default search action
International Symposium on VLSI Design and Test (VDAT)
28th VDAT 2024: Vellore, India
- 28th International Symposium on VLSI Design and Test, VDAT 2024, Vellore, India, September 1-3, 2024. IEEE 2024, ISBN 979-8-3503-8010-1 [contents]
26th VDAT 2022: Jammu, India
- Ambika Prasad Shah, Sudeb Dasgupta, Anand D. Darji, Jaynarayan T. Tudu:
VLSI Design and Test - 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers. Communications in Computer and Information Science 1687, Springer 2022, ISBN 978-3-031-21513-1 [contents]
25th VDAT 2021: Surat, India
- 25th International Symposium on VLSI Design and Test, VDAT 2021, Surat, India, September 16-18, 2021. IEEE 2021, ISBN 978-1-6654-1992-5 [contents]
24th VDAT 2020: Bhubaneswar, India
- 2020 24th International Symposium on VLSI Design and Test (VDAT), Bhubaneswar, India, July 23-25, 2020. IEEE 2020, ISBN 978-1-7281-9369-4 [contents]
23rd VDAT 2019: Indore, India
- Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, Santosh Kumar Vishvakarma:
VLSI Design and Test - 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers. Communications in Computer and Information Science 1066, Springer 2019, ISBN 978-981-32-9766-1 [contents]
22nd VDAT 2018: Madurai, India
- S. Rajaram, N. B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh:
VLSI Design and Test - 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers. Communications in Computer and Information Science 892, Springer 2019, ISBN 978-981-13-5949-1 [contents]
21st VDAT 2017: Roorkee, India
- Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh:
VLSI Design and Test - 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers. Communications in Computer and Information Science 711, Springer 2017, ISBN 978-981-10-7469-1 [contents]
20th VDAT 2016: Guwahati, India
- 20th International Symposium on VLSI Design and Test, VDAT 2016, Guwahati, India, May 24-27, 2016. IEEE 2016, ISBN 978-1-5090-1422-4 [contents]
19th VDAT 2015: Ahmedabad, India
- 19th International Symposium on VLSI Design and Test, VDAT 2015, Ahmedabad, India, June 26-29, 2015. IEEE Computer Society 2015, ISBN 978-1-4799-1743-3 [contents]
18th VDAT 2014: Coimbatore, India
- 18th International Symposium on VLSI Design and Test, VDAT 2014, Coimbatore, India, July 16-18, 2014. IEEE 2014, ISBN 978-1-4799-5088-1 [contents]
17th VDAT 2013: Jaipur, India
- Manoj Singh Gaur, Mark Zwolinski, Vijay Laxmi, Dharmendar Boolchandani, Virendra Singh, Adit D. Singh:
VLSI Design and Test, 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers. Communications in Computer and Information Science 382, Springer 2013, ISBN 978-3-642-42023-8 [contents]
16th VDAT 2012: Shibpur, India
- Hafizur Rahaman, Sanatan Chattopadhyay, Santanu Chattopadhyay:
Progress in VLSI Design and Test - 16th International Symposium, VDAT 2012, Shibpur, India, July 1-4, 2012. Proceedings. Lecture Notes in Computer Science 7373, Springer 2012, ISBN 978-3-642-31493-3 [contents]
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.