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Design of narrowband infrared emitters by hybridizing guided-mode resonance structures with van der Waals materials
Authors:
Mehrdad Shokooh-Saremi,
Maxime Giteau,
Mitradeep Sarkar,
Georgia T. Papadakis
Abstract:
In this paper, narrowband emitters have been designed using particle swarm optimization (PSO) in the 10-20 μm infrared range. The device structure consists of an anisotropic α-MoO3 layer combined with the one- and two-dimensional guided-mode resonance structures. Well-defined absorption lines are present in the reflection spectrum for both TE and TM polarizations, thereby yielding narrowband emiss…
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In this paper, narrowband emitters have been designed using particle swarm optimization (PSO) in the 10-20 μm infrared range. The device structure consists of an anisotropic α-MoO3 layer combined with the one- and two-dimensional guided-mode resonance structures. Well-defined absorption lines are present in the reflection spectrum for both TE and TM polarizations, thereby yielding narrowband emissivity at desired wavelengths. The band structure of the designed emitters under TM polarization demonstrates distinct features unlike its TE counterpart. These features are attributed to the interaction between guided-mode resonances and phonon polaritons. The results are relevant for applications in active and passive photonic elements in mid- and long-wave IR bands.
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Submitted 20 February, 2024;
originally announced February 2024.
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Deep-subwavelength Phase Retarders at Mid-Infrared Frequencies with van der Waals Flakes
Authors:
Michael T. Enders,
Mitradeep Sarkar,
Aleksandra Deeva,
Maxime Giteau,
Hanan Herzig Sheinfux,
Mehrdad Shokooh-Saremi,
Frank H. L. Koppens,
Georgia T. Papadakis
Abstract:
Phase retardation is a cornerstone of modern optics, yet, at mid-infrared (mid-IR) frequencies, it remains a major challenge due to the scarcity of simultaneously transparent and birefringent crystals. Most materials resonantly absorb due to lattice vibrations occurring at mid-IR frequencies, and natural birefringence is weak, calling for hundreds of microns to millimeters-thick phase retarders fo…
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Phase retardation is a cornerstone of modern optics, yet, at mid-infrared (mid-IR) frequencies, it remains a major challenge due to the scarcity of simultaneously transparent and birefringent crystals. Most materials resonantly absorb due to lattice vibrations occurring at mid-IR frequencies, and natural birefringence is weak, calling for hundreds of microns to millimeters-thick phase retarders for sufficient polarization rotation. We demonstrate mid-IR phase retardation with flakes of $α$-molybdenum trioxide ($α$-MoO$_3$) that are more than ten times thinner than the operational wavelength, achieving 90 degrees polarization rotation within one micrometer of material. We report conversion ratios above 50% in reflection and transmission mode, and wavelength tunability by several micrometers. Our results showcase that exfoliated flakes of low-dimensional crystals can serve as a platform for mid-IR miniaturized integrated polarization control.
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Submitted 29 June, 2023; v1 submitted 28 June, 2023;
originally announced June 2023.
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Retrieving optical parameters of emerging van der Waals flakes
Authors:
Mitradeep Sarkar,
Michael T. Enders,
Mehrdad Shokooh-Saremi,
Kenji Watanabe,
Takashi Taniguchi,
Hanan Herzig Sheinfux,
Frank H. L. Koppens,
Georgia Theano Papadakis
Abstract:
High-quality low-dimensional layered and van der Waals materials are typically exfoliated, with sample cross sectional areas on the order of tens to hundreds of microns. The small size of flakes makes the experimental characterization of their dielectric properties unsuitable with conventional spectroscopic ellipsometry, due to beam-sample size mismatch and non-uniformities of the crystal axes. Pr…
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High-quality low-dimensional layered and van der Waals materials are typically exfoliated, with sample cross sectional areas on the order of tens to hundreds of microns. The small size of flakes makes the experimental characterization of their dielectric properties unsuitable with conventional spectroscopic ellipsometry, due to beam-sample size mismatch and non-uniformities of the crystal axes. Previously, the experimental measurement of the dielectrirc permittivity of such microcrystals was carried out with near-field tip-based scanning probes. These measurements are sensitive to external conditions like vibrations and temperature, and require non-deterministic numerical fitting to some a priori known model. We present an alternative method to extract the in-plane dielectric permittivity of van der Waals microcrystals, based on identifying reflectance minima in spectroscopic measurements. Our method does not require complex fitting algorithms nor near field tip-based measurements and accommodates for small-area samples. We demonstrate the robustness of our method using hexagonal boron nitride and α-MoO3, and recover their dielectric permittivities that are close to literature values.
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Submitted 29 May, 2023; v1 submitted 23 May, 2023;
originally announced May 2023.
