"Testing Digital Circuits with Constraints."

Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey (2002)

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DOI: 10.1109/DFTVS.2002.1173516

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey:
Testing Digital Circuits with Constraints. DFT 2002: 195-206

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