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Hard X-ray grazing incidence ptychography: Large field-of-view nanostructure imaging with ultra-high surface sensitivity
Authors:
P. S. Jørgensen,
L. Besley,
A. M. Slyamov,
A. Diaz,
M. Guizar-Sicairos,
M. Odstrcil,
M. Holler,
C. Silvestre,
B. Chang,
C. Detlefs,
J. W. Andreasen
Abstract:
We demonstrate a technique that allows highly surface sensitive imaging of nanostructures on planar surfaces over large areas, providing a new avenue for research in materials science, especially for \textit{in situ} applications. The capabilities of hard X-ray grazing incidence ptychography combine aspects from imaging, reflectometry and grazing incidence small angle scattering in providing large…
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We demonstrate a technique that allows highly surface sensitive imaging of nanostructures on planar surfaces over large areas, providing a new avenue for research in materials science, especially for \textit{in situ} applications. The capabilities of hard X-ray grazing incidence ptychography combine aspects from imaging, reflectometry and grazing incidence small angle scattering in providing large field-of-view images with high resolution transverse to the beam, horizontally and along the surface normal. Thus, it yields data with resolutions approaching electron microscopy, in two dimensions, but over much larger areas and with a poorer resolution in the third spatial dimension, along the beam propagation direction. Similar to grazing incidence small angle X-ray scattering, this technique facilitates the characterization of nanostructures across statistically significant surface areas or volumes within potentially feasible time frames for \textit{in situ} experiments, while also providing spatial information.
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Submitted 4 July, 2023;
originally announced July 2023.
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Magnetic Field Prediction Using Generative Adversarial Networks
Authors:
Stefan Pollok,
Nataniel Olden-Jørgensen,
Peter Stanley Jørgensen,
Rasmus Bjørk
Abstract:
Plenty of scientific and real-world applications are built on magnetic fields and their characteristics. To retrieve the valuable magnetic field information in high resolution, extensive field measurements are required, which are either time-consuming to conduct or even not feasible due to physical constraints. To alleviate this problem, we predict magnetic field values at a random point in space…
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Plenty of scientific and real-world applications are built on magnetic fields and their characteristics. To retrieve the valuable magnetic field information in high resolution, extensive field measurements are required, which are either time-consuming to conduct or even not feasible due to physical constraints. To alleviate this problem, we predict magnetic field values at a random point in space from a few point measurements by using a generative adversarial network (GAN) structure. The deep learning (DL) architecture consists of two neural networks: a generator, which predicts missing field values of a given magnetic field, and a critic, which is trained to calculate the statistical distance between real and generated magnetic field distributions. By minimizing this statistical distance, a reconstruction loss as well as physical losses, our trained generator has learned to predict the missing field values with a median reconstruction test error of 5.14%, when a single coherent region of field points is missing, and 5.86%, when only a few point measurements in space are available and the field measurements around are predicted. We verify the results on an experimentally validated field.
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Submitted 14 March, 2022;
originally announced March 2022.
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Non-destructive determination of phase, size, and strain of individual grains in polycrystalline photovoltaic materials
Authors:
Mariana Mar Lucas,
Tiago Ramos,
Peter S. Jørgensen,
Stela Canulescu,
Peter Kenesei,
Jonathan Wright,
Henning F. Poulsen,
Jens W. Andreasen
Abstract:
We demonstrate a non-destructive approach to provide structural properties on the grain level for the absorber layer of kesterite solar cells. Kesterite solar cells are notoriously difficult to characterize structurally due to the co-existence of several phases with very similar lattice parameters. Specifically, we present a comprehensive study of 597 grains in the absorber layer of a 1.64% effici…
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We demonstrate a non-destructive approach to provide structural properties on the grain level for the absorber layer of kesterite solar cells. Kesterite solar cells are notoriously difficult to characterize structurally due to the co-existence of several phases with very similar lattice parameters. Specifically, we present a comprehensive study of 597 grains in the absorber layer of a 1.64% efficient Cu2ZnSnS4 (CZTS) thin-film solar cell, from which 15 grains correspond to the secondary phase ZnS. By means of three dimensional X-ray diffraction (3DXRD), we obtained statistics for the phase, size, orientation, and strain tensors of the grains, as well as their twin relations. We observe an average tensile stress in the plane of the film of ~ 70 MPa and a compressive stress along the normal to the film of ~ 145 MPa. At the grain level, we derive a 3D stress tensor that deviates from the biaxial model usually assumed for thin films. 41% of the grains are twins. We calculate the frequency of the six types of $Σ$3 boundaries, revealing that 180° rotations along axis <221> is the most frequent. This technique can be applied to polycrystalline thin film solar cells in general, where strain can influence the bandgap of the absorber layer material, and twin boundaries play a role in the charge transport mechanisms.
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Submitted 23 December, 2020;
originally announced December 2020.
