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ORCIDHsiu-Ming Chang 0001
Person information
- affiliation: Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA, USA
Other persons with the same name
- Hsiu-Ming Chang 0002 — National Tsing Hua University, Hsinchu, Taiwan
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2010 – 2019
- 2013
[j8]Hsiu-Ming Chang, Jiun-Lang Huang, Ding-Ming Kwai, Kwang-Ting Cheng
, Cheng-Wen Wu:
Low-Cost Error Tolerance Scheme for 3-D CMOS Imagers. IEEE Trans. Very Large Scale Integr. Syst. 21(3): 465-474 (2013)- 2012
- [j7]Hsiu-Ming (Sherman) Chang, David C. Keezer:
Guest Editorial: Special Issue on Analog, Mixed-Signal, RF, and MEMS Testing. J. Electron. Test. 28(5): 555-556 (2012) - 2011
- [j6]Ming Gao, Hsiu-Ming Chang, Peter Lisherness, Kwang-Ting (Tim) Cheng:
Time-Multiplexed Online Checking. IEEE Trans. Computers 60(9): 1300-1312 (2011) - [j5]Hsiu-Ming Chang, Kuan-Yu Lin, Kwang-Ting (Tim) Cheng:
Tester-Assisted Calibration and Screening for Digitally-Calibrated ADCs. IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(12): 2838-2848 (2011) - [c13]Xuan-Lun Huang, Ping-Ying Kang, Hsiu-Ming Chang, Jiun-Lang Huang, Yung-Fa Chou, Yung-Pin Lee, Ding-Ming Kwai, Cheng-Wen Wu:
A self-testing and calibration method for embedded successive approximation register ADC. ASP-DAC 2011: 713-718 - [c12]Hsiu-Ming Chang, Kwang-Ting (Tim) Cheng:
Image quality aware metrics for performance specification of ADC array in 3D CMOS imagers. DAC 2011: 759-764 - [c11]Ping-Ying Wang, Hsiu-Ming Chang, Kwang-Ting Cheng:
An all-digital built-in self-test technique for transfer function characterization of RF PLLs. DATE 2011: 359-364 - [c10]Hsiu-Ming Chang, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, Kenneth M. Butler:
Test cost reduction through performance prediction using virtual probe. ITC 2011: 1-9 - 2010
- [j4]Hsiu-Ming Chang, Kuan-Yu Lin, Kwang-Ting (Tim) Cheng:
Calibration and Test Time Reduction Techniques for Digitally-Calibrated Designs: an ADC Case Study. J. Electron. Test. 26(1): 59-71 (2010) - [j3]Kwang-Ting (Tim) Cheng, Hsiu-Ming (Sherman) Chang:
Recent Advances in Analog, Mixed-Signal, and RF Testing. Inf. Media Technol. 5(2): 338-365 (2010) - [j2]Kwang-Ting (Tim) Cheng, Hsiu-Ming (Sherman) Chang:
Recent Advances in Analog, Mixed-Signal, and RF Testing. IPSJ Trans. Syst. LSI Des. Methodol. 3: 19-46 (2010) - [c9]Hsiu-Ming Chang, Jiun-Lang Huang, Ding-Ming Kwai, Kwang-Ting (Tim) Cheng, Cheng-Wen Wu:
An error tolerance scheme for 3D CMOS imagers. DAC 2010: 917-922 - [c8]Hsiu-Ming Chang, Kuan-Yu Lin, Kwang-Ting Cheng:
Calibration-assisted production testing for digitally-calibrated ADCs. VTS 2010: 295-300
2000 – 2009
- 2009
- [j1]Ping-Ying Wang, Jing-Hong Conan Zhan, Hsiang-Hui Chang, Hsiu-Ming (Sherman) Chang:
A Digital Intensive Fractional-N PLL and All-Digital Self-Calibration Schemes. IEEE J. Solid State Circuits 44(8): 2182-2192 (2009) - [c7]Hsiu-Ming Chang, Kuan-Yu Lin, Kwang-Ting Cheng:
Calibration as a Functional Test: An ADC Case Study. Asian Test Symposium 2009: 85-86 - [c6]Kwang-Ting Cheng, Hsiu-Ming Chang:
Test strategies for adaptive equalizers. CICC 2009: 597-604 - [c5]Hsiu-Ming Chang, Kuan-Yu Lin, Chin-Hsuan Chen, Kwang-Ting Cheng:
A Built-in self-calibration scheme for pipelined ADCs. ISQED 2009: 266-271 - [c4]Hsiu-Ming Chang, Chin-Hsuan Chen, Kuan-Yu Lin, Kwang-Ting Cheng:
Calibration and Testing Time Reduction Techniques for a Digitally-Calibrated Pipelined ADC. VTS 2009: 291-296 - 2008
- [c3]Hsiu-Ming (Sherman) Chang, Min-Sheng (Mitchell) Lin, Kwang-Ting (Tim) Cheng:
Digitally-Assisted Analog/RF Testing for Mixed-Signal SoCs. ATS 2008: 43-48 - [c2]Ming Gao, Hsiu-Ming (Sherman) Chang, Peter Lisherness, Kwang-Ting (Tim) Cheng:
Time-Multiplexed Online Checking: A Feasibility Study. ATS 2008: 371-376 - [c1]Ping-Ying Wang, Hsiu-Ming Chang:
A charge pump-based direct frequency modulator. ISCAS 2008: 1962-1965
Coauthor Index
aka: Kwang-Ting (Tim) Cheng
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