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2020 – today
- 2021
[c8]Mitsuo Matsumoto, Masayuki Kawabata, Yukio Kawanabe:
High-speed measurement of Piezoelectric MEMS equivalent circuit parameters by Swept-sine and PRBS signals. ITC-Asia 2021: 1-6
2010 – 2019
- 2017
- [c7]Masayuki Kawabata, Koji Asami, Shohei Shibuya, Tomonori Yanagida, Haruo Kobayashi:
Low-distortion signal generation for analog/mixed-signal circuit testing with digital ATE. ITC-Asia 2017: 2-7 - 2016
- [c6]Masayuki Kawabata, Koji Asami, Shohei Shibuya, Tomonori Yanagida, Haruo Kobayashi:
Rectangular Waveform Generation with Harmonics Suppression. ATS 2016: 125 - 2015
- [c5]Takahiro J. Yamaguchi, Katsuhiko Degawa, Masayuki Kawabata, Masahiro Ishida, Koichiro Uekusa, Mani Soma:
A new method for measuring alias-free aperture jitter in an ADC output. ITC 2015: 1-6 - 2012
- [j4]Masahiro Ishida, Kiyotaka Ichiyama, Tasuku Fujibe, Daisuke Watanabe, Masayuki Kawabata:
Real-Time Testing Method for Multilevel Signal Interfaces and Its Impact on Test Cost. IEEE Des. Test Comput. 29(5): 63-71 (2012) - [c4]Masahiro Ishida, Kiyotaka Ichiyama, Daisuke Watanabe, Masayuki Kawabata, Toshiyuki Okayasu:
Real-time testing method for 16 Gbps 4-PAM signal interface. ITC 2012: 1-10 - 2011
- [c3]Masahiro Ishida, Kiyotaka Ichiyama, Daisuke Watanabe, Masayuki Kawabata, Toshiyuki Okayasu:
Real-time testing method for 16 Gbps 4-PAM signal interface. ITC 2011: 1-10 - 2010
- [j3]Yasuhide Kuramochi, Masayuki Kawabata, Koichiro Uekusa, Akira Matsuzawa:
A Self-Calibration Technique for Capacitor Mismatch Errors of an Interleaved SAR ADC. IEICE Trans. Electron. 93-C(11): 1630-1637 (2010)
2000 – 2009
- 2009
- [j2]Yasuhide Kuramochi, Akira Matsuzawa, Masayuki Kawabata:
A 0.027-mm2 Self-Calibrating Successive Approximation ADC Core in 0.18-µm CMOS. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 92-A(2): 360-366 (2009) - 2008
- [c2]Takahiro J. Yamaguchi, Masayuki Kawabata, Mani Soma, Masahiro Ishida, K. Sawami, Koichiro Uekusa:
A New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing. ITC 2008: 1-9 - 2007
- [j1]Michitaka Maruyama
, Hironori Wakana, Tsunehiro Hato, Hideo Suzuki, Keiichi Tanabe, Koichiro Uekusa, Takeshi Konno, Nobuya Sato, Masayuki Kawabata:
HTS Sampler with Improved Circuit Design and Layout. IEICE Trans. Electron. 90-C(3): 579-587 (2007) - 2005
- [c1]Masayuki Kawabata, Ryo Nishide, Mayumi Ueda, Shinichi Ueshima:
Graph-based Approach to Context-adaptable PNS and its Application Scenarios. ICDE Workshops 2005: 1250
Coauthor Index
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