"High Level Test Generation for Custom Hardware: An Industrial Perspective."

Indradeep Ghosh (2005)

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DOI: 10.1109/ATS.2005.65

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Indradeep Ghosh:
High Level Test Generation for Custom Hardware: An Industrial Perspective. Asian Test Symposium 2005: 458

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