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2020 – today
- 2024
- [j92]Zhengfeng Huang, Zishuai Li
, Liting Sun, Huaguo Liang, Tianming Ni, Aibin Yan:
A Quadruple-Node Upsets Hardened Latch Design Based on Cross-Coupled Elements. J. Electron. Test. 40(1): 19-30 (2024) - [j91]Hui Xu, Xuewei Qin, Ruijun Ma, Chaoming Liu, Shuo Zhu, Jun Wang, Huaguo Liang:
A High-Performance Quadruple-Node-Upset-Tolerant Latch Design and an Algorithm for Tolerance Verification of Hardened Latches. J. Electron. Test. 40(1): 45-60 (2024) - [j90]Yuqi Pan
, Huaguo Liang, Junming Li, Jinxing Qu, Zhengfeng Huang, Maoxiang Yi, Yingchun Lu:
Wafer-level Adaptive Testing Based on Dual-Predictor Collaborative Decision. J. Electron. Test. 40(3): 405-415 (2024) - [j89]Hui Xu, Fuxin Tang
, Pan Qi, Ye Yuan, Huaguo Liang, Zhengfeng Huang:
A self-training end-to-end mask optimization framework based on semantic segmentation network. Integr. 96: 102150 (2024) - [j88]Hui Xu, Shuo Zhu
, Ruijun Ma
, Zhengfeng Huang, Huaguo Liang, Haojie Sun, Chaoming Liu:
Design of novel low cost triple-node-upset self-recoverable hardened latch. Integr. 97: 102199 (2024) - [j87]Zhengfeng Huang
, Yan Zhang
, Lei Ai
, Huaguo Liang
, Tianming Ni
, Tai Song
, Aibin Yan
:
Designs of High-Speed Triple-Node-Upset Hardened Latch Based on Dual-Modular-Redundancy. J. Circuits Syst. Comput. 33(5): 2450092:1-2450092:25 (2024) - [j86]Hui Xu
, Yu Xia
, Ruijun Ma
, Huaguo Liang
, Zhenfeng Huang
:
A Low-Cost Triple-Node-Upset Self-Recovery Latch Design. J. Circuits Syst. Comput. 33(10) (2024) - [j85]Jingchang Bian
, Zhengfeng Huang, Yankun Lin, Zhao Yang, Huaguo Liang, Tianming Ni:
Reliability analysis and comparison of ring-PUF based on probabilistic models. Microelectron. J. 144: 106072 (2024) - [j84]Yu Chen, Huaguo Liang, Linghui Zhang, Liang Yao, Yingchun Lu
:
High throughput dynamic dual entropy source true random number generator based on FPGA. Microelectron. J. 145: 106113 (2024) - [j83]Yiming Ouyang, Yihe Zhang
, Huaguo Liang, Jianhua Li:
A tree-recursive partitioned multicast mechanism for NoC-based deep neural network accelerator. Microelectron. J. 147: 106161 (2024) - [j82]Yiming Ouyang, Zhiyuan Chen
, Dongyu Xu, Huaguo Liang:
SPONGE+: A NoC-based power gating scheme for overall router column opening and closing control. Microelectron. J. 149: 106234 (2024) - [j81]Zhengfeng Huang, Liting Sun, Xu Wang, Huaguo Liang, Yingchun Lu, Aibin Yan, Jun Pan, Xiaoqing Wen:
NEST: A Quadruple-Node Upset Recovery Latch Design and Algorithm-Based Recovery Optimization. IEEE Trans. Aerosp. Electron. Syst. 60(4): 4590-4600 (2024) - [j80]Zhengfeng Huang
, Jingchang Bian
, Yankun Lin, Huaguo Liang
, Tianming Ni
:
Design Guidelines and Feedback Structure of Ring Oscillator PUF for Performance Improvement. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43(1): 71-84 (2024) - [j79]Shihao Yang
, Huaguo Liang
, Rong Hu, Liang Yao
, Zhengfeng Huang
, Maoxiang Yi
, Yingchun Lu
:
Lightweight Hybrid Entropy Source True Random Number Generator Based on Jitter and Metastability. IEEE Trans. Circuits Syst. II Express Briefs 71(7): 3513-3517 (2024) - [j78]Jun Liu
, Zhi Chen
, Tian Chen
, Xi Wu
, Huaguo Liang
, Xiaohui Yuan
:
Voltage Skew-Based Test Technique for Pre-Bond TSVs in 3-D ICs. IEEE Trans. Circuits Syst. II Express Briefs 71(8): 3930-3934 (2024) - [j77]Jun Liu
