"Accelerated Test Points Selection Method for Scan-Based BIST."

Michinobu Nakao, Kazumi Hatayama, Isao Higashi (1997)

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DOI: 10.1109/ATS.1997.643983

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Michinobu Nakao, Kazumi Hatayama, Isao Higashi:
Accelerated Test Points Selection Method for Scan-Based BIST. Asian Test Symposium 1997: 359-

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