Title:Double-blind test program for astrometric planet detection with Gaia

Abstract: We use detailed simulations of the Gaia observations of synthetic planetary systems and develop and utilize independent software codes in double-blind mode to analyze the data, including statistical tools for planet detection and different algorithms for single and multiple Keplerian orbit fitting that use no a priori knowledge of the true orbital parameters of the systems. 1) Planets with astrometric signatures $\alpha\simeq 3$ times the single-measurement error $\sigma_\psi$ and period $P\leq 5$ yr can be detected reliably, with a very small number of false positives. 2) At twice the detection limit, uncertainties in orbital parameters and masses are typically $15%-20%$. 3) Over 70% of two-planet systems with well-separated periods in the range $0.2\leq P\leq 9$ yr, $2\leq\alpha/\sigma_\psi\leq 50$, and eccentricity $e\leq 0.6$ are correctly identified. 4) Favorable orbital configurations have orbital elements measured to better than 10% accuracy $> 90%$ of the time, and the value of the mutual inclination angle determined with uncertainties $\leq 10^{\degr}$. 5) Finally, uncertainties obtained from the fitting procedures are a good estimate of the actual errors. Extrapolating from the present-day statistical properties of the exoplanet sample, the results imply that a Gaia with $\sigma_\psi$ = 8 $\mu$as, in its unbiased and complete magnitude-limited census of planetary systems, will measure several thousand giant planets out to 3-4 AUs from stars within 200 pc, and will characterize hundreds of multiple-planet systems, including meaningful coplanarity tests. Finally, we put Gaia into context, identifying several areas of planetary-system science in which Gaia can be expected to have a relevant impact, when combined with data coming from other ongoing and future planet search programs.