, Zhi Chen
, Songren Cheng
, Chen Xiang
, Tian Chen
, Xi Wu
, Yingchun Lu
, Huaguo Liang
:
A Symmetric Bridge-Based Pre-Bond TSV Faults Detection Method. IEEE Trans. Instrum. Meas. 73: 1-10 (2024) - [j76]Yiming Ouyang, Cheng Cao, Dongyu Xu, Wu Zhou, Zhengfeng Huang, Huaguo Liang:
DBU-PG: energy-efficient noc design using dual-buffering power gating. J. Supercomput. 80(10): 13632-13656 (2024) - [j75]Jingchang Bian
, Zhengfeng Huang
, Peng Ye
, Zhao Yang
, Huaguo Liang
:
A Reliability-Aware Splitting Duty-Cycle Physical Unclonable Function Based on Trade-off Process, Voltage, and Temperature Variations. ACM Trans. Design Autom. Electr. Syst. 29(1): 5:1-5:16 (2024) - [j74]Jun Liu
, Songren Cheng
, Tian Chen
, Xi Wu
, Huaguo Liang
:
A Self-Biased Current Reference Source-Based Pre-Bond TSV Test Solution. IEEE Trans. Very Large Scale Integr. Syst. 32(4): 774-781 (2024) - 2023
- [j73]Zhengfeng Huang, Hao Wang
, Dongxing Ma, Huaguo Liang, Yiming Ouyang, Aibin Yan:
Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets. J. Electron. Test. 39(3): 289-301 (2023) - [j72]Yongxia Sheng, Huaguo Liang, Bao Fang, Cuiyun Jiang, Zhengfeng Huang, Maoxiang Yi, Yingchun Lu:
Design of approximate Booth multipliers based on error compensation. Integr. 90: 183-189 (2023) - [j71]Yiming Ouyang, Dongyu Xu
, Chang Qian, Wu Zhou, Qi Wang, Huaguo Liang:
Dynamic detection of wireless interface faults and fault-tolerant routing algorithm in WiNoC. Integr. 90: 236-244 (2023) - [j70]Hui Xu, Jing Zhou, Ruijun Ma
, Huaguo Liang, Zhengfeng Huang, Chaoming Liu:
LQNTL: Low-overhead quadruple-node-upset self-recovery latch based on triple-mode redundancy. Integr. 91: 126-135 (2023) - [j69]Dongyu Xu, Yiming Ouyang
, Wu Zhou
, Huaguo Liang:
Improving power and performance of on-chip network through virtual channel sharing and power gating. Integr. 93: 102059 (2023) - [j68]Hui Xu
, Rui Zhu, Xia Sun, Xianjin Fang, Pan Qi, Huaguo Liang
, Zhengfeng Huang:
Novel Critical Gate-Based Circuit Path-Level NBTI-Aware Aging Circuit Degradation Prediction. J. Circuits Syst. Comput. 32(10): 2350175:1-2350175:19 (2023) - [j67]Zhengfeng Huang, Zhouyu Gong
, Dongxing Ma, Xiaolei Wang, Yingchun Lu, Wenfa Zhan, Huaguo Liang, Tianming Ni:
Fault-avoidance C-element based low overhead and TNU-resilient latch. Microelectron. J. 131: 105650 (2023) - [j66]Liyu Jin, Maoxiang Yi
, Yuan Xiao, Lifa Sun, Yingchun Lu, Huaguo Liang:
A dynamically reconfigurable entropy source circuit for high-throughput true random number generator. Microelectron. J. 133: 105690 (2023) - [j65]Hong Zhang, Huaguo Liang, Jiewen Hu, Zhiwei Shao, Maoxiang Yi, Yingchun Lu, Zhengfeng Huang:
Improvement of cell internal weak defects detection under process variation by optimizing test path and test pattern. Microelectron. J. 138: 105841 (2023) - [j64]Zhengfeng Huang
, Dongxing Ma
, Runwu Ji
, Huaguo Liang
, Aibin Yan
, Tai Song
, Tianming Ni
:
Overhead Optimized and Quadruple-Node-Upset Self-Recoverable Latch Design Based on Looped C-Element Matrix. IEEE Trans. Aerosp. Electron. Syst. 59(6): 9357-9367 (2023) - [j63]Yiming Ouyang, Jiaxin Wang, Chenglong Sun, Qi Wang, Huaguo Liang:
URMP: using reconfigurable multicast path for NoC-based deep neural network accelerators. J. Supercomput. 79(13): 14827-14847 (2023) - [j62]Liang Yao, Huaguo Liang, Yingchun Lu:
