Ionic vs. van der Waals Layered Materials: Identification and Comparison of Elastic Anisotropy
Authors:
Robert McKinney,
Prashun Gorai,
Sukriti Manna,
Eric Toberer,
Vladan Stevanović
Abstract:
In this work, we expand the set of known layered compounds to include ionic layered materials, which are well known for superconducting, thermoelectric, and battery applications. Focusing on known ternary compounds from the ICSD, we screen for ionic layered structures by expanding upon our previously developed algorithm for identification of van der Waals (vdW) layered structures, thus identifying…
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In this work, we expand the set of known layered compounds to include ionic layered materials, which are well known for superconducting, thermoelectric, and battery applications. Focusing on known ternary compounds from the ICSD, we screen for ionic layered structures by expanding upon our previously developed algorithm for identification of van der Waals (vdW) layered structures, thus identifying over 1,500 ionic layered compounds. Since vdW layered structures can be chemically mutated to form ionic layered structures, we have developed a methodology to structurally link binary vdW to ternary ionic layered materials. We perform an in-depth analysis of similarities and differences between these two classes of layered systems and assess the interplay between layer geometry and bond strength with a study of the elastic anisotropy. We observe a rich variety of anisotropic behavior in which the layering direction alone is not a simple predictor of elastic anisotropy. Our results enable discovery of new layered materials through intercalation or de- intercalation of vdW or ionic layered systems, respectively, as well as lay the groundwork for studies of anisotropic transport phenomena such as sound propagation or lattice thermal conductivity.
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Submitted 26 May, 2018;
originally announced May 2018.
The First Synchrotron Infrared Beamlines at the ALS: Spectromicroscopy and Fast Timing
Authors:
Michael C. Martin,
Wayne R. McKinney
Abstract:
Two recently commissioned infrared beamlines on the 1.4 bending magnet port at the Advanced Light Source, LBNL, are described. Using a synchrotron as an IR source provides three primary advantages: increased brightness, very fast light pulses, and enhanced far-IR flux. The considerable brightness advantage manifests itself most beneficially when performing spectroscopy on a microscopic length sc…
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Two recently commissioned infrared beamlines on the 1.4 bending magnet port at the Advanced Light Source, LBNL, are described. Using a synchrotron as an IR source provides three primary advantages: increased brightness, very fast light pulses, and enhanced far-IR flux. The considerable brightness advantage manifests itself most beneficially when performing spectroscopy on a microscopic length scale. Beamline (BL) 1.4.3 is a dedicated FTIR spectromicroscopy beamline, where a diffraction-limited spot size using the synchrotron source is utilized. BL 1.4.2 consists of a vacuum FTIR bench with a wide spectral range and step-scan capability. This BL makes use of the pulsed nature of the synchrotron light as well as the far-IR flux. Fast timing is demonstrated by observing the pulses from the electron bunch storage pattern at the ALS. Results from several experiments from both IR beamlines will be presented as an overview of the IR research currently being done at the ALS.
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Submitted 23 November, 1999;
originally announced November 1999.
