"Impact of All-Digital PLL on SoC Testing."

Toru Nakura, Tetsuya Iizuka, Kunihiro Asada (2012)

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DOI: 10.1109/ATS.2012.22

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Toru Nakura, Tetsuya Iizuka, Kunihiro Asada:
Impact of All-Digital PLL on SoC Testing. Asian Test Symposium 2012: 252-257

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