Low-overhead TRNG based on MUX for cryptographic protection using multiphase sampling. J. Supercomput. 79(15): 17170-17186 (2023) - [j61]Yingchun Lu
, Yun Yang
, Rong Hu
, Huaguo Liang
, Maoxiang Yi
, Zhengfeng Huang
, Yuanming Ma
, Tian Chen
, Liang Yao
:
High-efficiency TRNG Design Based on Multi-bit Dual-ring Oscillator. ACM Trans. Reconfigurable Technol. Syst. 16(4): 64:1-64:23 (2023) - [j60]Wu Zhou
, Yiming Ouyang
, Dongyu Xu
, Zhengfeng Huang
, Huaguo Liang
, Xiaoqing Wen
:
Energy-Efficient Multiple Network-on-Chip Architecture With Bandwidth Expansion. IEEE Trans. Very Large Scale Integr. Syst. 31(4): 442-455 (2023) - [j59]Dongyu Xu
, Yiming Ouyang
, Wu Zhou
, Zhengfeng Huang
, Huaguo Liang
, Xiaoqing Wen
:
RMC_NoC: A Reliable On-Chip Network Architecture With Reconfigurable Multifunctional Channel. IEEE Trans. Very Large Scale Integr. Syst. 31(12): 2061-2074 (2023) - 2022
- [j58]Yingchun Lu, Guangzhen Hu
, Jianan Wang, Hao Wang, Liang Yao, Huaguo Liang, Maoxiang Yi, Zhengfeng Huang:
A Low Power-Consumption Triple-Node-Upset-Tolerant Latch Design. J. Electron. Test. 38(1): 63-76 (2022) - [j57]Chen Tian, Jianyong Lu, Liu Jun, Huaguo Liang, Yingchun Lu, Maoxiang Yi:
A reconfigurable test method based on LFSR for 3D stacking integrated circuits. Integr. 87: 82-89 (2022) - [j56]Zhengfeng Huang, Wanshu Zhong, Lanxi Duan, Yue Zhang, Huaguo Liang, Jianan Wang, Tai Song, Yingchun Lu:
Low-Power Anti-Glitch Double-Edge Triggered Flip-Flop Based on Robust C-Elements. J. Circuits Syst. Comput. 31(13): 2250231:1-2250231:17 (2022) - [j55]Chenglong Sun, Yiming Ouyang, Huaguo Liang:
Architecting a congestion pre-avoidance and load-balanced wireless network-on-chip. J. Parallel Distributed Comput. 161: 143-154 (2022) - [j54]Wu Zhou
, Yiming Ouyang, Yingchun Lu
, Huaguo Liang:
A router architecture with dual input and dual output channels for Networks-on-Chip. Microprocess. Microsystems 90: 104464 (2022) - [j53]Liang Yao
, Huaguo Liang, Qian Han, Hong Zhang, Zhengfeng Huang, Cuiyun Jiang, Maoxiang Yi, Yingchun Lu:
M-RO PUF: A portable pure digital RO PUF based on MUX unit. Microelectron. J. 119: 105314 (2022) - [j52]Yiming Ouyang, Ruifeng Li, Chunlei Hu, Qi Wang, Yingchun Lu, Huaguo Liang:
Design of fully adaptive routing and hybrid VC allocation in wireless NOC. Microelectron. J. 120: 105338 (2022) - [j51]Yanjie Wang, Huaguo Liang, Yuchuan Wang, Liang Yao, Maoxiang Yi, Zhengfeng Huang, Yingchun Lu
:
A reconfigurable PUF structure with dual working modes based on entropy separation model. Microelectron. J. 124: 105445 (2022) - [j50]Yiming Ouyang, Dongyu Xu
, Zhimou Chen, Rongjing Chen, Wu Zhou, Huaguo Liang:
REE: Reconfigurable and energy-efficient router architecture in wireless network-on-chip. Microelectron. J. 129: 105600 (2022) - [j49]Jianguo Cui
, Maoxiang Yi
, Di Cao, Liang Yao
, Xinyu Wang
, Huaguo Liang
, Zhengfeng Huang
, Haochen Qi
, Tianming Ni
, Yingchun Lu
:
Design of True Random Number Generator Based on Multi-Stage Feedback Ring Oscillator. IEEE Trans. Circuits Syst. II Express Briefs 69(3): 1752-1756 (2022) - [c36]Liang Yao, Huaguo Liang, Hong Zhang, Tianming Ni, Maoxiang Yi, Yingchun Lu:
A Lightweight M_TRNG Design based on MUX Cell Entropy using Multiphase Sampling. AsianHOST 2022: 1-4 - 2021
- [j48]Hui Xu
