"Mixed-Signal SoC Testing: Is Mixed-Signal Design-for-Test on Its Way."

Chin-Long Wey et al. (2000)

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DOI: 10.1109/ATS.2000.10013

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type: Conference or Workshop Paper

metadata version: 2023-03-24

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Chin-Long Wey, Adam Osseiran, José Luis Huertas, Yeon-Chen Nieu:
Mixed-Signal SoC Testing: Is Mixed-Signal Design-for-Test on Its Way. Asian Test Symposium 2000: 15

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