"Design for testability using register-transfer level partial scan selection."

Akira Motohara et al. (1995)

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DOI: 10.1145/224818.224900

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Akira Motohara, Sadami Takeoka, Toshinori Hosokawa, Mitsuyasu Ohta, Yuji Takai, Michihiro Matsumoto, Michiaki Muraoka:
Design for testability using register-transfer level partial scan selection. ASP-DAC 1995

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