Dr. Cannon has spent more than a decade implementing micro fabrication strategies with large companies, small companies, national laboratories, and university researchers. He is the inventor of many granted and pending patents in the fields of Micro Manufacturing and Surface Engineering. He specializes in micro molding polymers, ceramics, and metals to alter friction and enhance other surface properties. Supervisors: Bill King, Prof of Mechanical Engineering, Univeristy of Illinois
International Digital Imaging Correlation Society, 2017
Micro Speckle Stamping has been developed and tested whereby repeatable micro speckle patterns fo... more Micro Speckle Stamping has been developed and tested whereby repeatable micro speckle patterns for DIC are applied with no basecoat. The speckle patterns are created on a stamp, and ink is applied to the stamp. The user then transfers the speckle pattern from the stamp to the specimen. Micro Speckle Stamping uses high optical contrast and high electrical contrast speckle materials and leaves no residue between speckles. This new method is more amenable to applying patterns to complex surface geometries and large surface areas and also allows investigations of the virgin surface with EDS and EBSD.
The accuracy and precision of digital image correlation (DIC) is a function of three primary ingr... more The accuracy and precision of digital image correlation (DIC) is a function of three primary ingredients: image acquisition, image analysis, and the subject of the image. Development of the first two (i.e. image acquisition techniques and image correlation algorithms) has led to widespread use of DIC; however, fewer developments have been focused on the third ingredient. Typically, subjects of DIC images are mechanical specimens with either a natural surface pattern or a pattern applied to the surface. Research in the area of DIC patterns has primarily been aimed at identifying which surface patterns are best suited for DIC, by comparing patterns to each other. Because the easiest and most widespread methods of applying patterns have a high degree of randomness associated with them (e.g., airbrush, spray paint, particle decoration, etc.), less effort has been spent on exact construction of ideal patterns. With the development of patterning techniques such as microstamping and lithog...
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, Jan 4, 2017
Digital image correlation (DIC) in a scanning electron microscope and high-angular resolution ele... more Digital image correlation (DIC) in a scanning electron microscope and high-angular resolution electron backscatter diffraction (HREBSD) provide valuable and complementary data concerning local deformation at the microscale. However, standard surface preparation techniques are mutually exclusive, which makes combining these techniques in situ impossible. This paper introduces a new method of applying surface patterning for DIC, namely a urethane microstamp, that provides a pattern with enough contrast for DIC at low accelerating voltages, but is virtually transparent at the higher voltages necessary for HREBSD and conventional EBSD analysis. Furthermore, microstamping is inexpensive and repeatable, and is more suitable to the analysis of patterns from complex surface geometries and larger surface areas than other patterning techniques.
Abstract The accuracy and precision of digital image correlation (DIC) is based on three primary ... more Abstract The accuracy and precision of digital image correlation (DIC) is based on three primary components: image acquisition, image analysis, and the subject of the image. Focus on the third component, the image subject, has been relatively limited and primarily concerned with comparing pseudo-random surface patterns. In the current work, a strategy is proposed for the creation of optimal DIC patterns. In this strategy, a pattern quality metric is developed as a combination of quality metrics from the literature rather than optimization based on any single one of them. In this way, optimization produces a pattern which balances the benefits of multiple quality metrics. Specifically, sum of square of subset intensity gradients (SSSIG) was found to be the metric most strongly correlated to DIC accuracy and thus is the main component of the newly proposed pattern quality metric. A term related to the secondary auto-correlation peak height is also part of the proposed quality metric which effectively acts as a constraint upon SSSIG ensuring that a regular (e.g., checkerboard-type) pattern is not achieved. The combined pattern quality metric is used to generate a pattern that was on average 11.6% more accurate than a randomly generated pattern in a suite of numerical experiments. Furthermore, physical experiments were performed which confirm that there is indeed improvement of a similar magnitude in DIC measurements for the optimized pattern compared to a random pattern.
Journal of Micromechanics and Microengineering, 2010
... development Soft Matter 4 22440 [4] Quere D, de Gennes PG, Brochard-Wyart F and Reisinger A ... more ... development Soft Matter 4 22440 [4] Quere D, de Gennes PG, Brochard-Wyart F and Reisinger A 2004 Capillarity and Wetting Phenomena (Berlin: Springer) [5] Zhang X, Shi F, Niu J, Jiang ... 28 98894 [11] Cassie ABD and Baxter S 1944 Wettability of porous surfaces Trans. ...
Digital image correlation (DIC) in a scanning electron microscope and high-angular resolution ele... more Digital image correlation (DIC) in a scanning electron microscope and high-angular resolution electron backscatter diffraction (HREBSD) provide valuable and complementary data concerning local deformation at the microscale. However, standard surface preparation techniques are mutually exclusive, which makes combining these techniques in situ impossible. This paper introduces a new method of applying surface patterning for DIC, namely a urethane microstamp, that provides a pattern with enough contrast for DIC at low accelerating voltages, but is virtually transparent at the higher voltages necessary for HREBSD and conventional EBSD analysis. Furthermore, microstamping is inexpensive and repeatable, and is more suitable to the analysis of patterns from complex surface geometries and larger surface areas than other patterning techniques.
