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"Packaging Defect Detection System Based on Machine Vision and Deep Learning."

Jiming Sa et al. (2020)

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DOI: 10.1109/ICCCS49078.2020.9118413

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-02

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  dblp key:
  - conf/ccoms/SaLYC20
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Jiming Sa, Zhihao Li, Qijun Yang, Xuan Chen:
Packaging Defect Detection System Based on Machine Vision and Deep Learning. ICCCS 2020: 404-408

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