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Condensed Matter > Materials Science

arXiv:2311.03634v1 (cond-mat)
[Submitted on 7 Nov 2023 (this version), latest version 22 May 2024 (v3)]

Title:Shortcomings of using the SCAN functional for point defects and polarons in semiconductors

Authors:Darshana Wickramaratne, John L. Lyons
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Abstract:We find the recently developed strongly constrained and appropriately normalized (SCAN) functional, now widely used in calculations of many materials, is not able to reliably describe the properties of deep defects and small polarons in several semiconductors and insulators. These shortcomings are due to a failure to identify the large structural distortions and charge localization that accompanies the presence of defects and the formation of small polarons. Our results indicate the SCAN functional is insufficient to yield quantitative and qualitatively accurate results for defect calculations.
Comments: 6 pages, 3 figures
Subjects: Materials Science (cond-mat.mtrl-sci)
Cite as: arXiv:2311.03634 [cond-mat.mtrl-sci]
  (or arXiv:2311.03634v1 [cond-mat.mtrl-sci] for this version)
  https://doi.org/10.48550/arXiv.2311.03634

Submission history

From: Darshana Wickramaratne [view email]
[v1] Tue, 7 Nov 2023 00:43:39 UTC (1,048 KB)
[v2] Wed, 28 Feb 2024 00:56:52 UTC (1,233 KB)
[v3] Wed, 22 May 2024 02:51:58 UTC (2,022 KB)
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