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ORCIDHarry H. Chen
Person information
- affiliation: MediaTek, Hsinchu, Taiwan
- affiliation (former): Stanford University, Computer Systems Laboratory, CA, USA
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2020 – today
- 2024
[c27]Chien-Yu Lu, Bo-Jr Huang, Min-Chieh Chen, Ollie Tsai, Alfred Tsai, Eric Jia-Wei Fang, Yuju Cho, Harry H. Chen, Ping Kao, Ericbill Wang, Hugh Mair, Shih-Arn Hwang:
14.4 A Fully Digital Current Sensor Offering Per-Core Runtime Power for System Budgeting in a 4nm-Plus Octa-Core CPU. ISSCC 2024: 260-262- 2023
- [c26]Chun-Yeh Wang, Chien-Hsing Liang, Jing-Jia Liou, Harry H. Chen:
Signal Reduction of Signature Blocks for Transient Fault Debugging. ATS 2023: 1-6 - [c25]Bo-Jr Huang, Alfred Tsai, Lear Hsieh, Kathleen Chang, C.-J. Tsai, Jia-Ming Chen, Eric Jia-Wei Fang, Sung S.-Y. Hsueh, Jack Ciao, Barry Chen, Chuck Chang, Ping Kao, Ericbill Wang, Harry H. Chen, Hugh Mair, Shih-Arn Hwang:
A 5G Mobile Gaming-Centric SoC with High-Performance Thermal Management in 4nm FinFET. ISSCC 2023: 40-41 - [c24]Chun Chen, Jeng-Yu Liao, James Chien-Mo Li, Harry H. Chen, Eric Jia-Wei Fang:
Vmin Prediction Using Nondestructive Stress Test. VTS 2023: 1-7 - 2022
- [c23]Zih-Ming Huang, Dun-An Yang, Jing-Jia Liou, Harry H. Chen:
FPGA-Based Emulation for Accelerating Transient Fault Reduction Analysis. ATS 2022: 144-149 - [c22]Dun-An Yang, Jing-Jia Liou, Harry H. Chen:
Transient Fault Pruning for Effective Candidate Reduction in Functional Debugging. ITC 2022: 73-81 - 2021
- [c21]Dun-An Yang, Jing-Jia Liou, Harry H. Chen:
Analyzing Transient Faults and Functional Error Rates of a RISC-V Core: A Case Study. ATS 2021: 133-138 - [c20]Bo-Jr Huang, Eric Jia-Wei Fang, Sung S.-Y. Hsueh, Rory Huang, Angus Lin, Chi-Hsun Chiang, Yi-Hsuan Lin, Wen-Wen Hsieh, Barry Chen, Yi-Chang Zhuang, Cheng-Yuh Wu, Jia-Ming Chen, Y. S. Chen, Cheng-Tien Wan, Ericbill Wang, Alex Chiou, Ping Kao, Yuwen Tsai, Harry H. Chen, Shih-Arn Hwang:
35.1 An Octa-Core 2.8/2GHz Dual-Gear Sensor-Assisted High-Speed and Power-Efficient CPU in 7nm FinFET 5G Smartphone SoC. ISSCC 2021: 490-492 - [c19]Dun-An Yang, Yu-Teng Chang, Ting-Shuo Hsu, Jing-Jia Liou, Harry H. Chen:
ACE-Pro: Reduction of Functional Errors with ACE Propagation Graph. ITC 2021: 10-19 - 2020
- [c18]Jiang-Tang Xiao, Ting-Shuo Hsu, Christian M. Fuchs, Yu-Teng Chang, Jing-Jia Liou, Harry H. Chen:
An ISA-level Accurate Fault Simulator for System-level Fault Analysis. ATS 2020: 1-6 - [c17]M. H. Hsieh, W. S. Chiang, Harry H. Chen, M. Z. Lin, M. J. Lin:
Comprehensive Quality and Reliability Management for Automotive Product. IRPS 2020: 1-5 - [c16]Takeshi Iwasaki, Masao Aso, Haruji Futami, Satoshi Matsunaga, Yousuke Miyake
, Takaaki Kato, Seiji Kajihara, Yukiya Miura, Smith Lai, Gavin Hung, Harry H. Chen, Haruo Kobayashi, Kazumi Hatayama:
Innovative Test Practices in Asia. VTS 2020: 1
2010 – 2019
- 2019
- [c15]Henry Cox, Harry H. Chen:
Hardware and firmware verification and validation: an algorithm-to-firmware development methodology. DATE 2019: 992-993 - 2018
- [c14]Po-Yao Chuang, Cheng-Wen Wu, Harry H. Chen:
Covering hard-to-detect defects by thermal quorum sensing. ETS 2018: 1-2 - [c13]Harry H. Chen:
Beyond structural test, the rising need for system-level test. VLSI-DAT 2018: 1-4 - 2017
- [c12]Po-Yao Chuang, Cheng-Wen Wu, Harry H. Chen:
Cell-aware test generation time reduction by using switch-level ATPG. ITC-Asia 2017: 27-32 - [c11]Harry H. Chen:
Enhancing the efficiency and accuracy of cell-aware testing to reach zero defects. VLSI-DAT 2017: 1 - 2016
- [c10]Harry H. Chen, Simon Y.-H. Chen, Po-Yao Chuang, Cheng-Wen Wu:
Efficient Cell-Aware Fault Modeling by Switch-Level Test Generation. ATS 2016: 197-202 - 2015
- [c9]Jing-Jia Liou, Meng-Ta Hsieh, Jun-Fei Cherng, Harry H. Chen:
Cost reduction of system-level tests with stressed structural tests and SVM. VLSI-SoC 2015: 177-182 - [c8]Bing-Yang Lin, Cheng-Wen Wu, Harry H. Chen:
System-level test coverage prediction by structural stress test data mining. VLSI-DAT 2015: 1-4 - [c7]Harry H. Chen, Shih-Hua Kuo, Jonathan Tung, Mango Chia-Tso Chao:
Statistical techniques for predicting system-level failure using stress-test data. VTS 2015: 1-6 - 2014
- [c6]Harry H. Chen:
Perspectives on Test Data Mining from Industrial Experience. ATS 2014: 242-247 - [c5]Harry H. Chen:
The case for analyzing system level failures using structural patterns. ITC 2014: 1 - 2013
- [c4]Fang Bao, Mohammad Tehranipoor, Harry H. Chen:
Worst-Case Critical-Path Delay Analysis Considering Power-Supply Noise. Asian Test Symposium 2013: 37-42 - [c3]Harry H. Chen, Roger Hsu, PaulYoung Yang, J. J. Shyr:
Predicting system-level test and in-field customer failures using data mining. ITC 2013: 1-10
1980 – 1989
- 1985
- [c2]Harry H. Chen, Robert G. Mathews, John A. Newkirk:
An Algorithm to Generate Tests for MOS Circuits at the Switch Level. ITC 1985: 304-312 - 1984
- [c1]Harry H. Chen, Robert G. Mathews, John A. Newkirk:
Test Generation for MOS Circuits. ITC 1984: 70-79
Coauthor Index
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