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Michael Mikulla
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2020 – today
- 2024
- [c3]Matthias Sinnwell, Michael Dammann, Rachid Driad, Stefano Leone, Michael Mikulla, Rüdiger Quay:
Scaling of GaN FinFETs on 4 Inch Silicon Carbide from 20 to 150 Fins with Maximum Frequency of Oscillation fmax = 20.4 GHz. DRC 2024: 1-2 - 2023
- [c2]Matthias Sinnwell
, Michael Dammann, Rachid Driad, Sebastian Krause
, Stefano Leone, Michael Mikulla, Rüdiger Quay:
Normally-off quasi-vertical GaN FinFET on SiC substrate with record small-signal current gain of $\mathrm{f}_{\mathrm{t}}=10.2$ GHz. DRC 2023: 1-2
2010 – 2019
- 2017
- [j7]Maximilian Dammann, Martina Baeumler, Vladimir Polyakov, Peter Brückner
, Helmer Konstanzer, Rüdiger Quay
, Michael Mikulla, Andreas Graff, Michél Simon-Najasek:
Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications. Microelectron. Reliab. 76-77: 292-297 (2017) - 2015
- [j6]Maximilian Dammann, Martina Baeumler, Peter Brückner
, Wolfgang Bronner
, Stephan Maroldt, Helmer Konstanzer, Matthias Wespel, Rüdiger Quay
, Michael Mikulla, Andreas Graff, M. Lorenzini, M. Fagerlind, P. J. van der Wel, T. Rödle:
Degradation of 0.25 μm GaN HEMTs under high temperature stress test. Microelectron. Reliab. 55(9-10): 1667-1671 (2015) - [c1]Matthias Wespel, Maximilian Dammann, Vladimir Polyakov, Richard Reiner, Patrick Waltereit, B. Weiss, Rüdiger Quay
, Michael Mikulla, Oliver Ambacher:
High-voltage stress time-dependent dispersion effects in AlGaN/GaN HEMTs. IRPS 2015: 2 - 2014
- [j5]Matthias Wespel, Martina Baeumler, Vladimir Polyakov, Maximilian Dammann, Richard Reiner, Patrick Waltereit, Rüdiger Quay
, Michael Mikulla, Oliver Ambacher:
Influence of surface states on the voltage robustness of AlGaN/GaN HFET power devices. Microelectron. Reliab. 54(12): 2656-2661 (2014) - 2011
- [j4]M. Cäsar, Maximilian Dammann, Vladimir Polyakov, Patrick Waltereit, Rüdiger Quay
, Michael Mikulla, Oliver Ambacher:
Critical factors influencing the voltage robustness of AlGaN/GaN HEMTs. Microelectron. Reliab. 51(2): 224-228 (2011)
2000 – 2009
- 2009
- [j3]Maximilian Dammann, W. Pletschen, Patrick Waltereit, Wolfgang Bronner
, Rüdiger Quay
, Stefan Müller, Michael Mikulla, Oliver Ambacher, P. J. van der Wel, S. Murad, T. Rödle, R. Behtash, F. Bourgeois, K. Riepe, Martin Fagerlind, Einar Örn Sveinbjörnsson:
Reliability and degradation mechanism of AlGaN/GaN HEMTs for next generation mobile communication systems. Microelectron. Reliab. 49(5): 474-477 (2009) - 2006
- [j2]Rachid Driad, Robert E. Makon, Karl Schneider, Ulrich Nowotny, Rolf Aidam, Rüdiger Quay
, Michael Schlechtweg, Michael Mikulla, Günter Weimann:
InP DHBT Based IC Technology for over 80 Gbit/s Data Communications. IEICE Trans. Electron. 89-C(7): 931-936 (2006) - 2004
- [j1]Maximilian Dammann, Arnulf Leuther, Rüdiger Quay
, M. Meng, Helmer Konstanzer, W. Jantz, Michael Mikulla:
Reliability of 70 nm metamorphic HEMTs. Microelectron. Reliab. 44(6): 939-943 (2004)
Coauthor Index
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