"Intra-variance Guided Metric Learning for Face Forgery Detection."

Zhentao Chen, Junlin Hu (2023)

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DOI: 10.1007/978-981-99-8565-4_14

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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Zhentao Chen, Junlin Hu:
Intra-variance Guided Metric Learning for Face Forgery Detection. CCBR 2023: 140-149

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