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Toshiyuki Okayasu
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2010 – 2019
- 2013
- [c12]Daisuke Watanabe, Shin Masuda, Hideo Hara, Tsuyoshi Ataka, Atsushi Seki, Atsushi Ono, Toshiyuki Okayasu:
30-Gb/s optical and electrical test solution for high-volume testing. ITC 2013: 1-10 - 2012
- [c11]Masahiro Ishida, Kiyotaka Ichiyama, Daisuke Watanabe, Masayuki Kawabata, Toshiyuki Okayasu:
Real-time testing method for 16 Gbps 4-PAM signal interface. ITC 2012: 1-10 - 2011
- [c10]Masahiro Ishida, Kiyotaka Ichiyama, Daisuke Watanabe, Masayuki Kawabata, Toshiyuki Okayasu:
Real-time testing method for 16 Gbps 4-PAM signal interface. ITC 2011: 1-10
2000 – 2009
- 2009
- [c9]Daisuke Watanabe, Atsushi Ono, Toshiyuki Okayasu:
CMOS optical 4-PAM VCSEL driver with modal-dispersion equalizer for 10Gb/s 500m MMF transmission. ISSCC 2009: 106-107 - [c8]Tasuku Fujibe, Masakatsu Suda, Kazuhiro Yamamoto, Yoshihito Nagata, Kazuhiro Fujita, Daisuke Watanabe, Toshiyuki Okayasu:
Dynamic arbitrary jitter injection method for ≫6.5Gb/s SerDes testing. ITC 2009: 1-10 - 2007
- [c7]Kazuhiro Yamamoto, Masakatsu Suda, Toshiyuki Okayasu:
2GS/s, 10ps Resolution CMOS Differential Time-to-Digital Converter for Real-Time Testing of Source-Synchronous Memory Device. CICC 2007: 145-148 - 2006
- [c6]Toshiyuki Okayasu, Masakatsu Suda, Kazuhiro Yamamoto, Shusuke Kantake, Satoshi Sudou, Daisuke Watanabe:
1.83ps-Resolution CMOS Dynamic Arbitrary Timing Generator for >4GHz ATE Applications. ISSCC 2006: 2122-2131 - [c5]Kazuhiro Yamamoto, Masakatsu Suda, Toshiyuki Okayasu, Hirokatsu Niijima, Koichi Tanaka:
Multi Strobe Circuit for 2.133GHz Memory Test System. ITC 2006: 1-9 - 2005
- [c4]Masakatsu Suda, Kazuhiro Yamamoto, Toshiyuki Okayasu, Shusuke Kantake, Satoshi Sudou, Daisuke Watanabe:
CMOS high-speed, high-precision timing generator for 4.266-Gbps memory test system. ITC 2005: 9 - 2004
- [c3]Daisuke Watanabe, Masakatsu Suda, Toshiyuki Okayasu:
34.1Gbps Low Jitter, Low BER High-Speed Parallel CMOS Interface for Interconnections in High-Speed Memory Test System. ITC 2004: 1255-1262 - 2002
- [c2]Toshiyuki Okayasu, Masakatsu Suda, Kazuhiro Yamamoto:
CMOS Circuit Technology for Precise GHz Timing Generator. ITC 2002: 894-902
1990 – 1999
- 1994
- [c1]Takashi Sekino, Toshiyuki Okayasu:
Ultra Hi-Speed Pin-Electronics and Test Station Using GaAs IC. ITC 1994: 683-690
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