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High effective-resolution built-in jitter characterization with quantization noise shaping

Published: 05 June 2011 Publication History

Abstract

A novel built-in jitter characterization architecture combining quantization noise shaping and a partial Vernier delay structure is proposed for high resolution jitter measurement. The effective resolution is optimized at the system level as well as the circuit level. Using 90nm CMOS technology, an area of 0.008mm2 is occupied. The power consumption is 1.85mW. An effective resolution of 1.5ps is achieved.

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  1. High effective-resolution built-in jitter characterization with quantization noise shaping

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    cover image ACM Conferences
    DAC '11: Proceedings of the 48th Design Automation Conference
    June 2011
    1055 pages
    ISBN:9781450306362
    DOI:10.1145/2024724
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    Published: 05 June 2011

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    Author Tags

    1. built-in jitter characterization
    2. gated ring oscillator
    3. noise shaping
    4. vernier delay line

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