, Cong Sun
, Le Zhou
, Huaguo Liang
, Zhengfeng Huang
:
Design of a Highly Robust Triple-Node-Upset Self-Recoverable Latch. IEEE Access 9: 113622-113630 (2021) - [j47]Qi Wang, Yiming Ouyang, Yingchun Lu, Huaguo Liang, Dakai Zhu:
Neural Network-based Online Fault Diagnosis in Wireless-NoC Systems. J. Electron. Test. 37(4): 545-559 (2021) - [j46]Tai Song
, Huaguo Liang, Zhengfeng Huang, Tianming Ni, Ying Sun:
Chip test pattern reordering method using adaptive test to reduce cost for testing of ICs. IEICE Electron. Express 18(2): 20200420 (2021) - [j45]Bao Fang, Huaguo Liang, Dawen Xu, Maoxiang Yi, Yongxia Sheng, Cuiyun Jiang, Zhengfeng Huang, Yingchun Lu:
Approximate multipliers based on a novel unbiased approximate 4-2 compressor. Integr. 81: 17-24 (2021) - [j44]Zhengfeng Huang, Di Cao
, Jianguo Cui, Yingchun Lu, Huaguo Liang, Yiming Ouyang, Tianming Ni, Zhenmin Li:
Design of node separated triple-node-upset self-recoverable latch. Microelectron. J. 114: 105111 (2021) - [j43]Yiming Ouyang, Chenglong Sun
, Boyuan Jia, Qi Wang, Huaguo Liang:
Architecting a priority-based dynamic media access control mechanism in Wireless Network-on-Chip. Microelectron. J. 116: 105218 (2021) - [j42]Zhengfeng Huang, Xiandong Li
, Zhouyu Gong, Huaguo Liang, Yingchun Lu, Yiming Ouyang, Tianming Ni:
Design of MNU-Resilient latches based on input-split C-elements. Microelectron. J. 116: 105243 (2021) - [j41]Yuan Zhang
, Huaguo Liang, Liang Yao, Maoxiang Yi, Zhengfeng Huang, Yingchun Lu:
A high reliability physically unclonable function based on multiple tunable ring oscillator. Microelectron. J. 117: 105263 (2021) - [j40]Zhengfeng Huang, Shangjie Pan
, Hao Wang, Huaguo Liang, Tianming Ni:
LC-TSL: A low-cost triple-node-upset self-recovery latch design based on heterogeneous elements for 22 nm CMOS. Microelectron. J. 117: 105281 (2021) - [j39]Zhengfeng Huang, Hao Wang, Yang Ang, Huaguo Liang, Yiming Ouyang, Tianming Ni:
A high-speed and triple-node-upset recovery latch with heterogeneous interconnection. Microelectron. J. 118: 105290 (2021) - [j38]Tianming Ni
, Qi Xu
, Zhengfeng Huang
, Huaguo Liang
, Aibin Yan
, Xiaoqing Wen
:
A Cost-Effective TSV Repair Architecture for Clustered Faults in 3-D IC. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(9): 1952-1956 (2021) - [j37]Xinyu Wang
, Huaguo Liang
, Yanjie Wang
, Liang Yao
, Yang Guo, Maoxiang Yi
, Zhengfeng Huang
, Haochen Qi
, Yingchun Lu
:
High-Throughput Portable True Random Number Generator Based on Jitter-Latch Structure. IEEE Trans. Circuits Syst. I Regul. Pap. 68(2): 741-750 (2021) - [j36]Dawen Xu, Ziyang Zhu, Cheng Liu
, Ying Wang
, Shuang Zhao, Lei Zhang, Huaguo Liang
, Huawei Li
, Kwang-Ting Cheng
:
Reliability Evaluation and Analysis of FPGA-Based Neural Network Acceleration System. IEEE Trans. Very Large Scale Integr. Syst. 29(3): 472-484 (2021) - [j35]Yingchun Lu
, Xinyu Wang
, Yanjie Wang
, Yuan Zhang
, Liang Yao
, Maoxiang Yi
, Zhengfeng Huang
, Huaguo Liang
:
Pure Digital Scalable Mixed Entropy Separation Structure for Physical Unclonable Function and True Random Number Generator. IEEE Trans. Very Large Scale Integr. Syst. 29(11): 1922-1929 (2021) - [c35]Huaguo Liang, Danqing Li, Zhao Yang, Tianming Ni, Zhengfeng Huang, Cuiyun Jiang:
A N: 1 Single-Channel TDMA Fault-Tolerant Technique for TSVs in 3D-ICs. ITC-Asia 2021: 1-5 - 2020
