"Evolution of Defect in AlGaN-based Deep Ultraviolet Light Emitting Diodes ..."

Yingzhe Wang et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9128350

access: closed

type: Conference or Workshop Paper

metadata version: 2020-07-30

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Yingzhe Wang, Xuefeng Zheng, Jiaduo Zhu, Shengrui Xu, Xiaohua Ma, Jincheng Zhang, Yue Hao, Linlin Xu, Jiangnan Dai, Peixian Li:
Evolution of Defect in AlGaN-based Deep Ultraviolet Light Emitting Diodes During Electrical Stress. IRPS 2020: 1-4

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