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Image quality aware metrics for performance specification of ADC array in 3D CMOS imagers

Published: 05 June 2011 Publication History

Abstract

A three-dimensional (3D) CMOS imager constructed from stacking a pixel array of image sensors, an analog-to-digital converter (ADC) array, and an image signal processor (ISP) array is promising for high throughput imaging applications. The design specifications of the ADC array in the imager, which jointly and concurrently converts the pixel data to produce a final image, must consider both intra-ADC linearity and inter-ADC uniformity. In this paper, we investigate the relationship between the image quality and the linearity of individual ADCs as well as the uniformity of neighboring ADCs in the array. With the insights to this relationship, the specification requirements for the ADC array can be derived based on a desired level of image quality.

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  1. Image quality aware metrics for performance specification of ADC array in 3D CMOS imagers

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    cover image ACM Conferences
    DAC '11: Proceedings of the 48th Design Automation Conference
    June 2011
    1055 pages
    ISBN:9781450306362
    DOI:10.1145/2024724
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    Published: 05 June 2011

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    Author Tags

    1. array of electronics
    2. performance metrics
    3. yield enhancement

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