- [j34]Yiming Ouyang
, Qi Wang
, Mengxuan Ru
, Huaguo Liang
, Jianhua Li
:
A Novel Low-Latency Regional Fault-Aware Fault-Tolerant Routing Algorithm for Wireless NoC. IEEE Access 8: 22650-22663 (2020) - [j33]Dedong Zhao
, Yiming Ouyang
, Qi Wang
, Huaguo Liang
:
cm3WiNoCs: Congestion-Aware Millimeter-Wave Multichannel Wireless Networks-on-Chip. IEEE Access 8: 24098-24107 (2020) - [j32]Yingchun Lu
, Huaguo Liang
, Liang Yao, Xinyu Wang
, Haochen Qi, Maoxiang Yi, Cuiyun Jiang, Zhengfeng Huang:
Jitter-Quantizing-Based TRNG Robust Against PVT Variations. IEEE Access 8: 108482-108490 (2020) - [j31]Tai Song
, Huaguo Liang
, Tianming Ni
, Zhengfeng Huang, Yingchun Lu
, Jinlei Wan, Aibin Yan
:
Pattern Reorder for Test Cost Reduction Through Improved SVMRANK Algorithm. IEEE Access 8: 147965-147972 (2020) - [j30]Yiming Ouyang
, Wu Zhou, Sheng Li, Zhilu Wang, Huaguo Liang, Gaoming Du:
Design of a Wireless Router with Virtual Channel Fault Tolerant in WiNoC. J. Circuits Syst. Comput. 29(10): 2050171:1-2050171:27 (2020) - [j29]Tianming Ni
, Yao Yao, Hao Chang
, Lin Lu, Huaguo Liang
, Aibin Yan
, Zhengfeng Huang, Xiaoqing Wen
:
LCHR-TSV: Novel Low Cost and Highly Repairable Honeycomb-Based TSV Redundancy Architecture for Clustered Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10): 2938-2951 (2020) - [j28]Tianming Ni
, Hao Chang
, Tai Song
, Qi Xu
, Zhengfeng Huang, Huaguo Liang
, Aibin Yan
, Xiaoqing Wen
:
Non-Intrusive Online Distributed Pulse Shrinking-Based Interconnect Testing in 2.5D IC. IEEE Trans. Circuits Syst. 67-II(11): 2657-2661 (2020) - [j27]Tianming Ni
, Dongsheng Liu, Qi Xu
, Zhengfeng Huang, Huaguo Liang
, Aibin Yan
:
Architecture of Cobweb-Based Redundant TSV for Clustered Faults. IEEE Trans. Very Large Scale Integr. Syst. 28(7): 1736-1739 (2020) - [c34]Dawen Xu, Cheng Chu, Cheng Liu, Ying Wang, Xianzhong Zhou
, Lei Zhang, Huaguo Liang, Huawei Li:
Multi-task Scheduling for PIM-based Heterogeneous Computing System. ACM Great Lakes Symposium on VLSI 2020: 457-462 - [c33]Dawen Xu, Cheng Chu, Qianlong Wang, Cheng Liu, Ying Wang, Lei Zhang, Huaguo Liang, Kwang-Ting Cheng
:
A Hybrid Computing Architecture for Fault-tolerant Deep Learning Accelerators. ICCD 2020: 478-485 - [c32]Aibin Yan, Zhelong Xu, Jie Cui, Zuobin Ying, Zhengfeng Huang, Huaguo Liang, Patrick Girard, Xiaoqing Wen:
Dual-Interlocked-Storage-Cell-Based Double-Node-Upset Self-Recoverable Flip-Flop Design for Safety-Critical Applications. ISCAS 2020: 1-5
2010 – 2019
- 2019
- [j26]Tianming Ni
, Hao Chang, Shidong Zhu, Lin Lu, Xueyun Li, Qi Xu, Huaguo Liang, Zhengfeng Huang:
Temperature-Aware Floorplanning for Fixed-Outline 3D ICs. IEEE Access 7: 139787-139794 (2019) - [j25]Yiming Ouyang, Qi Wang, Lizhu Hu, Huaguo Liang:
DVFS Based Error Avoidance Strategy in Wireless Network-on-Chip. J. Electron. Test. 35(6): 767-777 (2019) - [j24]Yiming Ouyang, Zhe Li, Jianhua Li
, Chenglong Sun, Huaguo Liang, Gaoming Du:
CPCA: An efficient wireless routing algorithm in WiNoC for cross path congestion awareness. Integr. 69: 75-84 (2019) - [j23]Yiming Ouyang
, Yang Zhao, Kun Xing, Zhengfeng Huang, Huaguo Liang, Jianhua Li:
Design of Wireless Network on Chip with Priority-Based MAC. J. Circuits Syst. Comput. 28(8): 1950124:1-1950124:18 (2019) - [j22]Maoxiang Yi
, Jingchang Bian
