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Magnetoresistive Random Access Memory (MRAM)

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MRAM is a type of non-volatile memory that uses electron spin to store information. It has advantages like infinite endurance, high speed performance, and non-volatility.

MRAM is a memory technology that uses electron spin to store information. It uses magnetism rather than electrical power to store bits of data and does not require refreshing to retain the data.

The different types of magnetoresistance discussed are giant magnetoresistance (GMR), tunnel magnetoresistance (TMR), and spin valve GMR. GMR and TMR utilize thin films of ferromagnetic and non-magnetic materials while spin valve GMR uses a hard layer, soft layer, and thin non-ferromagnetic spacer.

Magnetoresistive Random

Access Memory (MRAM)

Presented By

Y. Janardhan Reddy (06-555)


List of Contents
• Magnetic Core RAM
• History
• Characteristics
• Magnetoresistance
• Giant Magnetoresistance (GMR)
• Tunnel Magnetoresistance (TMR)
• Spin Valve
• MRAM
• Fixed Layer
• Reading Process
• Writing Process
• Other RAM Technologies
• MRAM Vs Other RAM Technologies
• Future MRAM Improvements
• MRAM Status
Magnetic RAM

MRAM is memory technology that uses electron spin to store


information

• MRAM uses magnetism rather than electrical power to store


bits of data.
• No refresh is needed to retain the data.
• For users of laptops and other mobile devices, such as MP3
players and cell phones, MRAM is the holy grail of longer
battery life.
Magnetic Core RAM

By the early 1960’s, Magnetic Core RAM became largely


universal as main memory, replacing drum memory
Magnetic Core RAM

• The memory cells consist


of wired threaded tiny
ferrite rings (cores).

• X and Y lines to apply


the magnetic filed.

• Sense/Inhibit line to
‘read’ the current pulse
when the polarization of
the magnetic field changes.
History
• 2003 - A 128 Kbit MRAM chip was introduced, manufactured with
a 180 nm lithographic process

• 2004 - Infineon unveiled a 16-Mbit prototype, manufactured with a


180 nm lithographic process

•2005 - Sony announced the first lab-produced spin-torque-transfer


MRAM

• 2007 - Tohoku University and Hitachi developed a prototype 2


Mbit Non-Volatile RAM Chip employing spin-transfer torque
switching

• 2008 - Scientists in Germany have developed next-generation


MRAM that is said to operate with write cycles under 1 ns.

• 2009 - Hitachi and Tohoku University demonstrated a 32-Mbit


spin-transfer torque RAM (SPRAM)
Characteristics

• Non-volatility

• Infinite endurance

• High speed performance

• Low cost
Giant Magnetoresistance (GMR)

Two thin films of altering


ferromagnetic materials
and a non-magnetic layer-
spacer.

R R  R
GMR(%)  
R R
Tunnel Magnetoresistance (TMR)

Two thin films of altering


ferromagnetic materials
and an insulating spacer.

Fe/MgO/Fe junctions reach over 200% decrease in


electrical resistance at room temperature 

600 (room temperature)-1100 (4.2 K) % TMR at


junctions of CoFeB/MgO/CoFeB
Spin Valve GMR
• Hard layer: magnetization is
fixed.

• Soft layer: magnetization is free


to rotate.

• Thin non-ferromagnetic spacer


~3 nm.

• Spacer material Cu (copper) and


ferromagnetic layers NiFe
(permalloy).

• This configuration used in hard


drives.
Magnetic Tunnel Junction (MTJ)

Commonly used insulating materials are Aluminum oxide


(Al O ) and crystalline Magnesium oxide (MgO)
Magnetic RAM Architecture


MRAM

One of the two plates is a permanent magnet set to a particular


polarity, the other's field will change to match that of an external
field.
MRAM: Fixed layer

The bottom layers give an effect of fixed (pinned) layer due to


interlayer exchange coupling between ferromagnetic and spacer
layer of synthetic antiferromagnetic.
Reading process
 An MRAM chip reads information by measuring the electrical
resistance of a specific cell that, in turn, depends upon the alignment
of the magnetic moments of the layers of the cell.

 To read a bit of information, a current is passed through the memory


cell.

 If the magnetic moments are in a parallel orientation, then the


detected resistance would be smaller than if they were in an anti-
parallel orientation.
MRAM: Reading process

• Transistor is “ON”

• Measuring of electrical
resistance of a small sense
current from a supply line
through the cell to the
ground.
Writing process
 Write is achieved by the alignment of the magnetic moments of the
two memory layers into one or the other relative orientation.

 Current is passed through two sets of parallel wires or write lines


(called a bit line and a digit or word line), which pass over and
beneath the memory cells, respectively

 To write to a particular memory cell (bit), current is passed through


the two wires that intersect at that memory cell.
MRAM: Writing process

• Transistor is “OFF” 

• When current is
passed through the write
lines, an induced
magnetic field is created
at the junction, which
alters the polarity of the
free layer.
MRAM: Writing process
• In order to change the
polarity of the free layer,
both fields are necessary.

• Only the bit in which


current is applied in both
hard and easy axis will be
written. The other bits will
remain half-select.
Other RAM Technologies
DRAM

Each bit of data is stored in a


separate capacitor within an
integrated circuit

Characteristics
• Volatile
• The highest density RAM
currently available
• The least expensive one
Other RAM Technologies
SRAM

Each bit is stored on four


transistors that form two
cross-coupled inverters

Characteristics
• Expensive
• Volatile & Fast
• Low power consumption
• Less dense than DRAM
Other RAM Technologies
Flash RAM

Stores information in an array


of memory cells made from
floating-gate transistors
Characteristics
• Cheap
• Non-volatile
• Slow
• Limited endurance
Comparison Table

• Credit: http://www.tfot.info/
MRAM Vs Other RAM Technologies

MRAM combines the


best characteristics of
DRAM, SRAM and
Flash RAM
Advantages

 Proposed uses for MRAM include devices such as:


◦ Aerospace and military systems

◦ Digital Cameras

◦ Notebooks

◦ Smart Cards

◦ Mobile Telephones

◦ Cellular base stations

◦ Personal Computers
Future MRAM Improvements

Thermal Assisted Switching

• Solves the first-generation


selectivity and stability
problems

• Cost-effective and scalable


memory technology to at least
the 32nm node
Future MRAM Improvements

Spin Torque Transfer

• No applied magnetic field


• Utilizes heavily spin polarized
current
• The magnetization of nano-
elements is flipped back and forth
• Still has challenges in basic
physics and materials to overcome
Any Queries??
Thank you…

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