Digital image correlation (DIC) relies on the visible surface features of a specimen to measure d... more Digital image correlation (DIC) relies on the visible surface features of a specimen to measure deformation. When the specimen itself has little to no visible features, a pattern is applied to the surface which deforms with the specimen and acts as artificial surface features. Since recent pattern application methods, e.g., micro-stamping [1] and lithography [2] allow for the application of highly customized patterns and because the applied pattern affects the accuracy and precision of DIC, an ideal pattern is sought for which the error introduced into DIC measurements is minimal. It is the goal of the present work to develop and refine an optimization technique to produce this type of DIC pattern.
Micro Speckle Stamping has been developed and tested whereby repeatable micro speckle patterns fo... more Micro Speckle Stamping has been developed and tested whereby repeatable micro speckle patterns for DIC are applied with no basecoat. The speckle patterns are created on a stamp, and ink is applied to the stamp. The user then transfers the speckle pattern from the stamp to the specimen. Micro Speckle Stamping uses high optical contrast and high electrical contrast speckle materials and leaves no residue between speckles. This new method is more amenable to applying patterns to complex surface geometries and large surface areas and also allows investigations of the surface with EDS and EBSD.
The accuracy and precision of digital image correlation (DIC) is based on three primary component... more The accuracy and precision of digital image correlation (DIC) is based on three primary components: image acquisition, image analysis, and the subject of the image. Focus on the third component, the image subject, has been relatively limited and primarily concerned with comparing pseudo-random surface patterns. In the current work, a strategy is proposed for the creation of optimal DIC patterns. In this strategy, a pattern quality metric is developed as a combination of quality metrics from the literature rather than optimization based on any single one of them. In this way, optimization produces a pattern which balances the benefits of multiple quality metrics. Specifically, sum of square of subset intensity gradients (SSSIG) was found to be the metric most strongly correlated to DIC accuracy and thus is the main component of the newly proposed pattern quality metric. A term related to the secondary auto-correlation peak height is also part of the proposed quality metric which effectively acts as a constraint upon SSSIG ensuring that a regular (e.g., checkerboard-type) pattern is not achieved. The combined pattern quality metric is used to generate a pattern that was on average 11.6% more accurate than a randomly generated pattern in a suite of numerical experiments. Furthermore, physical experiments were performed which confirm that there is indeed improvement of a similar magnitude in DIC measurements for the optimized pattern compared to a random pattern.
International Digital Imaging Correlation Society, 2017
Micro Speckle Stamping has been developed and tested whereby repeatable micro speckle patterns fo... more Micro Speckle Stamping has been developed and tested whereby repeatable micro speckle patterns for DIC are applied with no basecoat. The speckle patterns are created on a stamp, and ink is applied to the stamp. The user then transfers the speckle pattern from the stamp to the specimen. Micro Speckle Stamping uses high optical contrast and high electrical contrast speckle materials and leaves no residue between speckles. This new method is more amenable to applying patterns to complex surface geometries and large surface areas and also allows investigations of the virgin surface with EDS and EBSD.
The accuracy and precision of digital image correlation (DIC) is a function of three primary ingr... more The accuracy and precision of digital image correlation (DIC) is a function of three primary ingredients: image acquisition, image analysis, and the subject of the image. Development of the first two (i.e. image acquisition techniques and image correlation algorithms) has led to widespread use of DIC; however, fewer developments have been focused on the third ingredient. Typically, subjects of DIC images are mechanical specimens with either a natural surface pattern or a pattern applied to the surface. Research in the area of DIC patterns has primarily been aimed at identifying which surface patterns are best suited for DIC, by comparing patterns to each other. Because the easiest and most widespread methods of applying patterns have a high degree of randomness associated with them (e.g., airbrush, spray paint, particle decoration, etc.), less effort has been spent on exact construction of ideal patterns. With the development of patterning techniques such as microstamping and lithog...
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, Jan 4, 2017
Digital image correlation (DIC) in a scanning electron microscope and high-angular resolution ele... more Digital image correlation (DIC) in a scanning electron microscope and high-angular resolution electron backscatter diffraction (HREBSD) provide valuable and complementary data concerning local deformation at the microscale. However, standard surface preparation techniques are mutually exclusive, which makes combining these techniques in situ impossible. This paper introduces a new method of applying surface patterning for DIC, namely a urethane microstamp, that provides a pattern with enough contrast for DIC at low accelerating voltages, but is virtually transparent at the higher voltages necessary for HREBSD and conventional EBSD analysis. Furthermore, microstamping is inexpensive and repeatable, and is more suitable to the analysis of patterns from complex surface geometries and larger surface areas than other patterning techniques.
