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"A BIST methodology for at-speed testing of data communications transceivers."

S. L. Lin, S. Mourad, S. Krishnan (2000)

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DOI: 10.1109/ATS.2000.893628

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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S. L. Lin, S. Mourad, S. Krishnan:
A BIST methodology for at-speed testing of data communications transceivers. Asian Test Symposium 2000: 216-221

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