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ORCIDIEEE Design & Test of Computers, Volume 8
Volume 8, Number 1, January-March 1991
- News. IEEE Des. Test Comput. 8(1): 2-5 (1991)
- R. A. Sprague, K. J. Singh, R. T. Wood:
Concurrent Engineering in Product Development. 6-13 - Rolf Ernst, Jayaram Bhasker:
Simulation-Based Verification for High-Level Synthesis. 14-20 - Brion L. Keller, David P. Carlson, William Maloney:
The Compiled Logic Simulator. 21-34 - Wayne H. Wolf:
Object Programming for CAD. 35-42 - Raul Camposano, Larry F. Saunders, Raja M. Tabet:
VHDL as Input for High-Level Synthesis. 43-49 - Mehrdad Bidjan-Irani:
A Rule-Based Design-for-Testability Rule Checker. 50-57 - Vinod S. S. Chandra
, M. R. Verma:
A Fail-Safe Interlocking System for Railways. 58-66 - Joachim Roos:
Designing a Real-Time Coprocessor for Ada Tasking. 67-79 - A D&T Roundtable: ASIC Alternatives for System Design. IEEE Des. Test Comput. 8(1): 80-90 (1991)
- TTTC Newsletter. IEEE Des. Test Comput. 8(1): 91-93 (1991)
- Book Review. IEEE Des. Test Comput. 8(1): 92-93 (1991)
- Conference Reports. IEEE Des. Test Comput. 8(1): 94-95 (1991)
- Product Review. IEEE Des. Test Comput. 8(1): 96-97 (1991)
- DATC Newsletter. IEEE Des. Test Comput. 8(1): 102-103 (1991)
Volume 8, Number 2, April-June 1991
- News. IEEE Des. Test Comput. 8(2): 2-3, 103 (1991)
- Stephen Walters:
Computer-Aided Prototyping for ASIC-Based Systems. 4-10 - Richard I. Hartley, Kenneth Welles II, Michael J. Hartman, Abhijit Chatterjee, Paul Delano, Barbara Molnar, Colin Rafferty:
A Rapid-Prototyping Environment for Digital-Signal Processors. 11-25 - David G. Boyer, Robert R. Cordell:
Rapid Prototyping of High-Speed Communications Chips. 27-39 - Jan M. Rabaey, Chi-Min Chu, Phu Hoang, Miodrag Potkonjak:
Fast Prototyping of Datapath-Intensive Architectures. 40-51 - Marc Engels, Rudy Lauwereins, J. A. Peperstraete:
Rapid Prototyping for DSP Systems with Multiprocessors. 52-62 - Dilip K. Bhavsar:
Testing Interconnections to Static RAMs. 63-71 - Elisabeth Auth, Michael H. Schulz:
A Test-Pattern-Generation Algorithm for Sequential Circuits. 72-86 - A D&T Roundtable- Six Sigma: Moving Towards Perfect Products. IEEE Des. Test Comput. 8(2): 88-99 (1991)
- Book Review. IEEE Des. Test Comput. 8(2): 100-102 (1991)
- DATC Newsletter. IEEE Des. Test Comput. 8(2): 108-109 (1991)
- TTTC Newsletter. IEEE Des. Test Comput. 8(2): 110-111 (1991)
Volume 8, Number 3, July-September 1991
- News. IEEE Des. Test Comput. 8(3): 2-4, 9 (1991)
- Andrew J. Graham:
The DAD Reamework Interactive. IEEE Des. Test Comput. 8(3): 12-15 (1991) - William R. Simpson, John W. Sheppard:
System Complexity and Integrated Diagnostics. 16-30 - Paul S. Levy:
Designing in Power-Down Test Circuits. 31-35 - Georg Antonin, Hans-Dieter Oberle, Jochen Kölzer:
Electrical Characterization of Megabit DRAMs, Part 1: External Testing. 36-43 - Bjorn Dahlberg:
Increasing Test Accuracy by Varying Driver Slew Rate. 44-48 - Rajiv Gupta, Rajagopalan Srinivasan, Melvin A. Breuer:
Reorganizing Circuits to Aid Testability. 49-57 - Prawat Nagvajara, Mark G. Karpovsky, Lev B. Levitin:
Pseudorandom Testing for Boundary-Scan Design with Built-In Self-Test. 58-65 - A D&T Roundtable: Design for Manufacturability. IEEE Des. Test Comput. 8(3): 66-76 (1991)
- Conference Reports. IEEE Des. Test Comput. 8(3): 78-84 (1991)
- Product Review. IEEE Des. Test Comput. 8(3): 86- (1991)
- Book Review. IEEE Des. Test Comput. 8(3): 90-91 (1991)
- TTTC Newsletter. IEEE Des. Test Comput. 8(3): 92-93 (1991)
- DATC Newsletter. IEEE Des. Test Comput. 8(3): 94-95 (1991)
Volume 8, Number 4, October-December 1991
- Editor-in-Chief's Message. IEEE Des. Test Comput. 8(4): 2-3 (1991)
- Disaster Recovery Centers. IEEE Des. Test Comput. 8(4): 4-5 (1991)
- Karlheinz Hafner, Hartmut C. Ritter, Thomas M. Schwair, Stefan Wallstab, Michael Deppermann, Jürgen Gessner, Stefan Koesters, Wolf-Dietrich Moeller, Gerd Sandweg:
Design and Test of an Integrated Cryptochip. 6-17 - David A. Fechser:
A Methodology for Debugging ASIC Prototypes in the Field. 18-23 - John W. Sheppard, William R. Simpson:
A Mathematical Model for Integrated Diagnostics. 25-38 - Jochen Kölzer, Johann Otto:
Electrical Characterization of Megabit DRAMs, Part 2: Internal Testing. 39-51 - Richard Absher:
Test Engineering Education is Rational, Feasible, and Relevant. 52-62 - I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick:
Economic Effects in Design and Test. 64-77 - 1991 Annual Index. IEEE Des. Test Comput. 8(4): 78-81 (1991)
- Book Review. IEEE Des. Test Comput. 8(4): 82-84 (1991)
- Conference Reports. IEEE Des. Test Comput. 8(4): 84-86 (1991)
- Direct Access Network. IEEE Des. Test Comput. 8(4): 87- (1991)
- TTTC Newsletter. IEEE Des. Test Comput. 8(4): 92-93 (1991)
- DATC Newsletter. IEEE Des. Test Comput. 8(4): 94-95 (1991)
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