, Tianming Ni, Cuiyun Jiang, Hao Chang
, Huaguo Liang:
A Pulse Shrinking-Based Test Solution for Prebond Through Silicon via in 3-D ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(4): 755-766 (2019) - [c31]Zhiyuan Song, Aibin Yan, Jie Cui, Zhili Chen, Xuejun Li, Xiaoqing Wen, Chaoping Lai, Zhengfeng Huang, Huaguo Liang:
A Novel Triple-Node-Upset-Tolerant CMOS Latch Design using Single-Node-Upset-Resilient Cells. ITC-Asia 2019: 139-144 - [c30]Tai Song
, Huaguo Liang, Ying Sun, Zhengfeng Huang, Maoxiang Yi, Xiangsheng Fang, Aibin Yan:
Novel Application of Deep Learning for Adaptive Testing Based on Long Short-Term Memory. VTS 2019: 1-6 - 2018
- [j21]Yiming Ouyang, Jianfeng Yang, Kun Xing, Zhengfeng Huang, Huaguo Liang:
An improved communication scheme for non-HOL-blocking wireless NoC. Integr. 60: 240-247 (2018) - [j20]Yiming Ouyang, Zhe Li, Kun Xing, Zhengfeng Huang, Huaguo Liang, Jianhua Li:
Design of Low-Power WiNoC with Congestion-Aware Wireless Node. J. Circuits Syst. Comput. 27(9): 1850148:1-1850148:18 (2018) - [c29]Tian Chen, Chenxin Lin, Huaguo Liang, Fuji Ren:
A Dictionary-Based Test Data Compression Method Using Tri-State Coding. ATS 2018: 42-47 - [c28]Gaoliang Ma, Huaguo Liang, Liang Yao, Zhengfeng Huang, Maoxiang Yi, Xiumin Xu, Kai Zhou:
A Low-Cost High-Efficiency True Random Number Generator on FPGAs. ATS 2018: 54-58 - [c27]Xiumin Xu, Huaguo Liang, Kai Zhou, Gaoliang Ma, Zhengfeng Huang, Maoxiang Yi, Tianming Ni, Yingchun Lu:
An All-Digital and Jitter-Quantizing True Random Number Generator in SRAM-Based FPGAs. ATS 2018: 59-62 - [c26]Kai Zhou, Huaguo Liang, Yue Jiang, Zhengfeng Huang, Maoxiang Yi, Xiumin Xu, Yao Yao:
A High Reliability FPGA Chip Identification Generator Based on PDLs. ATS 2018: 63-67 - [c25]Zhengfeng Huang, Yangyang Zhang, Zian Su, Huaguo Liang, Huijie Yao, Tianming Ni:
A Hybrid DMR Latch to Tolerate MNU Using TDICE and WDICE. ATS 2018: 121-126 - [c24]Qian He, Aibin Yan, Chaoping Lai, Yinlei Zhang, Chunming Liu, Zhile Chen, Zhen Wu, Jie Cui, Huaguo Liang:
Novel low cost and DNU online self-recoverable RHBD latch design for nanoscale CMOS. ISCAS 2018: 1-5 - [c23]Desong Pang, Dawen Xu, Ying Wang, Huaguo Liang:
MTTF-Aware Reliability Task Scheduling for PIM-Based Heterogeneous Computing System. ITC-Asia 2018: 25-30 - 2017
- [j19]Aibin Yan, Huaguo Liang, Yingchun Lu, Zhengfeng Huang:
A transient pulse dually filterable and online self-recoverable latch. IEICE Electron. Express 14(2): 20160911 (2017) - [j18]Xiumin Xu, Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, Yingchun Lu, Aibin Yan, Tianming Ni, Maoxiang Yi:
A single event transient detector in SRAM-based FPGAs. IEICE Electron. Express 14(12): 20170210 (2017) - [j17]Xiumin Xu, Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, Yiming Ouyang, Xiangsheng Fang, Tianming Ni, Maoxiang Yi:
A highly reliable butterfly PUF in SRAM-based FPGAs. IEICE Electron. Express 14(14): 20170551 (2017) - [j16]Tianming Ni, Mu Nie, Huaguo Liang, Jingchang Bian, Xiumin Xu, Xiangsheng Fang, Zhengfeng Huang, Xiaoqing Wen:
Vernier ring based pre-bond through silicon vias test in 3D ICs. IEICE Electron. Express 14(18): 20170590 (2017) - [j15]Huaguo Liang, Xin Li, Zhengfeng Huang, Aibin Yan, Xiumin Xu:
