"Reverse-Bias Stability and Reliability of Enhancement-mode GaN-based MIS-FET."

Mengyuan Hua et al. (2019)

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DOI: 10.1109/ASICON47005.2019.8983535

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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Mengyuan Hua, Song Yang, Jin Wei, Zheyang Zheng, Jiabei He, Kevin J. Chen:
Reverse-Bias Stability and Reliability of Enhancement-mode GaN-based MIS-FET. ASICON 2019: 1-4

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