"Impact of die-to-die and within-die parameter fluctuations on the maximum ..."

Keith A. Bowman, Steven G. Duvall, James D. Meindl (2002)

> Home

Details and statistics

DOI: 10.1109/4.982424

access: closed

type: Journal Article

metadata version: 2022-04-09

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jssc/BowmanDM02
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jssc/BowmanDM02
Keith A. Bowman, Steven G. Duvall, James D. Meindl:
Impact of die-to-die and within-die parameter fluctuations on the maximum clock frequency distribution for gigascale integration. IEEE J. Solid State Circuits 37(2): 183-190 (2002)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.