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A Physical Model for Microstructural Characterization and Segmentation of 3D Tomography Data
Authors:
Elise Otterlei Brenne,
Vedrana Andersen Dahl,
Peter Stanley Jørgensen
Abstract:
We present a novel method for characterizing the microstructure of a material from volumetric datasets such as 3D image data from computed tomography (CT). The method is based on a new statistical model for the distribution of voxel intensities and gradient magnitudes, incorporating prior knowledge about the physical nature of the imaging process. It allows for direct quantification of parameters…
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We present a novel method for characterizing the microstructure of a material from volumetric datasets such as 3D image data from computed tomography (CT). The method is based on a new statistical model for the distribution of voxel intensities and gradient magnitudes, incorporating prior knowledge about the physical nature of the imaging process. It allows for direct quantification of parameters of the imaged sample like volume fractions, interface areas and material density, and parameters related to the imaging process like image resolution and noise levels.
Existing methods for characterization from 3D images often require segmentation of the data, a procedure where each voxel is labeled according to the best guess of which material it represents. Through our approach, the segmentation step is circumvented so that errors and computational costs related to this part of the image processing pipeline are avoided. Instead, the material parameters are quantified through their known relation to parameters of our model which is fitted directly to the raw, unsegmented data. We present an automated model fitting procedure that gives reproducible results without human bias and enables automatic analysis of large sets of tomograms.
For more complex structure analysis questions, a segmentation is still beneficial. We show that our model can be used as input to existing probabilistic methods, providing a segmentation that is based on the physics of the imaged sample. Because our model accounts for mixed-material voxels stemming from blurring inherent to the imaging technique, we reduce the errors that other methods can create at interfaces between materials.
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Submitted 4 January, 2021; v1 submitted 15 September, 2020;
originally announced September 2020.
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A TEM study of morphological and structural degradation phenomena in LiFePO4-CB cathodes
Authors:
Duc-The Ngo,
Roberto Scipioni,
Søren Bredmose Simonsen,
Peter Stanley Jørgensen,
Søren Højgaard Jensen
Abstract:
LiFePO4-based cathodes suffer from various degradation mechanisms which influences the battery performance. In this paper morphological and structural degradation phenomena in laboratory cathodes made of LiFePO4 (LFP) mixed with carbon black (CB) in an 1 mol L-1 LiPF6 in EC:DMC (1:1 by weight) electrolyte are investigated by transmission electron microscopy (TEM) at various preparation, assembling…
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LiFePO4-based cathodes suffer from various degradation mechanisms which influences the battery performance. In this paper morphological and structural degradation phenomena in laboratory cathodes made of LiFePO4 (LFP) mixed with carbon black (CB) in an 1 mol L-1 LiPF6 in EC:DMC (1:1 by weight) electrolyte are investigated by transmission electron microscopy (TEM) at various preparation, assembling, storage and cycling stages. High-resolution TEM (HRTEM) imaging shows that continuous SEI layers are formed on the LFP particles and that both storage and cycling affects the formation. Additionally loss of CB crystallinity, CB aggregation and agglomeration is observed. Charge-discharge curves and impedance spectra measured during cycling confirm that these degradation mechanisms reduce the cathode conductivity and capacity.
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Submitted 6 December, 2016; v1 submitted 18 May, 2016;
originally announced May 2016.
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In situ characterization of delamination and crack growth of a CGO-LSM multi-layer ceramic sample investigated by X-ray tomographic microscopy
Authors:
R. Bjørk,
V. Esposito,
E. M. Lauridsen,
P. S. Jørgensen,
J. L. Fife,
K. B. Andersen,
S. P. V. Foghmoes,
N. Pryds
Abstract:
The densification, delamination and crack growth behavior in a Ce$_{0.9}$Gd$_{0.1}$O$_{1.95}$ (CGO) and (La$_{0.85}$Sr$_{0.15})_{0.9}$MnO$_{3}$ (LSM) multi-layer ceramic sample was studied using in situ X-ray tomographic microscopy (microtomography), to investigate the critical dynamics of crack propagation and delamination in a multilayered sample. Naturally occurring defects, caused by the sampl…
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The densification, delamination and crack growth behavior in a Ce$_{0.9}$Gd$_{0.1}$O$_{1.95}$ (CGO) and (La$_{0.85}$Sr$_{0.15})_{0.9}$MnO$_{3}$ (LSM) multi-layer ceramic sample was studied using in situ X-ray tomographic microscopy (microtomography), to investigate the critical dynamics of crack propagation and delamination in a multilayered sample. Naturally occurring defects, caused by the sample preparation process, are shown not to be critical in sample degradation. Instead defects are nucleated during the debinding step. Crack growth is significantly faster along the material layers than perpendicular to them, and crack growth and delamination only accelerates when sintering occurs.
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Submitted 8 September, 2014;
originally announced September 2014.