Highly Robust Double Node Upset Resilient Hardened Latch Design. IEICE Trans. Electron. 100-C(5): 496-503 (2017) - [j14]Tianming Ni, Huaguo Liang, Mu Nie, Xiumin Xu, Aibin Yan, Zhengfeng Huang:
A Region-Based Through-Silicon via Repair Method for Clustered Faults. IEICE Trans. Electron. 100-C(12): 1108-1117 (2017) - [j13]Yiming Ouyang, Jian Da, Xiumin Wang, Qianqian Han, Huaguo Liang, Gaoming Du:
A TSV Fault-Tolerant Scheme Based on Failure Classification in 3D-NoC. J. Circuits Syst. Comput. 26(4): 1750059:1-1750059:19 (2017) - [j12]Aibin Yan
, Zhengfeng Huang, Maoxiang Yi
, Xiumin Xu, Yiming Ouyang, Huaguo Liang:
Double-Node-Upset-Resilient Latch Design for Nanoscale CMOS Technology. IEEE Trans. Very Large Scale Integr. Syst. 25(6): 1978-1982 (2017) - [c22]Aibin Yan, Zhengfeng Huang, Maoxiang Yi, Jie Cui, Huaguo Liang:
HLDTL: High-performance, low-cost, and double node upset tolerant latch design. VTS 2017: 1-6 - 2016
- [j11]Tian Chen, Dandan Shen, Xin Yi, Huaguo Liang, Xiaoqing Wen, Wei Wang:
Reseeding-Oriented Test Power Reduction for Linear-Decompression-Based Test Compression Architectures. IEICE Trans. Inf. Syst. 99-D(11): 2672-2681 (2016) - [j10]Yiming Ouyang, Qi Chen, Xiumin Wang, Xiaoye Ouyang, Huaguo Liang, Gaoming Du:
AFTER: Asynchronous Fault-Tolerant Router Design in Network-on-Chip. J. Circuits Syst. Comput. 25(6): 1650050:1-1650050:15 (2016) - [j9]Aibin Yan, Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, Yiming Ouyang, Xuejun Li:
An SEU resilient, SET filterable and cost effective latch in presence of PVT variations. Microelectron. Reliab. 63: 239-250 (2016) - [c21]Aibin Yan, Zhengfeng Huang, Xiangsheng Fang, Xiaolin Xu, Huaguo Liang:
Novel Low Cost and Double Node Upset Tolerant Latch Design for Nanoscale CMOS Technology. ATS 2016: 252-256 - [c20]Maoxiang Yi, Xiaohong Liu, Qingwu Wu, Tianming Ni, Zhengfeng Huang, Huaguo Liang:
NBTI mitigation by M-IVC with input duty cycle and randomness constraints. EWDTS 2016: 1-5 - [c19]Maoxiang Yi, Yingxian Gan, Zhengfeng Huang, Huaguo Liang:
Co-mitigating circuit PBTI and HCI aging considering NMOS transistor stacking effect. ISIC 2016: 1-5 - 2015
- [j8]Zhengfeng Huang, Huaguo Liang, Sybille Hellebrand:
A High Performance SEU Tolerant Latch. J. Electron. Test. 31(4): 349-359 (2015) - [j7]Aibin Yan, Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, Maoxiang Yi:
A Self-Recoverable, Frequency-Aware and Cost-Effective Robust Latch Design for Nanoscale CMOS Technology. IEICE Trans. Electron. 98-C(12): 1171-1178 (2015) - [c18]Huaguo Liang, Yangyang Dai, Maoxiang Yi, Dawen Xu, Zhengfeng Huang:
MTTF-Aware Reliability Task Scheduling for Heterogeneous Multicore System. ICA3PP (2) 2015: 716-727 - [c17]Guimao Zhang, Maoxiang Yi, Yong Miao, Dawen Xu, Huaguo Liang:
NBTI-induced circuit aging optimization by protectability-aware gate replacement technique. LATS 2015: 1-4 - [c16]Chang Hao, Huaguo Liang:
Pulse shrinkage based pre-bond through silicon vias test in 3D IC. VTS 2015: 1-6 - 2014
- [c15]Huaguo Liang, Zhi Wang, Zhengfeng Huang, Aibin Yan:
Design of a Radiation Hardened Latch for Low-Power Circuits. ATS 2014: 19-24 - [c14]Chang Hao, Huaguo Liang, Li Yang, Yiming Ouyang:
Optimized stacking order for 3D-stacked ICs considering the probability and cost of failed bonding. VLSI-DAT 2014: 1-4 - 2013
- [c13]Luming Yan, Huaguo Liang, Zhengfeng Huang:
