Location via proxy:   [ UP ]  
[Report a bug]   [Manage cookies]                

"Thermal stress analysis of die stacks with fine-pitch IMC interconnections ..."

Sayuri Kohara et al. (2011)

Details and statistics

DOI: 10.1109/3DIC.2012.6263002

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19