-
Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series Measurements
Authors:
Marcel Schloz,
Thomas C. Pekin,
Hamish G. Brown,
Dana O. Byrne,
Bryan D. Esser,
Emmanuel Terzoudis-Lumsden,
Takashi Taniguchi,
Kenji Watanabe,
Scott D. Findlay,
Benedikt Haas,
Jim Ciston,
Christoph T. Koch
Abstract:
A detailed analysis of ptychography for 3D phase reconstructions of thick specimens is performed. We introduce multi-focus ptychography, which incorporates a 4D-STEM defocus series to enhance the quality of 3D reconstructions along the beam direction through a higher overdetermination ratio. This method is compared with established multi-slice ptychography techniques, such as conventional ptychogr…
▽ More
A detailed analysis of ptychography for 3D phase reconstructions of thick specimens is performed. We introduce multi-focus ptychography, which incorporates a 4D-STEM defocus series to enhance the quality of 3D reconstructions along the beam direction through a higher overdetermination ratio. This method is compared with established multi-slice ptychography techniques, such as conventional ptychography, regularized ptychography, and multi-mode ptychography. Additionally, we contrast multi-focus ptychography with an alternative method that uses virtual optical sectioning through a reconstructed scattering matrix ($\mathcal{S}$-matrix), which offers more precise 3D structure information compared to conventional ptychography. Our findings from multiple 3D reconstructions based on simulated and experimental data demonstrate that multi-focus ptychography surpasses other techniques, particularly in accurately reconstructing the surfaces and interface regions of thick specimens.
△ Less
Submitted 3 June, 2024;
originally announced June 2024.
-
Lossy Compression of Electron Diffraction Patterns for Ptychography via Change of Basis
Authors:
Anton Gladyshev,
Thomas C. Pekin,
Marcel Schloz,
Benedikt Haas,
Johannes Müller,
Christoph T. Koch
Abstract:
Ptychography is a computational imaging technique that has risen in popularity in the x-ray and electron microscopy communities in the past half decade. One of the reasons for this success is the development of new high performance electron detectors with increased dynamic range and readout speed, both of which are necessary for a successful application of this technique. Despite the advances made…
▽ More
Ptychography is a computational imaging technique that has risen in popularity in the x-ray and electron microscopy communities in the past half decade. One of the reasons for this success is the development of new high performance electron detectors with increased dynamic range and readout speed, both of which are necessary for a successful application of this technique. Despite the advances made in computing power, processing the recorded data remains a challenging task, and the growth in data rate has made the size of the resulting datasets a bottleneck for the whole process. Here we present an investigation into lossy compression methods for electron diffraction patterns that retain the necessary information for ptychographic reconstructions, yet lead to a decrease in data set size by three or four orders of magnitude. We apply several compression methods to both simulated and experimental data - all with promising results.
△ Less
Submitted 23 September, 2023; v1 submitted 14 November, 2022;
originally announced November 2022.
-
Deep Reinforcement Learning for Data-Driven Adaptive Scanning in Ptychography
Authors:
Marcel Schloz,
Johannes Müller,
Thomas C. Pekin,
Wouter Van den Broek,
Christoph T. Koch
Abstract:
We present a method that lowers the dose required for a ptychographic reconstruction by adaptively scanning the specimen, thereby providing the required spatial information redundancy in the regions of highest importance. The proposed method is built upon a deep learning model that is trained by reinforcement learning (RL), using prior knowledge of the specimen structure from training data sets. W…
▽ More
We present a method that lowers the dose required for a ptychographic reconstruction by adaptively scanning the specimen, thereby providing the required spatial information redundancy in the regions of highest importance. The proposed method is built upon a deep learning model that is trained by reinforcement learning (RL), using prior knowledge of the specimen structure from training data sets. We show that equivalent low-dose experiments using adaptive scanning outperform conventional ptychography experiments in terms of reconstruction resolution.
△ Less
Submitted 29 March, 2022;
originally announced March 2022.
-
Fast Grain Mapping with Sub-Nanometer Resolution Using 4D-STEM with Grain Classification by Principal Component Analysis and Non-Negative Matrix Factorization
Authors:
Frances I Allen,
Thomas C Pekin,
Arun Persaud,
Steven J Rozeveld,
Gregory F Meyers,
Jim Ciston,
Colin Ophus,
Andrew M Minor
Abstract:
High-throughput grain mapping with sub-nanometer spatial resolution is demonstrated using scanning nanobeam electron diffraction (also known as 4D scanning transmission electron microscopy, or 4D-STEM) combined with high-speed direct electron detection. An electron probe size down to 0.5 nm in diameter is implemented and the sample investigated is a gold-palladium nanoparticle catalyst. Computatio…
▽ More
High-throughput grain mapping with sub-nanometer spatial resolution is demonstrated using scanning nanobeam electron diffraction (also known as 4D scanning transmission electron microscopy, or 4D-STEM) combined with high-speed direct electron detection. An electron probe size down to 0.5 nm in diameter is implemented and the sample investigated is a gold-palladium nanoparticle catalyst. Computational analysis of the 4D-STEM data sets is performed using a disk registration algorithm to identify the diffraction peaks followed by feature learning to map the individual grains. Two unsupervised feature learning techniques are compared: Principal component analysis (PCA) and non-negative matrix factorization (NNMF). The characteristics of the PCA versus NNMF output are compared and the potential of the 4D-STEM approach for statistical analysis of grain orientations at high spatial resolution is discussed.
△ Less
Submitted 11 March, 2021;
originally announced March 2021.
-
py4DSTEM: a software package for multimodal analysis of four-dimensional scanning transmission electron microscopy datasets
Authors:
Benjamin H Savitzky,
Lauren A Hughes,
Steven E Zeltmann,
Hamish G Brown,
Shiteng Zhao,
Philipp M Pelz,
Edward S Barnard,
Jennifer Donohue,
Luis Rangel DaCosta,
Thomas C. Pekin,
Ellis Kennedy,
Matthew T Janish,
Matthew M Schneider,
Patrick Herring,
Chirranjeevi Gopal,
Abraham Anapolsky,
Peter Ercius,
Mary Scott,
Jim Ciston,
Andrew M Minor,
Colin Ophus
Abstract:
Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a full 2D image of the diffracted electron beam at each probe position, typically a 2D grid of probe positions. These 4D-STEM datasets are rich in information, in…
▽ More
Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a full 2D image of the diffracted electron beam at each probe position, typically a 2D grid of probe positions. These 4D-STEM datasets are rich in information, including signatures of the local structure, orientation, deformation, electromagnetic fields and other sample-dependent properties. However, extracting this information requires complex analysis pipelines, from data wrangling to calibration to analysis to visualization, all while maintaining robustness against imaging distortions and artifacts. In this paper, we present py4DSTEM, an analysis toolkit for measuring material properties from 4D-STEM datasets, written in the Python language and released with an open source license. We describe the algorithmic steps for dataset calibration and various 4D-STEM property measurements in detail, and present results from several experimental datasets. We have also implemented a simple and universal file format appropriate for electron microscopy data in py4DSTEM, which uses the open source HDF5 standard. We hope this tool will benefit the research community, helps to move the developing standards for data and computational methods in electron microscopy, and invite the community to contribute to this ongoing, fully open-source project.
△ Less
Submitted 20 March, 2020;
originally announced March 2020.
