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Condensed Matter > Materials Science

arXiv:1203.2372 (cond-mat)
[Submitted on 11 Mar 2012 (v1), last revised 8 May 2012 (this version, v2)]

Title:An accurate measurement of electron beam induced displacement cross sections for single-layer graphene

Authors:J. C. Meyer, F. Eder, S. Kurasch, V. Skakalova, J. Kotakoski, H.-J. Park, S. Roth, A. Chuvilin, S. Eyhusen, G. Benner, A. V. Krasheninnikov, U. Kaiser
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Abstract:We present an accurate measurement and a quantitative analysis of electron-beam induced displacements of carbon atoms in single-layer graphene. We directly measure the atomic displacement ("knock-on") cross section by counting the lost atoms as a function of the electron beam energy and applied dose. Further, we separate knock-on damage (originating from the collision of the beam electrons with the nucleus of the target atom) from other radiation damage mechanisms (e.g. ionization damage or chemical etching) by the comparison of ordinary (12C) and heavy (13C) graphene. Our analysis shows that a static lattice approximation is not sufficient to describe knock-on damage in this material, while a very good agreement between calculated and experimental cross sections is obtained if lattice vibrations are taken into account.
Comments: 10 pages including supplementary info
Subjects: Materials Science (cond-mat.mtrl-sci)
Cite as: arXiv:1203.2372 [cond-mat.mtrl-sci]
  (or arXiv:1203.2372v2 [cond-mat.mtrl-sci] for this version)
  https://doi.org/10.48550/arXiv.1203.2372
Journal reference: Phys. Rev. Lett. 108, 196102 (2012)
Related DOI: https://doi.org/10.1103/PhysRevLett.108.196102

Submission history

From: Jannik Meyer [view email]
[v1] Sun, 11 Mar 2012 20:40:04 UTC (38,377 KB)
[v2] Tue, 8 May 2012 15:16:08 UTC (2,311 KB)
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