A dynamic self-adaptive correction method for error resilient application. DATE 2013: 943-946 - 2010
- [j6]Wenfa Zhan, Huaguo Liang, Cuiyun Jiang, Zhengfeng Huang, Aiman H. El-Maleh
:
A scheme of test data compression based on coding of even bits marking and selective output inversion. Comput. Electr. Eng. 36(5): 969-977 (2010) - [j5]Maoxiang Yi, Huaguo Liang, Lei Zhang, Wenfa Zhan:
A Novel x -ploiting Strategy for Improving Performance of Test Data Compression. IEEE Trans. Very Large Scale Integr. Syst. 18(2): 324-329 (2010)
2000 – 2009
- 2009
- [c12]Maoxiang Yi, Huaguo Liang, Kaihua Zhan, Cuiyun Jiang:
Optimal LFSR-Coding Test Data Compression Based on Test Cube Dividing. CSE (2) 2009: 698-702 - [c11]Huaguo Liang, Wenfa Zhan, Qiang Luo, Cuiyun Jiang:
A Test Vector Compression/Decompression Scheme Based on Logic Operation between Adjacent Bits (LOBAB) Coding. PRDC 2009: 11-16 - [c10]Jie Wang, Huawei Li
, Yinghua Min, Xiaowei Li, Huaguo Liang:
Impact of Hazards on Pattern Selection for Small Delay Defects. PRDC 2009: 49-54 - 2008
- [c9]Tian Chen, Huaguo Liang, Minsheng Zhang, Wei Wang:
A Scheme of Test Pattern Generation Based on Reseeding of Segment-Fixing Counter. ICYCS 2008: 2272-2277 - [c8]Zhengfeng Huang, Huaguo Liang:
A New Radiation Hardened by Design Latch for Ultra-Deep-Sub-Micron Technologies. IOLTS 2008: 175-176 - [c7]Maoxiang Yi, Huaguo Liang, Zhengfeng Huang:
Balancing wrapper chains of SoC core based on best interchange decreasing. SoC 2008: 1-4 - 2007
- [j4]Wenfa Zhan, Huaguo Liang, Feng Shi, Zhengfeng Huang:
Test data compression scheme based on variable-to-fixed-plus-variable-length coding. J. Syst. Archit. 53(11): 877-887 (2007) - [c6]Lei Zhang, Huaguo Liang, Wenfa Zhan, Cuiyun Jiang:
Block Marking and Updating Coding in Test Data Compression for SoC. ATS 2007: 467-472 - [c5]Wenfa Zhan, Huaguo Liang, Feng Shi, Zhengfeng Huang:
A Novel Collaborative Scheme of Test Data Compression Based on Fixed-Plus-variable-Length Coding. CSCWD 2007: 1044-1049 - 2005
- [c4]Huaguo Liang, Maoxiang Yi, Xiangsheng Fang, Cuiyun Jiang:
A BIST Scheme Based on Selecting State Generation of Folding Counters. Asian Test Symposium 2005: 144-149 - 2003
- [b1]Huaguo Liang:
A new technique for deterministic scan based built in self test (BIST). University of Stuttgart, Germany, Shaker 2003, ISBN 978-3-8322-1592-7, pp. 1-144 - [c3]Huaguo Liang, Cuiyun Jiang:
Sharing BIST with Multiple Cores for System-on-a-Chip. Asian Test Symposium 2003: 418-423 - 2002
- [j3]Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich:
Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. J. Electron. Test. 18(2): 159-170 (2002) - [j2]Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich:
A Mixed-Mode BIST Scheme Based on Folding Compression. J. Comput. Sci. Technol. 17(2): 203-212 (2002) - 2001
- [j1]Sybille Hellebrand, Huaguo Liang, Hans-Joachim Wunderlich:
A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. J. Electron. Test. 17(3-4): 341-349 (2001) - [c2]Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich:
Two-dimensional test data compression for scan-based deterministic BIST. ITC 2001: 894-902 - 2000
- [c1]Sybille Hellebrand, Hans-Joachim Wunderlich, Huaguo Liang:
A mixed mode BIST scheme based on reseeding of folding counters. ITC 2000: 778-784
Coauthor Index
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