"A Parallel Genetic Algorithm for Automatic Generation of Test Sequences ..."

Fulvio Corno et al. (1996)

> Home

Details and statistics

DOI: 10.1007/3-540-61142-8_583

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-09

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/hpcn/CornoPRR96
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/hpcn/CornoPRR96
Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza Reorda:
A Parallel Genetic Algorithm for Automatic Generation of Test Sequences for Digital Circuits. HPCN Europe 1996: 454-459

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.