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"Fabric Defect Detection Based on Total Variation Regularized Double ..."

Ban Jiang et al. (2019)

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DOI: 10.1007/978-981-15-3415-7_52

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-06

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  dblp key:
  - conf/bic-ta/Jiang0LZY19
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  - https://dblp.org/rec/conf/bic-ta/Jiang0LZY19
Ban Jiang, Chunlei Li, Zhoufeng Liu, Aihua Zhang, Yan Yang:
Fabric Defect Detection Based on Total Variation Regularized Double Low-Rank Matrix Representation. BIC-TA (2) 2019: 616-626

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