Measurements of the Cherenkov effect in direct detection of charged particles with SiPMs
Authors:
F. Carnesecchi,
B. Sabiu,
S. Strazzi,
G. Vignola,
N. Agrawal,
A. Alici,
P. Antonioli,
S. Arcelli,
F. Bellini,
D. Cavazza,
L. Cifarelli,
M. Colocci,
S. Durando,
F. Ercolessi,
D. Falchieri,
A. Ficorella,
C. Fraticelli,
M. Garbini,
M. Giacalone,
A. Gola,
D. Hatzifotiadou,
N. Jacazio,
A. Margotti,
G. Malfattore,
R. Nania
, et al. (12 additional authors not shown)
Abstract:
In this paper, different Silicon PhotoMultiplier (SiPM) sensors have been tested with charged particles to characterize the Cherenkov light produced in the sensor protection layer. A careful position scan of the SiPM response has been performed with different prototypes, confirming the large number of firing cells and proving almost full efficiency, with the SiPM filling factor essentially negligi…
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In this paper, different Silicon PhotoMultiplier (SiPM) sensors have been tested with charged particles to characterize the Cherenkov light produced in the sensor protection layer. A careful position scan of the SiPM response has been performed with different prototypes, confirming the large number of firing cells and proving almost full efficiency, with the SiPM filling factor essentially negligible. This study also allowed us to study the time resolution of such devices as a function of the number of firing cells, reaching values below 20 ps. These measurements provide significant insight into the capabilities of SiPM sensors in direct detection of charged particles and their potential for several applications.
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Submitted 28 May, 2023;
originally announced May 2023.
Understanding the direct detection of charged particles with SiPMs
Authors:
F. Carnesecchi,
G. Vignola,
N. Agrawal,
A. Alici,
P. Antonioli,
S. Arcelli,
F. Bellini,
D. Cavazza,
L. Cifarelli,
M. Colocci,
S. Durando,
F. Ercolessi,
A. Ficorella,
C. Fraticelli,
M. Garbini,
M. Giacalone,
A. Gola,
D. Hatzifotiadou,
N. Jacazio,
A. Margotti,
G. Malfattore,
R. Nania,
F. Noferini,
G. Paternoster,
O. Pinazza
, et al. (11 additional authors not shown)
Abstract:
In this paper evidence that the increased response of SiPM sensors to the passage of charged particles is related mainly to Cherenkov light produced in the protection layer is reported. The response and timing properties of sensors with different protection layers have been studied.
In this paper evidence that the increased response of SiPM sensors to the passage of charged particles is related mainly to Cherenkov light produced in the protection layer is reported. The response and timing properties of sensors with different protection layers have been studied.
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Submitted 20 October, 2022;
originally announced October 2022.
