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Structured illumination microscopy with extreme ultraviolet pulses
Authors:
R. Mincigrucci,
E. Paltanin,
J. -S. Pelli-Cresi,
F. Gala,
E. Pontecorvo,
L. Foglia,
D. De Angelis,
D. Fainozzi,
A. Gessini,
D. S. P. Molina,
O. Stranik,
F. Wechsler,
R. Heintzmann,
G. Ruocco,
F. Bencivenga,
C. Masciovecchio
Abstract:
The relentless pursuit of understanding matter at ever-finer scales has pushed optical microscopy to surpass the diffraction limit and produced the super-resolution microscopy which enables visualizing structures shorter than the wavelength of light. In the present work, we harnessed extreme ultraviolet beams to create a sub-μm grating structure, which was revealed by extreme ultraviolet structure…
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The relentless pursuit of understanding matter at ever-finer scales has pushed optical microscopy to surpass the diffraction limit and produced the super-resolution microscopy which enables visualizing structures shorter than the wavelength of light. In the present work, we harnessed extreme ultraviolet beams to create a sub-μm grating structure, which was revealed by extreme ultraviolet structured illumination microscopy. This achievement marks the first step toward extending such a super-resolution technique into the X-ray regime, where achieving atomic-scale resolution becomes a charming possibility.
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Submitted 28 March, 2024;
originally announced March 2024.
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Bayesian multi-exposure image fusion for robust high dynamic range ptychography
Authors:
Shantanu Kodgirwar,
Lars Loetgering,
Chang Liu,
Aleena Joseph,
Leona Licht,
Daniel S. Penagos Molina,
Wilhelm Eschen,
Jan Rothhardt,
Michael Habeck
Abstract:
The limited dynamic range of the detector can impede coherent diffractive imaging (CDI) schemes from achieving diffraction-limited resolution. To overcome this limitation, a straightforward approach is to utilize high dynamic range (HDR) imaging through multi-exposure image fusion (MEF). This method involves capturing measurements at different exposure times, spanning from under to overexposure an…
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The limited dynamic range of the detector can impede coherent diffractive imaging (CDI) schemes from achieving diffraction-limited resolution. To overcome this limitation, a straightforward approach is to utilize high dynamic range (HDR) imaging through multi-exposure image fusion (MEF). This method involves capturing measurements at different exposure times, spanning from under to overexposure and fusing them into a single HDR image. The conventional MEF technique in ptychography typically involves subtracting the background noise, ignoring the saturated pixels and then merging the acquisitions. However, this approach is inadequate under conditions of low signal-to-noise ratio (SNR). Additionally, variations in illumination intensity significantly affect the phase retrieval process. To address these issues, we propose a Bayesian MEF modeling approach based on a modified Poisson distribution that takes the background and saturation into account. To infer the model parameters, the expectation-maximization (EM) algorithm is employed. As demonstrated with synthetic and experimental data, our approach outperforms the conventional MEF method, offering superior phase retrieval under challenging experimental conditions. This work underscores the significance of robust multi-exposure image fusion for ptychography, particularly in imaging shot-noise-dominated weakly scattering specimens or in cases where access to HDR detectors with high SNR is limited. Furthermore, the applicability of the Bayesian MEF approach extends beyond CDI to any imaging scheme that requires HDR treatment. Given this versatility, we provide the implementation of our algorithm as a Python package.
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Submitted 10 June, 2024; v1 submitted 17 March, 2024;
originally announced March 2024.
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Broadband ptychography using curved wavefront illumination
Authors:
Daniel S. Penagos Molina,
Lars Loetgering,
Wilhelm Eschen,
Jens Limpert,
Jan Rothhardt
Abstract:
We examine the interplay between spectral bandwidth and illumination curvature in ptychography. By tailoring the divergence of the illumination, broader spectral bandwidths can be tolerated without requiring algorithmic modifications to the forward model. In particular, a strong wavefront curvature transitions a far-field diffreaction geometry to an effectively near-field one, which is lees affect…
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We examine the interplay between spectral bandwidth and illumination curvature in ptychography. By tailoring the divergence of the illumination, broader spectral bandwidths can be tolerated without requiring algorithmic modifications to the forward model. In particular, a strong wavefront curvature transitions a far-field diffreaction geometry to an effectively near-field one, which is lees affected by temporal coherence effects. The relaxed temporal coherence requirements allow for leveraging wider spectral bandwidths and larger illumination spots. Our findings open up new avenues towards utilizing pink and broadband beams for increased flux and throughput at both synchrotron facilities and lab-scale beamlines.
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Submitted 15 May, 2023;
originally announced May 2023.
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High-speed and wide-field nanoscale table-top ptychographic EUV imaging and beam characterization with a sCMOS detector
Authors:
Wilhelm Eschen,
Chang Liu,
Daniel S. Penagos Molina,
Robert Klas,
Jens Limpert,
Jan Rothhardt
Abstract:
We present high-speed and wide-field EUV ptychography at 13.5 nm wavelength using a table-top high-order harmonic source. By employing a scientific complementary metal oxide semiconductor (sCMOS) detector the scan time for sub-20 nm high-resolution measurements were significantly reduced by up to a factor of five. The fast frame rate of sCMOS enables wide-field imaging with a field of view of 100…
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We present high-speed and wide-field EUV ptychography at 13.5 nm wavelength using a table-top high-order harmonic source. By employing a scientific complementary metal oxide semiconductor (sCMOS) detector the scan time for sub-20 nm high-resolution measurements were significantly reduced by up to a factor of five. The fast frame rate of sCMOS enables wide-field imaging with a field of view of 100 μm x 100 μm with an imaging speed of 4.6 Mpix/h. Furthermore, fast EUV wavefront characterization is employed using a combination of the sCMOS detector with orthogonal probe relaxation.
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Submitted 26 January, 2023;
originally announced February 2023.
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PtyLab.m/py/jl: a cross-platform, open-source inverse modeling toolbox for conventional and Fourier ptychography
Authors:
Lars Loetgering,
Mengqi Du,
Dirk Boonzajer Flaes,
Tomas Aidukas,
Felix Wechsler,
Daniel S. Penagos Molina,
Max Rose,
Antonios Pelekanidis,
Wilhelm Eschen,
Jürgen Hess,
Thomas Wilhein,
Rainer Heintzmann,
Jan Rothhardt,
Stefan Witte
Abstract:
Conventional (CP) and Fourier (FP) ptychography have emerged as versatile quantitative phase imaging techniques. While the main application cases for each technique are different, namely lens-less short wavelength imaging for CP and lens-based visible light imaging for FP, both methods share a common algorithmic ground. CP and FP have in part independently evolved to include experimentally robust…
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Conventional (CP) and Fourier (FP) ptychography have emerged as versatile quantitative phase imaging techniques. While the main application cases for each technique are different, namely lens-less short wavelength imaging for CP and lens-based visible light imaging for FP, both methods share a common algorithmic ground. CP and FP have in part independently evolved to include experimentally robust forward models and inversion techniques. This separation has resulted in a plethora of algorithmic extensions, some of which have not crossed the boundary from one modality to the other. Here, we present an open source, cross-platform software, called PtyLab, enabling both CP and FP data analysis in a unified framework. With this framework, we aim to facilitate and accelerate cross-pollination between the two techniques. Moreover, the availability in Matlab, Python, and Julia will set a low barrier to enter each field.
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Submitted 16 January, 2023;
originally announced January 2023.