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ORCID"A Test Generation Approach for Systems-on-Chip that Use Intellectual ..."
Zhigang Jiang, Sandeep K. Gupta (2003)
- Zhigang Jiang, Sandeep K. Gupta:
A Test Generation Approach for Systems-on-Chip that Use Intellectual Property Cores. Asian Test Symposium 2003: 278-283
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