAM design based on dual port SRAM on FPGA,”
Indonesian Journal of Electrical Engineering and Computer Science, vol. 22, no. 1, pp. 104–112, 2021, doi:
10.11591/ijeecs.v21.i4.pp104-112.
[21] B.-D. Yang and L.-S. Kim, “A low-power SRAM using hierarchical bit line and local sense amplifiers,” IEEE Journal of Solid-
State Circuits, vol. 40, no. 6, pp. 1366–1376, Jun. 2005, doi: 10.1109/JSSC.2005.848032.
[22] Y. Tsiatouhas, Y. Moisiadis, A. Arapoyanni, and A. Chrisanthopoulos, “Comparative study of different current mode sense
amplifiers in submicron CMOS technology,” IEE Proceedings - Circuits, Devices and Systems, vol. 149, no. 3, pp. 154–158, Jun.
2002, doi: 10.1049/ip-cds:20020425.
[23] T. Na, S.-H. Woo, J. Kim, H. Jeong, and S.-O. Jung, “Comparative study of various latch-type sense amplifiers,” IEEE
Transactions on Very Large Scale Integration (VLSI) Systems, vol. 22, no. 2, pp. 425–429, Feb. 2014, doi:
10.1109/TVLSI.2013.2239320.
[24] J. Mu and B. Kim, “A 65nm logic-compatible embedded and flash memory for in-memory computation of artificial neural
networks,” in 2020 IEEE International Symposium on Circuits and Systems (ISCAS), Seville, Spain, 2020, pp. 1-4, doi:
10.1109/ISCAS45731.2020.9181104.
[25] A. Agrawal, A. Jaiswal, C. Lee, and K. Roy, “X-SRAM: enabling in-memory boolean computations in CMOS static random
access memories,” IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 65, no. 12, pp. 4219-4232, Dec. 2018, doi:
10.1109/TCSI.2018.2848999.

BIOGRAPHIES OF AUTHORS

Deepika Prabhakar is a part-time research scholar in the Department of


Electronics and Communication Engineering at RV College of Engineering (Affiliated to VTU
Belagavi), Bengaluru and also, she is currently working as an Assistant Professor in the
Department of Electronics and Communication Engineering at RV College of engineering,
Bangalore. She has 10 years of teaching experience. Her areas of interest are low power VLSI,
digital design, and Verilog HDL. She has completed B.E. and M.Tech. from VTU in the years
2010 and 2012- respectively. She can be contacted at email: deepikaprabhakar@rvce.edu.in.

Int J Reconfigurable & Embedded Syst, Vol. 14, No. 1, March 2025: 273-281
Int J Reconfigurable & Embedded Syst ISSN: 2089-4864  281

Nagaraja Shylashree is currently working as Associate Professor in the


Department of Electronics and Communication Engineering at RV College of Engineering,
Bengaluru. She is having 15 years of teaching experience. She was a recipient of the best Ph.D.
thesis award for the year 2016-2017 in electronics and communication engineering from
BITES. She has received the best IEEE researcher award in IEEE-AGM meeting held during
2021 from Bangalore IEEE section. She has also received the best paper award in IEEE-
ICERECT held during 2015 at Mandya. She has research publication in 20 International
Journals (out of which 8 journals are Springer-SCI journals), 6 Springer book chapters and 9
International conferences. She received one US patent grant, one German patent grant, one
Indian patent grant and published one Indian patent in the area of cryptography. She has also
received 2 Indian patent grants in the area of VLSI. She is also the co-author of the network
theory, engineering statistics and linear Algebra, and control engineering textbook. She has
funded projects consultancy projects and has delivered many technical talks on VLSI. She has
delivered lectures as a subject matter expert in VTU e-Shikshana and EDUSAT Program. She
is a recipient of international travel grant under SERB young research scholar category. She is
a life member of ISTE, IETE, fellow member of ISVE, senior member of IEEE, and IEEE
CAS Execom member. Her areas of interest include cryptography network security, network
analysis, analysis and design of digital circuits, digital VLSI design, analog mixed mode VLSI
design, low power VLSI design, statistics and linear algebra, and control engineering. She can
be contacted at email: shylashreen@rvce.edu.in.

Sunitha Yariyur Narasimhaiah is currently working as Assistant Professor in


the Department of Electronics and Communication Engineering at SJB Institute of
Technology, Bengaluru. She is having 17 years of teaching experience. She has completed her
M.Tech. and Ph.D. from VTU, Belagavi in the year 2003 and 2020 respectively. Her areas of
interest are machine learning algorithm implemented for image fusion applications. She can be
contacted at email: sunithayn@sjbit.edu.in.

Yashaswini Biligere Mariswamappa is currently working as an Assistant


Professor in the Department of Electronics and Communication Engineering at JSS Academy
of Technical Education, Bengaluru. She is having 2 years of teaching experience. She has
completed her B.E. from Sri Jayachamarajendra College of Engineering, Mysore in the year
2018 and M.Tech. from RVCE, Bengaluru in the year 2020. Her areas of interest are signal
and image processing, machine learning, and embedded system. She can be contacted at email:
yashaswinibm@jssateb.ac.in.

Sheetal Singrihalli Hemaraj received her B.E. degree in electronics and


communication engineering at Visvesvaraya Technological University, and her M.Tech. in
VLSI design and embedded systems at RV College of Engineering, India. She is a student. Her
research lines are CPU core verification and memory in-computation. She can be contacted at
email: sheetalsh62@gmail.com.

A fast half-subtractor using 8T static random access memory for in-memory … (Deepika Prabhakar)

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