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Fixed origin corner square inspection layout regularity metric

Published: 12 March 2012 Publication History

Abstract

Integrated circuits suffer from serious layout printability issues associated to the lithography manufacturing process. Regular layout designs are emerging as alternative solutions to help reducing these systematic subwavelength lithography variations. However, there is no metric to evaluate and compare the layout regularity of those regular designs and there is no methodology to link layout regularity to the reduction of process variations. In this paper we propose a new layout regularity metric called Fixed Origin Corner Square Inspection (FOCSI). We also provide a methodology using the Monte Carlo analysis to evaluate and understand the impact of regularity on process variability.

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cover image ACM Conferences
DATE '12: Proceedings of the Conference on Design, Automation and Test in Europe
March 2012
1690 pages
ISBN:9783981080186

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EDA Consortium

San Jose, CA, United States

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Published: 12 March 2012

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DATE '12
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  • The Russian Academy of Sciences
DATE '12: Design, Automation and Test in Europe
March 12 - 16, 2012
Dresden, Germany

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