Abstract The accuracy and precision of digital image correlation (DIC) is based on three primary ... more Abstract The accuracy and precision of digital image correlation (DIC) is based on three primary components: image acquisition, image analysis, and the subject of the image. Focus on the third component, the image subject, has been relatively limited and primarily concerned with comparing pseudo-random surface patterns. In the current work, a strategy is proposed for the creation of optimal DIC patterns. In this strategy, a pattern quality metric is developed as a combination of quality metrics from the literature rather than optimization based on any single one of them. In this way, optimization produces a pattern which balances the benefits of multiple quality metrics. Specifically, sum of square of subset intensity gradients (SSSIG) was found to be the metric most strongly correlated to DIC accuracy and thus is the main component of the newly proposed pattern quality metric. A term related to the secondary auto-correlation peak height is also part of the proposed quality metric which effectively acts as a constraint upon SSSIG ensuring that a regular (e.g., checkerboard-type) pattern is not achieved. The combined pattern quality metric is used to generate a pattern that was on average 11.6% more accurate than a randomly generated pattern in a suite of numerical experiments. Furthermore, physical experiments were performed which confirm that there is indeed improvement of a similar magnitude in DIC measurements for the optimized pattern compared to a random pattern.
Journal of Micromechanics and Microengineering, 2010
... development Soft Matter 4 22440 [4] Quere D, de Gennes PG, Brochard-Wyart F and Reisinger A ... more ... development Soft Matter 4 22440 [4] Quere D, de Gennes PG, Brochard-Wyart F and Reisinger A 2004 Capillarity and Wetting Phenomena (Berlin: Springer) [5] Zhang X, Shi F, Niu J, Jiang ... 28 98894 [11] Cassie ABD and Baxter S 1944 Wettability of porous surfaces Trans. ...
Digital image correlation (DIC) in a scanning electron microscope and high-angular resolution ele... more Digital image correlation (DIC) in a scanning electron microscope and high-angular resolution electron backscatter diffraction (HREBSD) provide valuable and complementary data concerning local deformation at the microscale. However, standard surface preparation techniques are mutually exclusive, which makes combining these techniques in situ impossible. This paper introduces a new method of applying surface patterning for DIC, namely a urethane microstamp, that provides a pattern with enough contrast for DIC at low accelerating voltages, but is virtually transparent at the higher voltages necessary for HREBSD and conventional EBSD analysis. Furthermore, microstamping is inexpensive and repeatable, and is more suitable to the analysis of patterns from complex surface geometries and larger surface areas than other patterning techniques.
Digital image correlation (DIC) relies on the visible surface features of a specimen to measure d... more Digital image correlation (DIC) relies on the visible surface features of a specimen to measure deformation. When the specimen itself has little to no visible features, a pattern is applied to the surface which deforms with the specimen and acts as artificial surface features. Since recent pattern application methods, e.g., micro-stamping [1] and lithography [2] allow for the application of highly customized patterns and because the applied pattern affects the accuracy and precision of DIC, an ideal pattern is sought for which the error introduced into DIC measurements is minimal. It is the goal of the present work to develop and refine an optimization technique to produce this type of DIC pattern.
Micro Speckle Stamping has been developed and tested whereby repeatable micro speckle patterns fo... more Micro Speckle Stamping has been developed and tested whereby repeatable micro speckle patterns for DIC are applied with no basecoat. The speckle patterns are created on a stamp, and ink is applied to the stamp. The user then transfers the speckle pattern from the stamp to the specimen. Micro Speckle Stamping uses high optical contrast and high electrical contrast speckle materials and leaves no residue between speckles. This new method is more amenable to applying patterns to complex surface geometries and large surface areas and also allows investigations of the surface with EDS and EBSD.
The accuracy and precision of digital image correlation (DIC) is based on three primary component... more The accuracy and precision of digital image correlation (DIC) is based on three primary components: image acquisition, image analysis, and the subject of the image. Focus on the third component, the image subject, has been relatively limited and primarily concerned with comparing pseudo-random surface patterns. In the current work, a strategy is proposed for the creation of optimal DIC patterns. In this strategy, a pattern quality metric is developed as a combination of quality metrics from the literature rather than optimization based on any single one of them. In this way, optimization produces a pattern which balances the benefits of multiple quality metrics. Specifically, sum of square of subset intensity gradients (SSSIG) was found to be the metric most strongly correlated to DIC accuracy and thus is the main component of the newly proposed pattern quality metric. A term related to the secondary auto-correlation peak height is also part of the proposed quality metric which effectively acts as a constraint upon SSSIG ensuring that a regular (e.g., checkerboard-type) pattern is not achieved. The combined pattern quality metric is used to generate a pattern that was on average 11.6% more accurate than a randomly generated pattern in a suite of numerical experiments. Furthermore, physical experiments were performed which confirm that there is indeed improvement of a similar magnitude in DIC measurements for the optimized pattern compared to a random pattern.
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Papers by Andrew H Cannon