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Showing 1–1 of 1 results for author: von Bischhoffshausen, J K

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  1. arXiv:2109.11304  [pdf, other

    cs.CV

    Deep Learning Strategies for Industrial Surface Defect Detection Systems

    Authors: Dominik Martin, Simon Heinzel, Johannes Kunze von Bischhoffshausen, Niklas Kühl

    Abstract: Deep learning methods have proven to outperform traditional computer vision methods in various areas of image processing. However, the application of deep learning in industrial surface defect detection systems is challenging due to the insufficient amount of training data, the expensive data generation process, the small size, and the rare occurrence of surface defects. From literature and a poly… ▽ More

    Submitted 23 September, 2021; originally announced September 2021.

    Comments: 55th Annual Hawaii International Conference on System Sciences (HICSS-55)